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Mass Spectrometer Product List and Ranking from 16 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jun 24, 2026～Jul 21, 2026
This ranking is based on the number of page views on our site.

Mass Spectrometer Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jun 24, 2026～Jul 21, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. プレッパーズ 本社 Shizuoka//others
  3. 山善 Osaka//Machine elements and parts
  4. 4 ATONARP INC. Tokyo//Electronic Components and Semiconductors
  5. 5 ブルカージャパン ダルトニクス事業部　微生物同定・菌株識別 Kanagawa//Testing, Analysis and Measurement
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Mass Spectrometer Product ranking

Last Updated： Aggregation Period:Jun 24, 2026～Jul 21, 2026
This ranking is based on the number of page views on our site.

  1. Application Data: Example of Negative Ion Measurement by TFA Removal プレッパーズ 本社
  2. MS system "Smart Flash MS System" 山善
  3. [Analysis Case] Evaluation of Copper (Cu) Oxide Film Thickness: Differences Due to Storage Environment 一般財団法人材料科学技術振興財団　MST
  4. Application Data: Example of LC/MS Measurement by Decyl Sulfate Removal プレッパーズ 本社
  5. 4 [Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film 一般財団法人材料科学技術振興財団　MST

Mass Spectrometer Product List

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[Analysis Case] Contamination Assessment of Si Wafer Bevel Area

[Analysis Case] Contamination Assessment of Si Wafer Bevel Area

It is possible to evaluate both metal components and organic components simultaneously.

In semiconductor device manufacturing, from the perspective of improving yield, it is necessary to enhance the cleanliness of the backside of the wafer and to remove substances that remain on the bevel area of the wafer. In this study, we conducted TOF-SIMS analysis of the bevel inclined surface to evaluate the distribution of contamination (Figure 2). Additionally, by comparing the mass spectra of the adhered substances with those of the normal area and the contamination source, we found that the adhered substances matched the metal (Cr) and organic components of the contamination source. TOF-SIMS can capture the contamination generation process in the bevel area (edge and inclined surface).

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[Analysis Case] Heating Degradation Test of Lithium-Ion Secondary Batteries

[Analysis Case] Heating Degradation Test of Lithium-Ion Secondary Batteries

Samples after thermal degradation can be evaluated using LC/MS/MS, TOF-SIMS, TEM+EDX, etc.

The development of lithium-ion secondary batteries faces challenges such as improving performance, extending lifespan, and enhancing reliability. To address these challenges, it is important to understand the degradation mechanisms of the batteries. In this study, we conducted a heating degradation test to evaluate the degradation mechanisms caused by temperature. After the heating degradation test, we assessed samples that showed significant capacity reduction using LC/MS/MS for the electrolyte, TOF-SIMS for the anode surface, and FIB-TEM+EDX for the cross-section of the anode.

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[Analysis Case] Evaluation of Film-Forming Component Encroachment on the Back Surface of the Wafer

[Analysis Case] Evaluation of Film-Forming Component Encroachment on the Back Surface of the Wafer

Quantitative evaluation of metal components is possible near the bevel area.

In semiconductor device manufacturing, it is necessary to remove metals remaining on the backside of the wafer from the perspective of improving yield, and it is important to quantitatively understand the amount of metal components remaining. To investigate the concentration distribution of metals remaining on the backside within a range of 500 µm from the bevel area, we conducted evaluations using TOF-SIMS. TOF-SIMS has the spatial resolution to detect metal components only near the bevel area, and by using standard samples with known concentrations, it is possible to quantitatively calculate the concentrations.

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[Analysis Case] Evaluation of Silicon (Si) Oxide Film State

[Analysis Case] Evaluation of Silicon (Si) Oxide Film State

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

In depth-direction analysis of molecular information obtained by TOF-SIMS, (1) the depth resolution is good, (2) it is possible to distinguish the chemical states of inorganic materials such as oxides, nitrides, fluorides, carbides, alloys, and metals, (3) evaluation of trace states is possible, (4) monitoring of OH is possible, (5) relative comparisons between samples (film thickness, composition) are possible, and (6) image analysis allows for a visual capture of the distribution of states at the surface level of a few nanometers. We will summarize the results of natural oxide films and oxide films. Measurement method: TOF-SIMS Product field: LSI, memory Analysis purpose: evaluation of chemical bonding states, evaluation of composition distribution, thickness of corrosion layers For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of the Cleaning Effect of Organic Ingredients

[Analysis Case] Evaluation of the Cleaning Effect of Organic Ingredients

You can measure the 300mm wafer as it is.

TOF-SIMS has the characteristics of simultaneously evaluating organic and inorganic materials, being capable of analyzing small areas with high sensitivity at the very surface, and allowing evaluation while still in the form of 300mm wafers, making it effective for residue investigations during cleaning processes. We will introduce an analysis case of the removal effect of organic contamination on Si surfaces. TOF-SIMS analysis was conducted on samples where amine-based organic materials were confirmed to be in extremely small quantities by XPS. Even in small areas, it is possible to measure components in such extremely small amounts.

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[Analysis Case] Analysis of Additive Components in Polymer Films

[Analysis Case] Analysis of Additive Components in Polymer Films

Surface and depth distribution evaluation of additives in the film using GCIB.

Food wrap films may use additives to ensure stability against thermal exposure during the manufacturing process and to impart plasticity. These additives are required to remain stable under cooking conditions without changing. In this case, we present the results of an investigation using TOF-SIMS to examine whether the state of one of the additives, Irgafos168, changes (bleeds out) before and after heating. *GCIB: Gas Cluster Ion Beam

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[Analysis Case] Evaluation of Composition Distribution in Bone Cross-Sections

[Analysis Case] Evaluation of Composition Distribution in Bone Cross-Sections

Visualization of the composition distribution of mouse tibial cross-sections using TOF-SIMS.

To evaluate the component distribution in mouse tibia, we prepared tibial sections and conducted imaging analysis using TOF-SIMS. The distribution of components derived from mice, such as K, Ca, calcium phosphate, and phospholipids, was confirmed. Since TOF-SIMS identifies components based on the mass of molecular ions, it does not require labeling substances like fluorescent materials, allowing for distribution evaluation without the influence of labeling agents. This technique can be applied to drug dynamics analysis and research on Drug Delivery Systems (DDS), enabling imaging of drug distribution within organs.

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[Analysis Case] Analysis of Discoloration Components in Fibers

[Analysis Case] Analysis of Discoloration Components in Fibers

It is possible to evaluate the organic and inorganic components on the fiber surface.

TOF-SIMS is a highly effective method for investigating the causes of foreign substances, contamination, and discoloration in various processes, as it allows for localized analysis of specific areas and simultaneous analysis of elemental composition and molecular information of organic and inorganic substances through the obtained mass spectrum. Additionally, it enables image analysis, making the visualization of molecular information of organic substances possible. This document summarizes the analysis results of discoloration in clean suits, which are textile products. From the qualitative results obtained by TOF-SIMS, it was inferred that the discolored areas may be due to sebum.

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[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film

[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film

High sensitivity analysis even in extremely shallow areas.

Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a material of interest for high-efficiency, low-cost power devices. Controlling the impurity concentration, which affects the characteristics, is crucial in wafer development. This document presents a case study of quantitative analysis of metal elements in the vicinity of Ga2O3 films. TOF-SIMS allows for highly sensitive evaluation even in very shallow regions.

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[Analysis Case] Qualitative and Imaging Analysis of Micro Areas Using TOF-SIMS

[Analysis Case] Qualitative and Imaging Analysis of Micro Areas Using TOF-SIMS

Qualitative and imaging analysis of foreign substances in the sub-micrometer order and micro-regions is possible.

TOF-SIMS allows for simultaneous elemental analysis and molecular information analysis of organic and inorganic substances through mass spectra obtained by locally analyzing specific areas, making it effective for evaluating foreign substances and micro-regions. This document summarizes examples of analysis in sub-micron order micro-regions. Samples that were sputter-processed with FIB on layered structures were measured using TOF-SIMS. Evaluation of sub-micron order micro-regions has been achieved.

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[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Three-Dimensional Cultured Human Skin

[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Three-Dimensional Cultured Human Skin

Visualization of the distribution of active ingredients applied to cultured skin using TOF-SIMS.

TOF-SIMS identifies components from the mass of molecular ions, eliminating the need for labels such as fluorescent substances, allowing for imaging without their influence. Additionally, cross-sectional imaging enables the evaluation of distribution in the depth direction. In this study, a gel formulation of indomethacin was applied to three-dimensional cultured human skin, visualizing the distribution of the permeated active ingredient. As a result, it was found that indomethacin is concentrated on the surface side of the stratum corneum. Furthermore, depth profile analysis observed a gradual penetration towards the cell layers.

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[Analysis Case] Transdermal Absorption Evaluation Using Three-Dimensional Cultured Human Skin

[Analysis Case] Transdermal Absorption Evaluation Using Three-Dimensional Cultured Human Skin

Distribution evaluation and quantitative analysis of the same sample are possible.

In recent years, the development of alternative methods to animal testing has progressed in the efficacy and safety testing of pharmaceuticals and cosmetics, with particular attention being paid to testing methods using three-dimensional cultured human skin. In this case study, a permeation test of indomethacin was conducted using a Franz cell, and TOF-SIMS and LC/MS/MS measurements were performed on the same skin sample. LC/MS/MS was used to quantify skin concentration and skin permeation, while TOF-SIMS was used to evaluate the component distribution within the skin. Measurement methods: TOF-SIMS, LC/MS, cryo-processing, cutting Product fields: Biotechnology, pharmaceuticals, cosmetics Analysis objectives: Composition distribution evaluation, safety testing For more details, please download the materials or contact us.

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[Analysis Case] LC/MS/MS Analysis of Catechin Metabolites in Urine

[Analysis Case] LC/MS/MS Analysis of Catechin Metabolites in Urine

Qualitative analysis of catechin metabolites in urine, as well as investigation of temporal changes and individual differences.

By using high-sensitivity LC-MS (Q-TOF type), qualitative analysis of low-concentration components such as metabolites in biological samples is possible. It allows for the search for components that have undergone metabolism such as addition or conjugation in the body, as well as inter-sample comparisons aimed at investigating temporal changes and individual differences. After consuming a high-concentration catechin beverage and collecting urine, both unchanged catechin and the metabolite catechin-glucuronide conjugate were confirmed. The amounts of catechin and metabolites in the urine of eight individuals were plotted for excretion over 0.5 to 8 hours post-consumption, and comparisons were made.

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Mass array method: A gene analysis method using mass spectrometry.

Mass array method: A gene analysis method using mass spectrometry.

Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.

In this method, the differences in the mass of bases are analyzed using MALDI-TOF-MS to determine the DNA base sequence. This allows for the detection of SNPs (single nucleotide polymorphisms), INDELs (insertions/deletions), CNVs (copy number variations), and more. It is characterized by the ability to analyze a large number of samples and detect a wide range of genes at once. - Multiplex PCR and MALDI-TOF-MS enable simultaneous analysis of up to 40 mutation sites. - Mass spectrometry specialized for the detection of bases (A/T/G/C) is possible. - A variety of analytical tools are available that have been pre-designed to detect target genes based on specific purposes. - Custom designs for analytical tools are also possible.

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MST [Chitose Sales Office] OPEN!

MST [Chitose Sales Office] OPEN!

We aim to further improve our services for customers in the Hokkaido area, based at the Chitose Sales Office.

We will open the Chitose Sales Office, the first in the Hokkaido area as MST. Based in the Chitose Sales Office, we aim to further improve our services for customers in the Hokkaido area. We will also achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (lab). Please look forward to it! Opening date: Thursday, April 11, 2024 Address: Room 160, Chitose Arcadia Plaza, 1-3-1 Kashiwadai Minami, Chitose City, Hokkaido *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-4001-1578 (Contact: Yanagimachi)

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[Analysis Case] Investigation of Foreign Object Occurrence: Analysis of the Tube

[Analysis Case] Investigation of Foreign Object Occurrence: Analysis of the Tube

It is possible to estimate the cause of wafer contamination!

TOF-SIMS is a very effective method for investigating the causes of contamination due to foreign substances, deposits, dirt, discoloration, and other factors related to the process. By comparing the mass spectral information obtained from contamination such as foreign substances with the mass spectral information of candidate contamination source components, it is possible to infer the sources of that contamination. In this document, we prepared four types of resin tubes used in the wafer manufacturing process and foreign substances on Si wafers, and by comparing their mass spectral information, we evaluated which components used in the process the contamination from the foreign substances was attributed to.

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[Information] Rapid Identification of Microorganisms Using MALDI-TOF MS

[Information] Rapid Identification of Microorganisms Using MALDI-TOF MS

Introduction to the principles, methods, specific examples of rapid microbial identification, as well as future challenges and applications in the food sector!

Today's food manufacturing is conducted in hygienically managed factories, where measures against foreign matter contamination and microbial contamination are important management issues. Packaging and containers utilize materials such as polymers, metals, and natural materials (like bamboo skin and leaves) that consider the characteristics of the food. Sterilization treatments, such as gamma irradiation, are performed as necessary to prevent microbial contamination. On the other hand, microorganisms adhering to food materials cannot be inspected visually and may proliferate after the product is filled. For more detailed information, please refer to the related catalog. [Contents (partial)] ■ Introduction ■ Overview and measurement principles of MALDI-TOF MS ■ Methods for identifying microorganisms using MALDI-TOF MS ■ Future challenges ■ Examples of applications in the food industry *For more details, please refer to the PDF document or feel free to contact us.

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Introduction to the Technical Note of the Mass Spectrometry Device ASTON

Introduction to the Technical Note of the Mass Spectrometry Device ASTON

We will introduce various technical documents using the mass spectrometry device ASTON.

We would like to introduce a technical note using the mass spectrometer ASTON. < List of Technical Notes > 1. ASTON Technical Note_vol.2_Measurement of Krypton in Air 2. ASTON Technical Note_vol.3_Measurement of Tungsten Etching 3. ASTON Technical Note_vol.4_Reproducibility *Technical notes will be added as needed.

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Precision mass spectrometry solutions for material release gases

Precision mass spectrometry solutions for material release gases

Real-time precise mass analysis is possible.

By analyzing the behavior of gases that are released from materials when heated or generated through thermal decomposition, it is possible to understand the state of gas adsorption and chemical adsorption on the materials, as well as the thermal properties of the materials. Materials and products can emit gases when exposed to various conditions. These gases can, in some cases, affect the human body or cause defects in the quality and performance of products, potentially leading to issues even in trace amounts. Using the "infiTOF-UHV," it becomes possible to understand the behavior of desorbed gases in high-resolution mode. 【Features (infiTOF-UHV)】 ■ Multi-turn TOF analyzer ■ Real-time analysis with high resolution, resolution > 30,000 ■ Suitable for gas analysis, measurement range m/z 1 to 1,000 ■ Compact size for installation and measurement anywhere ■ Power supply operates at 100–230 VAC, 500W, ensuring energy efficiency without location constraints *For more details, please refer to the PDF document or feel free to contact us.

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[Application Data] Example of Analysis of Cationic Surfactants

[Application Data] Example of Analysis of Cationic Surfactants

Application to ion pair reagents! Analysis example using the "Solnac Tube" for desalting in LC/MS.

Surfactants that change their properties at interfaces have both "hydrophilic" and "lipophilic" structural components within a single molecule. The hydrophilic part of surfactants often contains highly polar acids or bases, so in HPLC analysis, it is also possible to use a mobile phase with added ion-pair reagents such as sodium dodecyl sulfate (SDS). As a sample, a mixed solution of cationic surfactants such as tetrabutylammonium chloride and cetylpyridinium chloride was used for LC/MS measurements. For details on conditions and analysis results, please download the catalog. 【LC Conditions (Partial)】 ■ Equipment: Agilent 1200 ■ Flow rate: 0.3 ml/min ■ Detector: UV (215 nm) ■ Sample: Each 2.5 ppm solution ■ Injection volume: 5 μL *For more details, please refer to the PDF document or feel free to contact us.

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Application Data: Example of Negative Ion Measurement by TFA Removal

Application Data: Example of Negative Ion Measurement by TFA Removal

Using the desalting tube "Solnac Tube" for LC/MS! Removing TFA and conducting negative ion measurement.

When analyzing acidic compounds using reversed-phase partition chromatography, an acidic mobile phase (set to a pH more than 2 units lower than the pKa of the analyte) may be used to suppress dissociation. Common acidic mobile phases suitable for use in LC/MS include acetic acid, formic acid, and trifluoroacetic acid (TFA), with TFA being appropriate for use at low pH. However, TFA is considered to have too high an acidity, which can lead to ionization suppression with almost 100% probability when detecting the analyte as a negative ion. TFA was removed from the eluent using a Solnac tube, and negative ion measurements were conducted. For details on conditions and analysis results, please download the catalog. 【LC Conditions (Partial)】 ■ Equipment: Agilent 1200 ■ Flow rate: 0.3 ml/min ■ Detector: UV (210 nm) ■ Sample: Tryptophan 20 ppm solution ■ Injection volume: 5 μL *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of degradation products in lithium-ion batteries using IC-MS.

Analysis of degradation products in lithium-ion batteries using IC-MS.

[Case Study] Identification of Degradation Byproduct Ion Species

Lithium-ion batteries (LiB) are important components in electric vehicles (EV) and many electronic devices. Their quality directly affects the performance of EVs and other devices. In this study, we conducted a comprehensive analysis of the degradation products of LiB anodes. By combining ion chromatography (IC) and high-resolution mass spectrometry (HRMS), we performed identification and structural analysis of the degradation products. The analysis utilized an IC system and a quadrupole mass spectrometer to collect high-resolution full scan MS and data-dependent MS/MS data of the degradation products, followed by component extraction and database searches. Component extraction was performed using software, and structural identification was conducted using a database. As a result, we successfully identified the degradation products and analyzed their structures, yielding new insights that contribute to the improvement of LiB performance. In particular, the use of HRMS data enabled clear identification of ion species of unknown degradation products, demonstrating significant contributions to quality control and performance enhancement of LiB. This research deepens the understanding of the degradation mechanisms of LiB and represents an important step toward future improvements in battery performance. For more details, please refer to the PDF.

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[Market Report] Global Market for Analytical Instruments

[Market Report] Global Market for Analytical Instruments

The global analytical instruments market is redefining accuracy and insights, predicting significant growth.

The global analytical instruments market reached a substantial size of 46.1 billion USD in 2022 and is poised to redefine accuracy and insights. With promising prospects for significant expansion, industry experts predict that this market will generate an impressive revenue of 83.9 billion USD by 2031. This surge forecast implies a remarkable compound annual growth rate (CAGR) of 6.89% during the forecast period from 2023 to 2031. Analytical instruments serve as the foundation for scientific discoveries, industrial innovations, and quality assurance across diverse fields such as pharmaceuticals, materials science, and environmental monitoring. These tools enable researchers, engineers, and professionals to unlock insights at the molecular level, enhancing the progress and accuracy of decision-making. You can check the application method by clicking the [PDF Download] button or apply directly through the related links.

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