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Resistance Measuring Instrument Product List and Ranking from 42 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Resistance Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. ナプソン Tokyo//Electronic Components and Semiconductors
  2. レックス Hyogo//Testing, Analysis and Measurement
  3. 日本セミラボ 新横浜本社 Kanagawa//Electronic Components and Semiconductors
  4. 4 エヌピイエス Tokyo//Electronic Components and Semiconductors
  5. 5 芹沢システムリサーチ Gunma//Industrial Electrical Equipment
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Resistance Measuring Instrument Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Sheet resistance meter エヌピイエス
  2. ad-MED Vitreogel "Trans-epithelial Electrical Resistance (TEER) Measurement Device" 関東化学株式会社 バイオケミカル部
  3. Measuring instrument Main circuit resistance tester 芹沢システムリサーチ
  4. Non-contact sheet resistance measurement device "LEI-1510 Series" 日本セミラボ 新横浜本社
  5. 4 Resistance rate / Sheet resistance measuring instrument [WS-3000] ナプソン

Resistance Measuring Instrument Product List

61～75 item / All 120 items

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Napson Co., Ltd. Measurement Equipment Comprehensive Catalog Giveaway

Napson Co., Ltd. Measurement Equipment Comprehensive Catalog Giveaway

[Comprehensive catalog available] Featuring many items including fully automatic measurement systems!

"Napson Co., Ltd. Measurement Device Comprehensive Catalog" is the product catalog of Napson Co., Ltd., a manufacturer of electrical resistance measurement devices that can propose both contact and non-contact types. It features various measurement devices tailored to different applications, including the fully automatic type "Fully Automatic Measurement System," the manual type "Single Point Measurement System," and the semi-automatic type "Multi-Point Measurement System." Currently, we are giving away the catalog for free! [Contents] - Proposals for resistance measurement devices that solve customer problems - Napson's electrical resistance measurement technology contributing to a more livable future - Features of contact and non-contact resistance measurement - Device lineup - Principles of electrical resistance measurement (Contact type: 4-probe method, Non-contact type: Eddy current method), and more For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments

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Contact Resistance Tester "WS-8800"

Contact Resistance Tester "WS-8800"

4-probe method using a wafer transport robot! Fully automatic measurement sorter.

The WS-8800 is a contact-type resistance measuring instrument with a fully automatic type (fully automatic measurement system). It is capable of thickness measurement, PN measurement, and temperature measurement (for silicon wafers). It can accommodate any number of cassettes. Additionally, it can be customized in various ways according to customer requests. 【Features】 ■ Fully automatic ■ Self-test function, wide measurement range ■ Thickness, peripheral position, and temperature correction functions (resistivity measurement) *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact resistance tester "NC-80MAP"

Non-contact resistance tester "NC-80MAP"

Wide-range non-contact (eddy current method) sheet resistance/resistivity multi-point measuring instrument

The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Contact Resistance Tester "RT-70V Series"

Contact Resistance Tester "RT-70V Series"

Four-probe method measuring instrument for simple measurement of resistivity (specific resistance) / sheet resistance.

The "RT-70V Series" is a combination measuring instrument consisting of a measurement tester (RT-70V) and a measurement stage. Due to its contact type, measurements are conducted by bringing the needle-shaped probe head into contact with the sample. The "RT-70V Tester" allows for easy operation of thickness, temperature, and PN input using a JOG dial. It can be customized in various ways according to customer requirements. 【Features】 ■ Contact type ■ Manual type ■ Single-point observation system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact resistance tester "EC-80"

Non-contact resistance tester "EC-80"

Compact and easy-to-use manual non-contact (eddy current method) resistance meter.

The EC-80 is a simple measuring device that allows for measurements by simply placing a sample between the probes. You can easily switch between resistivity and sheet resistance measurement modes. Additionally, measurement conditions can be easily set using the JOG dial. Since it has fixed probes, you will need to choose one type from several probe types before purchase. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Manual type ■ Single-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Contact Resistance Tester "DUORES"

Contact Resistance Tester "DUORES"

Handheld sheet resistance meter!

"DUORES" is a handy type sheet resistance measuring device that is easy to carry and easy to use for measurements. It features two types of probes (non-destructive and contact) that can be exchanged according to the measurement target. Simply place or touch the probe, and it will automatically measure. It can be customized in various ways according to customer requests. Additionally, it is available for purchase as just the main unit with the non-destructive probe or just the main unit with the contact probe. [Features] ■ Contact type ■ Exchangeable 2 probes ■ Handy type *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact surface resistance tester

Non-contact surface resistance tester

Up to 20mm! Measurement is possible with a wide measurement gap!

This is a non-contact surface resistance measuring device that can be used both online and offline, utilizing eddy current magnetic fields from the German company NAGY. It can measure with a wide measurement gap of up to 20mm, which allows it to accommodate various applications from our customers compared to other products.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Surface electrical resistance measuring instrument (DVS 2929 compliant product)

Surface electrical resistance measuring instrument (DVS 2929 compliant product)

Measurable with a test sequence in accordance with DVS 2929 of the German Welding Society.

This is one of the resistance measuring devices from the German company Schuetz, a specialist in micro-resistance measurement for parts used in automobiles, aircraft, and power cables. It measures the surface contact electrical resistance value of the test material while the electrodes are pressed against it with a specified pressure. It is ideal for evaluating weldability and surface treatment after the etching process of aluminum and aluminum alloy materials and panels in the automotive and aerospace industries. The pressure applied to the sample by the electrodes and the resistance measurement time are variable. It is also possible to measure the surface contact resistance values of materials other than aluminum.

  • Other inspection equipment and devices

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Measuring device Main circuit resistance tester ST102

Measuring device Main circuit resistance tester ST102

Easy to handle with fewer operating parts.

This is a device for measuring the contact resistance of the main contact part of electrical switching devices, consisting of a current generator and a digital voltmeter. There is no dedicated demo unit for the ST-102A, but you can try the operation feel with the ST-10A (10A type) demo unit. Customers who want to "try the operation feel," "check if the settings can be easily made," or "confirm if the intended tests can be conducted" are requested to submit a request for a "demo unit" through the standard product inquiry form on our website. https://serizawa-sr.co.jp/contact-1

  • Other measurement, recording and measuring instruments

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Insulation Resistance Tester "ECM-500 Series"

Insulation Resistance Tester "ECM-500 Series"

Testable with an applied voltage of 500V! Electrochemical Migration Tester

The "ECM-500 Series" is a high-precision tester capable of evaluating the insulation reliability of printed circuit boards and electronic materials under an applied voltage of up to 500V. The power output circuit allows for voltage settings for each channel, and it continuously controls the voltage across the sample to maintain the set value through feedback control. Additionally, it employs high-performance, low-noise semiconductors and features a specially designed measurement circuit that ensures high precision and reliability, taking into account the wiring patterns of printed circuit boards. 【Features】 ■ Wide range of applied voltage from DC 1V to 500V ■ Individual voltage control for each channel ■ High-speed, high-precision data measurement ■ High-speed leakage touch detection ■ Individual current limiters for each channel *For more details, please refer to the PDF document or feel free to contact us.

  • Company：J-RAS
  • Price：Other
  • Testing Equipment and Devices
  • Contract measurement
  • others

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Surface Resistance Meter '19640'

Surface Resistance Meter '19640'

No need for charging or special batteries! A measuring device that can diagnose the characteristics of electrostatic conductivity, electrostatic dissipation, and insulation.

The "19640" is an affordable, compatibility-verified surface resistance checker. It diagnoses the characteristics of electrostatic conductivity, electrostatic dissipation, and insulation. It is portable, powered by a 9V battery. Additionally, it does not require charging or special batteries, and when battery replacement is needed, an LED lights up to prevent measurement errors due to battery depletion. 【Features】 ■ Diagnoses the characteristics of electrostatic conductivity, electrostatic dissipation, and insulation ■ Quickly checks EPA ESD management products by indicating the index range with an LED ■ Automatically selects the measurement range voltage in accordance with ESD TR53 compliance testing ■ Portable with a 9V battery ■ No charging or special batteries required *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Insulation Tester

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Fully Automatic Expansion Resistance Measurement Device SRP2000

Fully Automatic Expansion Resistance Measurement Device SRP2000

Fully automatic spreading resistance measurement device

The SRP (Spreading Resistance Profiler) device measures the resistivity profile of silicon in the depth direction, the thickness of the EPI layer, the depth of the PN junction, and the carrier concentration distribution by making contact with two probes on a diagonally polished silicon wafer in the depth direction and measuring the spreading resistance value between the probes.

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Junction Photo Voltage(JPV)

Junction Photo Voltage(JPV)

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

The JPV method (Junction Photo Voltage method) allows for fast and reproducible mapping measurements. 【Features】 - Non-contact, non-destructive measurement - No adjustment of probes required - No special sample preparation needed for measurement - Measurement possible even with oxide films or coatings on the surface - High spatial resolution distribution measurement (mapping) can be performed quickly - Highly reproducible measurements are possible - Can be integrated with Semilab's benchtop platforms WT-2000, WT-2500, WT-3000, or inline wafer testing equipment.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment

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Expansion Resistance Measurement Device "SRP-170/2100"

Expansion Resistance Measurement Device "SRP-170/2100"

Measure the depth of PN junction and carrier concentration distribution! Surface resistance measurement available as an option!

We would like to introduce our spread resistance measurement device, the 'SRP-170/2100'. By making contact with two probes in the depth direction on a diagonally polished Si wafer, we can measure the specific resistivity profile in the depth direction of Si, the thickness of the EPI layer, the depth of the PN junction, and the carrier concentration distribution from the spread resistance value between the probes. The "SRP2000" automates the conditioning of the probes, measurement of the bevel angle, and data input for standard samples, allowing for continuous automatic measurement of multiple samples, with a maximum of 6 samples able to be loaded simultaneously. 【Features】 ■ World-standard carrier concentration distribution and profile measurement device ■ Supports measurement automation (SRP-2100) ■ Surface resistance measurement available as an option (SRP-170) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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Non-contact sheet resistance measurement device 'DELCOM'

Non-contact sheet resistance measurement device 'DELCOM'

Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!

"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.

  • Insulation Tester

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