Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 24, 2025～Oct 21, 2025
This ranking is based on the number of page views on our site.
121～135 item / All 236 items
CCD Microscope NY21S-40S
You can perform microscopic observations simply by connecting it to a home television. ■□■Features■□■ ■ High magnification observation from 35X to 60X. ■ By using optional lenses, you can observe at magnifications up to 280 times, exceeding that of a standard microscope. ■□■For more details, please request materials or contact us■□■
Wide-field observation microscope Hirobirot
It's nice to be able to see everything. ■□■Features■□■ ■You can observe a wide area at ultra-high depth simply by connecting to a home television. ■No external lighting is needed (it works in an office environment). ■You can observe approximately 4 times (WD270mm) to approximately 10 times (WD80mm) on a 15-inch monitor. ■□■For more details, please request materials or contact us■□■
Covers a wide range of magnifications from 15x to 180x with a single device! It can save images and perform simple measurements.
The "SKM-S30D-PC" is a microscope that can be observed on a computer. It covers a wide range of magnifications, making it a popular model used in various fields. It also has built-in lighting and is powered via USB, allowing for easy use on a desk. It comes with a stable stand and a sturdy aluminum body, enabling reliable observation. 【Features】 ■ Continuous variable magnification from X15 to X180 ■ Easy image saving to PC ■ Simple measurement function included ■ Clickable at each magnification ■ 1.3 million pixels (1280x1024) *For more details, please refer to the PDF document or feel free to contact us.
Variable magnification from 5x to 55x! High reliability with domestic production in Japan! For visual inspection of burrs, scratches, and foreign matter!
The "SKM-V310B-FHD" is a high-definition microscope that allows for inspection on a monitor with a variable magnification of 5x to 55x. Unlike traditional magnifying glasses and stereo microscopes, it enables visual inspection on a monitor, reducing fatigue and preventing defects. It provides a clear view and is easy to operate. Multiple people can share the visual experience simultaneously, which reduces mistakes. Additionally, by using a computer connection type or an SD card type capture device (sold separately), you can also save videos and still images. 【Features】 ■ Magnification: 5x to 55x, variable magnification ■ Full HD for higher image quality ■ Fatigue-free visual inspection ■ Image saving possible with the use of a separately sold capture device *For more details, please refer to the PDF document or feel free to contact us.
Variable magnification from 10x to 60x! Highly reliable production in Japan! For visual inspection of burrs, scratches, and foreign matter! This is our most popular microscope.
The "SKM-V300B-FHD" is a high-definition microscope that allows for inspection on a monitor screen with a variable magnification of 10x to 60x. Unlike traditional magnifying glasses and stereo microscopes, it enables visual inspection on a monitor, reducing fatigue and preventing defects. It provides a clear view and is easy to operate. Multiple people can share the visual experience simultaneously, which reduces mistakes. Additionally, by using a computer connection type or an SD card type capture device (sold separately), you can also save videos and still images. 【Features】 ■ Magnification: 10x to 60x, variable magnification ■ Full HD for higher image quality ■ Fatigue-free visual inspection ■ Image saving possible with the use of a separately sold capture device *For more details, please refer to the PDF document or feel free to contact us.
A microscope that achieves high-resolution and stress-free magnified observation!
The "MXK-SCOPE 5.0M" is a microscope equipped with a class-leading 5-megapixel USB 3.0 camera. It also supports capturing still images and videos. Camera control can be performed via software. Additionally, it achieves high versatility in measurements with 13 commonly used measurement commands and an automatic edge detection function. 【Features】 ■ Live image display (full-size display available) ■ Abundant image processing functions ■ Automatic edge measurement ■ Image stitching function ■ Live focus synthesis *For more details, please download the PDF or feel free to contact us.
Asbestos sampler
- Two flow rate settings with one unit: 5⇔10L/min - Flow rate switching is one-touch - No flow adjustment needed (constant speed suction function) - Automatically stops at the specified gas amount
High resolution of 1200x1600! Portable microscope that's easy to carry.
It is an inexpensive portable microscope with a maximum resolution of 1200x1600 and a magnification of 200 times.
Detection of scratches down to "4 microns" with a zoom magnification of 0.75 to 4.5 times.
This is a highly versatile microscope that allows for easy detection of defects through zooming in and magnified observation. It features a telecentric zoom lens with a magnification range of 0.75 to 4.5 times and high-brightness illumination that minimizes halation, achieving high-quality images. It excels in quality inspection as a microscope for planar observation, enabling the "seeing of the unseen."
The Halation Microscope provides lossless images due to the direct reflection of external illumination.
This is a curved surface observation microscope that can be observed at a zoom magnification of 0.2 to 1.6 times. It is equipped with a unique halation R lighting system that provides a field of view of 24×18 mm, making it a microscope for surface observation without shadows, allowing you to "see the unseen." It is a versatile microscope that can be applied to a wide range of observations, including scratches and dents on φ16 shafts, lens scratches, bubbles, cracks, and chips in metal pipes, which could not be observed with conventional methods.
It comes with a height reading dial, allowing for depth measurement as well, making it highly versatile.
The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image captured using the halation microscope "PS-100-S6Z45C" (medium magnification) for planar observation, showing the ITO of the LCD under halation lighting and incident lighting. The image under incident lighting does not show the ITO, while the image under halation lighting clearly reveals the ITO.
Since it is a specular reflection image due to external illumination, an image without loss can be obtained.
The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left shows a comparative image of dirt on an IC chip captured using the "PS-100-S6Z90A" halation microscope for planar observation (high magnification) with halation lighting and reflected lighting. The image taken with reflected lighting does not capture the dirt, while the image taken with halation lighting clearly shows the dirt.
With its unique lighting effect, it has become possible to observe curved and R surfaces.
The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.
Haleration Microscope with a maximum field of view of 24×18mm, designed for R illumination curved surface observation, equipped with an illumination controller.
Haleration Microscope "PS-100-S7Z16R100-2M" Wide Field Curved Surface Version, Maximum Field of View 24×18mm for R Lighting Curved Surface Observation (13x to 53x on a 15" monitor, with 11-column lighting selection controller). This is a microscope for curved surface observation that can be observed at a zoom magnification of 0.2 to 1.6 times. The R lighting features a controller that allows for selective illumination of 11 columns, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It secures a field of view of 24×18mm, enabling wider field observations of scratches, dents on shafts and metal pipes, cracks, and chips in mounted components, and the effective use of lighting further enhances the capabilities of this imaging sensor tool. For more details, please download the catalog.
"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.
The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.
