We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Contact Probe.
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Contact Probe Product List and Ranking from 40 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jan 07, 2026～Feb 03, 2026
This ranking is based on the number of page views on our site.

Contact Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jan 07, 2026～Feb 03, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. 精研 本社 Tokyo//Electronic Components and Semiconductors
  3. テクノプローブ Chiba//Testing, Analysis and Measurement
  4. 4 インクス Tokyo//Machine elements and parts
  5. 5 UIGREEN Kanagawa//Machine elements and parts
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Contact Probe Product ranking

Last Updated： Aggregation Period:Jan 07, 2026～Feb 03, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Flexible electric wire with terminal for connection (normal temperature specification) サンケイエンジニアリング 本社
  5. 5 Insulation resistance voltage test contact probe (supports 3kV!) サンケイエンジニアリング 本社

Contact Probe Product List

31～60 item / All 190 items

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[Document] TCS3-400 Calibration Board Instruction Manual

[Document] TCS3-400 Calibration Board Instruction Manual

Equipped with ±0.3% high-precision load pads! Introducing pattern names and applications.

This document includes the positions of elements on the calibration board "TCS3-400," which can be custom-manufactured for dedicated calibration kits. Applications include SOLT, TRL, and Loop Back Thru (8.98 ps delay). It is a simple and easy-to-reference book. Please take a moment to read it. 【Contents (partial)】 ■ Pattern Name ■ Mounted Element Symbols ■ Applications ■ Element Positions *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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[Document] TCS4-100/150 Calibration Board Instruction Manual

[Document] TCS4-100/150 Calibration Board Instruction Manual

Manufacturing of dedicated calibration kits available (custom)! Introducing TCS4-100/150.

This document contains the specifications for the calibration board "TCS4-100/150" handled by Techno Probe Inc. It features a high-precision load pad with an accuracy of ±0.3%, and is a SOLT/TRL calibrator. It is a simple and easy-to-reference booklet. We encourage you to read it. 【Contents (partial)】 ■Substrate top view ■Pattern list ・Top ・Bottom *For more details, please refer to the PDF document or feel free to contact us.

  • Printed Circuit Board
  • Contact Probe

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Short probe

Short probe

Consolidating decades of technology developed with contact probes for semiconductor testing!

Consolidating decades of technology developed with contact probes for semiconductor testing! Short Probes 【Features】 ○ Quickly responds to fine pitch and high-speed testing environments ○ High-performance short probes highly rated by users worldwide ○ Easy customization ○ Main types ・Short probes for 1.0mm pitch ・Short probes for 0.8mm pitch ・Short probes for 0.65mm pitch ・Short probes for 0.5mm pitch ・Short probes for 0.4mm pitch ・Ultra-short short probes *Other types are also available. Please contact us for more details.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board
  • Contact Probe

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Contact probe

Contact probe

If it's about contact probes. A wide range of product lineup. Custom manufacturing is also available.

You can easily select a probe that suits your purpose from a rich variety of options (sizes, chip shapes). Our wide product lineup provides a one-stop solution. Custom specifications are also available. ~ Industry-leading performance and quality ~ 【Product Examples】 ◆ Switch probe with an outer diameter of 1.0mm ◆ High current probe supporting up to 600A ◆ High-frequency probe supporting up to 20GHz ◆ Semiconductor probe with a diameter of 0.20mm, total length of 3.3mm, spring pressure of 60g, and a lifespan of over 1 million cycles ~ Cost reduction and improved cost performance ~ ◆ We support our customers in reducing costs and improving cost performance by proposing compatible in-house products. Free shipping. ■ High current, high frequency, rotary, switch, non-magnetic, heat-resistant, etc... Various options are available according to your needs. Please feel free to consult us about probes. * A simple document (in English) can be downloaded from this screen.

  • Other machine elements
  • Terminal Blocks
  • Contact Probe

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Wire probe

Wire probe

Wire probe

It is a probe that utilizes the flexibility of tungsten wire, characterized by high pin pressure, stable contact resistance, and long lifespan.

  • Printed Circuit Board
  • Sensors
  • Other electronic parts
  • Contact Probe

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Contact probe for e-mobility

Contact probe for e-mobility

Contact probe for e-mobility

Supports standard pin diameters for E-mobility charging plugs (φ4mm/6mm/8mm/10mm).

  • Other Connectors
  • Printed Circuit Board
  • Sensors
  • Contact Probe

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RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

An RF probe and calibration board with a wide frequency range, pitch, and excellent durability!

Our company offers RF probes and calibration substrates with a wide frequency range, pitch, excellent durability, all at a low price. Thanks to our unique tip shape, stable contact can be achieved with minimal skating during contact, reducing damage to devices and ensuring high reproducibility. The calibration assist software already has product data for the "Allstron TITAN Probe Series" registered, allowing you to use it immediately by simply selecting a probe. 【Product List】 ■Allstron RF Probe "TITAN" ■Allstron RF Probe "TITAN-RC" ■RF Calibration Substrates "AC" ■Calibration software "QAlibria" *For more details, please request materials or view the PDF data available for download.

  • probe
  • Contact Probe

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Ultra-fine spring (outer diameter less than Ф100μm)

Ultra-fine spring (outer diameter less than Ф100μm)

World-class technology and achievements for catheters and semiconductor testing equipment.

Currently, the demand for small springs is rapidly increasing. There are various applications, including contact springs, connector springs, and coil springs used in medical catheters, among others. Among these, the springs used in semiconductor testing equipment are particularly in demand in the microscopic world. They serve the purpose of checking whether current is flowing through the electronic circuits of semiconductors. These are ultra-fine springs with an outer diameter of less than Ф100μm, and there are only a limited number of companies in Japan that can produce them.

  • Spring
  • Contact Probe

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Spring, manufacturing and processing of springs

Spring, manufacturing and processing of springs

Leave the processing and manufacturing of springs to us!

Matsumoto Spring Co., Ltd. manufactures coil and torsion springs, as well as wire processing. We are equipped with facilities such as coiling machines and forming machines. For more details, please download our catalog.

  • Spring
  • Contact Probe

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Insulated probes, FET probes, wideband low-capacitance probes, and others.

Insulated probes, FET probes, wideband low-capacitance probes, and others.

We offer a wide range of probes and probe-related products.

At Stack Electronics Co., Ltd., we supply voltage probes for oscilloscopes, which are essential for high-frequency measurements, under OEM contracts as the only Made in Japan brand to all domestic oscilloscope manufacturers and renowned overseas manufacturers. We also handle a variety of original brand probes from Stack Electronics. 【Product Types】 ○ Insulated Probes ○ FET Probes ○ Wideband Low-Capacity Probes ○ Probe Accessories For more details, please contact us or download the catalog.

  • probe
  • Contact Probe

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Special processed springs [We handle everything from prototypes!]

Special processed springs [We handle everything from prototypes!]

Rich experience and excellent technical skills! Leave it to us for all your spring needs.

Sendai Spring Manufacturing Co., Ltd. was founded in 1945 in the city of trees, Sendai, and has been engaged in the development, manufacturing, and sales of precision springs for various fields such as electronic devices, home appliances, office automation equipment, and office supplies. We consider the entire process of creating products and delivering them to our customers as a "series of manufacturing processes," and we also examine packaging and transportation methods from the development stage to ensure that we provide products that satisfy our customers. 【Business Activities】 ○ Manufacturing of various types of springs For more details, please contact us or download the catalog.

  • Spring
  • Other machine elements
  • Contact Probe

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Contact Probe "Multi-Purpose Contact Terminal"

Contact Probe "Multi-Purpose Contact Terminal"

A masterpiece of high precision and high quality that fosters trust! Contact terminals with a philosophy of technology that does not allow for compromise.

The "Multi-Purpose Contact Terminal" is an essential contact probe for checking various electronic components, including printed circuit boards. With the development of these increasingly high-density and diverse electronic components, the performance of contact probes is also required to meet high-performance characteristics suitable for each application. We provide contact probes that are always in optimal condition. 【Features】 - Custom specifications can be produced in small lots to meet diverse demands with a rich inventory. - A system has been established for rapid response. - High precision and high quality masterpieces that foster trust. - Products born from a technology-first philosophy that does not allow for compromise. For more details, please contact us or download the catalog.

  • probe
  • Contact Probe

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Wave Spring - Achieving compact size and space-saving!

Wave Spring - Achieving compact size and space-saving!

Achieving overwhelming process capability under load compared to other companies! A wave spring that can reliably supply products even in mass production!

The wave-shaped spring "Wave Spring" can increase the spring constant with a small wire diameter, making it a spring that allows for both weight reduction and space-saving compared to coils. Thanks to our unique coiling technology, we reduce side forces. Additionally, to meet more advanced requirements, we customize coiling machines for both hard and soft applications. Furthermore, we can select materials and design optimal springs tailored to your specifications and usage environment! 【Features】 ■ Quick design response (within one week) ■ Capable of manufacturing outer diameters from 5 to 400 mm ■ Lightweight and space-saving ■ Reduction of side forces ■ Stable spring characteristics *For more details, please refer to the brochure. Feel free to contact us with any inquiries.

  • Other machine elements
  • Inductor Coil
  • Contact Probe

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Electroforming with Rhodium

Electroforming with Rhodium

Rhodium, which has an extremely high hardness and excellent wear resistance! Suitable for everything from medical components to jewelry.

At GDLAB/Research Institute of Electroforming and Surface Modification Technology, we manufacture semiconductor and electronic components, contacts and contactors, mechanical parts, filters, optical circuits, pipes, springs, and more using MEMS-related technologies. "Rhodium" has a white luster and is chemically extremely stable, so it does not oxidize or discolor at room temperature. Furthermore, it has an exceptionally high hardness and excellent wear resistance, making it suitable for a wide range of applications including medical components, reed switches, contactors, contact probes, and jewelry. 【Features of Rhodium】 - Has a white luster with a light reflectance of 80% - Chemically extremely stable and does not oxidize or discolor at room temperature - Extremely high hardness (H 800–900) and excellent wear resistance - Very low electrical resistance of 4.5 gΩ/cm - Good thermal conductivity *For more details, please refer to the PDF document or feel free to contact us.

  • Processing Contract
  • Other machine elements
  • Other electronic parts
  • Contact Probe

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[Demo unit available] TFC Spring Separator

[Demo unit available] TFC Spring Separator

Automatically separates without damage! A spring separator that contributes to work efficiency.

The "TFC Spring Separator" is a device that automatically separates entangled springs without damaging them by rotating them. Thanks to our uniquely developed control technology, it can be designed to accommodate various supply conditions, significantly contributing to the efficiency of operations through appropriate processing. 【Features】 ■ The separator demonstrates high-precision separation capabilities regardless of the size, pitch, or shape of the springs. ■ Excellent processing capacity enables speedy spring supply. ■ The variable rotation speed helps to reduce noise. ■ By combining with a standard feeder, it achieves low costs and allows for the selection of controls suitable for the supply conditions. *For more details, please refer to the PDF document or feel free to contact us.

  • Separation device
  • Contact Probe

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Introduction of contact probes | Compatible with tip diameters down to 1μ!

Introduction of contact probes | Compatible with tip diameters down to 1μ!

Contact probe for prototyping and research!

At Seiko Gokou Contact Metal Co., Ltd., we manufacture contact probes tailored to customer specifications for prototyping and research, as well as for small lot production. We specialize particularly in tungsten needles. Additionally, as an agent for various material manufacturers, we can also assist in selecting and proposing materials that match the circuit's requirements. *For more details, please feel free to contact us.*

  • Other machine elements
  • probe
  • Contact Probe

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Selection Guide "Probe Selection Method"

Selection Guide "Probe Selection Method"

We are currently offering a guide that clearly explains the method for selecting probes with illustrations.

Japan Electric Needle offers a variety of contact probes for printed circuit board inspection, ranging from ultra-fine types to large types, and is distributing a "Probe Selection Method." 【Selection Procedure】 1. Check the pitch 2. Confirm the total length and distance to the target 3. Choose the tip shape 4. Determine the spring pressure We provide clear explanations with illustrations and tables. *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Inspection fixture
  • Processing Jig
  • Contact Probe

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Wire Probe "NW Series"

Wire Probe "NW Series"

Supports a minimum pitch of 0.11mm. Specification changes to match the shape of the device are also acceptable.

The "NW Series" is a wire probe designed for ultra-narrow pitch contacts. We offer three types: Φ0.07mm, Φ0.09mm, and Φ0.11mm. It strokes through "flexibility" and does not have a complex mechanism, enabling contact in narrow pitches that are difficult to achieve with spring probes. We also accommodate specification changes to match the shape of the device. It can be provided as a single unit or as a complete set with fixtures. 【Features】 ■ Compatible with wiring extraction ■ Two types of tip shapes available ■ Wide range of needs addressed from design to manufacturing *For more details, please refer to the documentation. Feel free to contact us with any inquiries.

  • others
  • Contact Probe

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Contact Probe

Contact Probe

Custom-made probes tailored to the shape of the device! A diverse lineup including special probes, coaxial probes, and ultra-fine probes!

We offer a wide variety of "contact probes," including high-frequency compatible probes, heat-resistant probes, coaxial probes, and ultra-fine probes (φ0.2 and above). Additionally, we can manufacture custom-made probes that are optimal for the shape of your device, so please feel free to consult us if you have any requests. 【Product Lineup】 ■ KHP-001 to 30 Series ■ KHS Series ■ KH-007 Series ■ KH-700 Series ■ KH-2000 Series, etc. *For more details, please download the PDF or feel free to contact us.

  • probe
  • Contact Probe

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"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

  • probe
  • Contact Probe

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Layered probe "High current, multi-point layered probe (patented technology)"

Layered probe "High current, multi-point layered probe (patented technology)"

As an inspection of the front-end process of power semiconductors, applying uniformly at multiple points on the wafer surface reduces the burden on the semiconductor.

This is a probe developed with innovative technology, featuring excellent characteristics. We have developed a multi-point laminated probe specifically for power semiconductors, applying the characteristics of a laminated structure consisting of metal plates (probes) and insulators. 【Features】 - The probe tip is shaped like a wave, allowing contact with the semiconductor at multiple points. This disperses the amount of current and voltage applied, reducing the burden on the semiconductor. - It can move vertically by about 1 millimeter, minimizing contact marks. - Its compact design makes it easy to secure installation space. *For more details, please download the PDF or contact us.

  • probe
  • Contact Probe

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High-frequency (millimeter wave) probe "coaxial shield probe"

High-frequency (millimeter wave) probe "coaxial shield probe"

For partial electrode support such as probe cards!

We offer probes designed with consideration for the conditions of high-frequency measurements, enabling highly accurate measurements. With the increasing circuit density of semiconductor devices, there is particularly growing demand for high-frequency measurements in the MHz range. They are said to be suitable for partial electrode applications such as probe cards and are widely used, with orders now being placed in various fields, including medical applications. *For more details, please download the PDF or contact us.*

  • probe
  • Contact Probe

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High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

High-frequency (millimeter wave) probe "Electrode minimum pitch 400μm or more"

It is possible to reduce high-frequency loss and direct current resistance values!

We provide a probe designed with considerations for high-frequency measurement conditions, allowing for high-precision measurements. This probe is a developed product that facilitates inspection with unprecedented small pitch intervals for high-frequency measurements. It can reduce high-frequency loss and DC resistance values, and the impedance can also be set as needed. *For more details, please download the PDF or contact us.*

  • probe
  • Contact Probe

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Unique structure of a sensitive probe compatible with high-precision measurement.

Unique structure of a sensitive probe compatible with high-precision measurement.

With its unique internal structure, it supports the measurement of high-performance devices and fine pattern substrates!

Introducing the unique structure of a sensitive probe that supports high-precision measurements of inks. At Inks, we have developed a proprietary internal structure that employs a resistance stabilizer (metal pole) to achieve low and stable resistance values. Furthermore, by applying gold plating with excellent conductivity to the plunger, we can achieve an even lower and more stable resistance value, reaching an ideal state. 【Features】 ■ Coil Spring - Stable load and excellent durability - Designed to provide the necessary contact force between the barrel inner wall and the plunger - Excellent heat resistance, maintaining stable spring pressure even at high temperatures ■ Resistance Stabilizer - Achieves stable contact resistance - Minimizes the influence of inductance from the coil spring ■ Plunger - Designed to stabilize internal contact resistance - Various tip shapes are available ■ Barrel - Made from materials with excellent conductivity - Prevents material changes due to corrosion and other factors *For more details, please refer to the external link page or feel free to contact us.

  • probe
  • Contact Probe

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Layered probe with stable contact resistance value.

Layered probe with stable contact resistance value.

A probe capable of achieving a stable contact resistance value according to the shape of the target object.

The "laminated probe" has been developed with innovative technology and possesses excellent features. Unlike conventional spring probes, which consist of multiple parts, it achieves a structurally stable contact resistance value through contact with a single metal plate. Even when the inspected object is not smooth, the spring properties of each probe allow it to conform to the shape of the object, enabling a stable contact resistance value. 【Features】 ■ Wiping action occurs due to the structure ■ Contact position is displaced ■ Contact can be made while removing oxide films and foreign substances from the object ■ Stable contact can be achieved *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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Stable contact with BGA.

Stable contact with BGA.

Introducing examples of layered probes. Coating applied to the probe tip achieves extended lifespan.

We would like to introduce stable contact for BGA "laminated probes" handled by our company. For spherical BGA (solder), contact using needle-type probes, including spring probes, has resulted in slippage, making stable contact difficult. By using laminated probes for Kelvin contact, we achieve stable contact. Additionally, since BGA primarily consists of tin, applying a coating to the probe tip that suppresses tin transfer can also extend its lifespan. 【Features of Laminated Probes】 ■ Stable contact resistance values ■ Effective for precise measurements ■ Capable of handling high current and high voltage ■ Compatible with narrow pitches ■ Load for contact can be adjusted *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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Q&A on Layered Probes

Q&A on Layered Probes

We will answer five representative questions about layered probes.

In this document, we will introduce questions regarding the "stacked probe" of the probe business handled by Inks Corporation. Q: Is non-magnetic compatibility possible? A: Yes, it is possible. The probe is made of non-magnetic beryllium copper, and the holder that holds the probe can also be made of non-magnetic materials such as aluminum or resin. Additionally, we have experience with contacts to magnetic sensor packages. We have answered five questions, including the following: - Is non-magnetic compatibility possible? - Can it be used in the previous process (wafer inspection)? - I would like to install it on the machine I am currently using; is that possible? - How should maintenance be performed? - What would the estimated schedule be until delivery? *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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Layered Probe: Response to High Current and High Temperature

Layered Probe: Response to High Current and High Temperature

We have a track record of producing laminated probes compatible with 2000A! Introducing our solutions for handling high current and high temperatures.

The "laminated probe" does not use coil springs and instead utilizes the characteristics of leaf springs for contact, making it resistant to degradation of spring properties due to heat. The insulating film (polyimide) also has a heat resistance rating of 300°C for regular use and long-term heat resistance. It can accommodate measurement environments at high temperatures, allowing contact with power semiconductors including SiC. 【Features】 ■ Utilizes the characteristics of leaf springs ■ Resistant to degradation of spring properties due to heat ■ Can accommodate measurement environments at high temperatures ■ Allows contact with power semiconductors including SiC *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contact Probe

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コンタクトプローブ

コンタクトプローブ

高集積化に伴う狭ピッチ化やエリアアレイへの対応に優れたプローブピンをご紹介！

『コンタクトプローブ』は、狭ピッチ電極の電子部品検査に適した超極細径 のワイヤプローブです。 導体部には、パラジウム合金や、銅銀合金、タングステン、レニウムタング ステン、ベリリウム銅などを使用。 当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 境界面のシャープ化を実現しています。 【特長】 ■当社独自の製法により、極小部位への先端加工を実現 ■当社独自のコーティング製法と剥離製法により、優れた絶縁性とコーティング 　境界面のシャープ化を実現 ■特殊な表面処理により、絶縁コーティング表面の滑性を向上 ■パラジウム合金は、導体が酸化しにくい特長があり、接触抵抗の安定性が向上 ■酸化を嫌う半導体検査などに好適 ■30μmの極細径から対応可能 ※詳しくは外部リンクページをご覧いただくか、お気軽にお問い合わせ下さい。

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  • Terminal Blocks
  • Contact Probe

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