Last Updated： Aggregation Period:May 06, 2026～Jun 02, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:May 06, 2026～Jun 02, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:May 06, 2026～Jun 02, 2026
This ranking is based on the number of page views on our site.
31～54 item / All 54 items
![[Analysis Case] Observation of Pigment and Dye Dispersion](https://image.mono.ipros.com/public/product/image/f76/2000026109/IPROS8287645223618493547.jpg?w=280&h=280)
Micron-order imaging measurement using TOF-SIMS.
We investigated the distribution of the blue pigment "Cu phthalocyanine" dispersed on the polyethylene surface. TOF-SIMS analysis allows us to capture the distribution of organic materials with a pigment size of 1μm.
![[Analysis Case] Contamination Assessment of Si Wafer Bevel Area](https://image.mono.ipros.com/public/product/image/e5f/2000026126/IPROS5529742092656694678.jpg?w=280&h=280)
It is possible to evaluate both metal components and organic components simultaneously.
In semiconductor device manufacturing, from the perspective of improving yield, it is necessary to enhance the cleanliness of the backside of the wafer and to remove substances that remain on the bevel area of the wafer. In this study, we conducted TOF-SIMS analysis of the bevel inclined surface to evaluate the distribution of contamination (Figure 2). Additionally, by comparing the mass spectra of the adhered substances with those of the normal area and the contamination source, we found that the adhered substances matched the metal (Cr) and organic components of the contamination source. TOF-SIMS can capture the contamination generation process in the bevel area (edge and inclined surface).
![[Analysis Case] Heating Degradation Test of Lithium-Ion Secondary Batteries](https://image.mono.ipros.com/public/product/image/14d/2000244241/IPROS1254504107184249541.jpg?w=280&h=280)
Samples after thermal degradation can be evaluated using LC/MS/MS, TOF-SIMS, TEM+EDX, etc.
The development of lithium-ion secondary batteries faces challenges such as improving performance, extending lifespan, and enhancing reliability. To address these challenges, it is important to understand the degradation mechanisms of the batteries. In this study, we conducted a heating degradation test to evaluate the degradation mechanisms caused by temperature. After the heating degradation test, we assessed samples that showed significant capacity reduction using LC/MS/MS for the electrolyte, TOF-SIMS for the anode surface, and FIB-TEM+EDX for the cross-section of the anode.
![[Analysis Case] Evaluation of Film-Forming Component Encroachment on the Back Surface of the Wafer](https://image.mono.ipros.com/public/product/image/7cd/2000244288/IPROS4584994340989128982.jpg?w=280&h=280)
Quantitative evaluation of metal components is possible near the bevel area.
In semiconductor device manufacturing, it is necessary to remove metals remaining on the backside of the wafer from the perspective of improving yield, and it is important to quantitatively understand the amount of metal components remaining. To investigate the concentration distribution of metals remaining on the backside within a range of 500 µm from the bevel area, we conducted evaluations using TOF-SIMS. TOF-SIMS has the spatial resolution to detect metal components only near the bevel area, and by using standard samples with known concentrations, it is possible to quantitatively calculate the concentrations.
![[Analysis Case] Evaluation of Silicon (Si) Oxide Film State](https://image.mono.ipros.com/public/product/image/c5a/2000245605/IPROS37065991160639091217.jpeg?w=280&h=280)
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
In depth-direction analysis of molecular information obtained by TOF-SIMS, (1) the depth resolution is good, (2) it is possible to distinguish the chemical states of inorganic materials such as oxides, nitrides, fluorides, carbides, alloys, and metals, (3) evaluation of trace states is possible, (4) monitoring of OH is possible, (5) relative comparisons between samples (film thickness, composition) are possible, and (6) image analysis allows for a visual capture of the distribution of states at the surface level of a few nanometers. We will summarize the results of natural oxide films and oxide films. Measurement method: TOF-SIMS Product field: LSI, memory Analysis purpose: evaluation of chemical bonding states, evaluation of composition distribution, thickness of corrosion layers For more details, please download the materials or contact us.
![[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface](https://image.mono.ipros.com/public/product/image/2e6/2000245608/IPROS80672769150570683250.jpeg?w=280&h=280)
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
The presence of OH and fluoride on the surface of aluminum electrodes is one of the causes of electrode corrosion, and investigating the state of the aluminum surface is essential for identifying the causes of defects. TOF-SIMS excels in depth resolution at the very surface and can measure depth distribution with high sensitivity while monitoring the state of inorganic substances. By evaluating the depth distribution along with OH, we discovered a phenomenon where OH increased without a change in the thickness of the oxide film. In this way, TOF-SIMS enables the evaluation of depth distribution of molecular information of inorganic substances that cannot be obtained through elemental analysis.
![[Analysis Case] Evaluation of the Cleaning Effect of Organic Ingredients](https://image.mono.ipros.com/public/product/image/6d6/2000245752/IPROS4954599565268764824.jpg?w=280&h=280)
You can measure the 300mm wafer as it is.
TOF-SIMS has the characteristics of simultaneously evaluating organic and inorganic materials, being capable of analyzing small areas with high sensitivity at the very surface, and allowing evaluation while still in the form of 300mm wafers, making it effective for residue investigations during cleaning processes. We will introduce an analysis case of the removal effect of organic contamination on Si surfaces. TOF-SIMS analysis was conducted on samples where amine-based organic materials were confirmed to be in extremely small quantities by XPS. Even in small areas, it is possible to measure components in such extremely small amounts.
![[Analysis Case] Analysis of Additive Components in Polymer Films](https://image.mono.ipros.com/public/product/image/c08/2000246623/IPROS4338793611064845267.jpg?w=280&h=280)
Surface and depth distribution evaluation of additives in the film using GCIB.
Food wrap films may use additives to ensure stability against thermal exposure during the manufacturing process and to impart plasticity. These additives are required to remain stable under cooking conditions without changing. In this case, we present the results of an investigation using TOF-SIMS to examine whether the state of one of the additives, Irgafos168, changes (bleeds out) before and after heating. *GCIB: Gas Cluster Ion Beam
![[Analysis Case] Analysis of Discoloration Components in Fibers](https://image.mono.ipros.com/public/product/image/514/2000268026/IPROS2745253716703276512.jpg?w=280&h=280)
It is possible to evaluate the organic and inorganic components on the fiber surface.
TOF-SIMS is a highly effective method for investigating the causes of foreign substances, contamination, and discoloration in various processes, as it allows for localized analysis of specific areas and simultaneous analysis of elemental composition and molecular information of organic and inorganic substances through the obtained mass spectrum. Additionally, it enables image analysis, making the visualization of molecular information of organic substances possible. This document summarizes the analysis results of discoloration in clean suits, which are textile products. From the qualitative results obtained by TOF-SIMS, it was inferred that the discolored areas may be due to sebum.
![[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film](https://image.mono.ipros.com/public/product/image/a47/2000279093/IPROS91718319017085343.jpg?w=280&h=280)
High sensitivity analysis even in extremely shallow areas.
Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a material of interest for high-efficiency, low-cost power devices. Controlling the impurity concentration, which affects the characteristics, is crucial in wafer development. This document presents a case study of quantitative analysis of metal elements in the vicinity of Ga2O3 films. TOF-SIMS allows for highly sensitive evaluation even in very shallow regions.
![[Analysis Case] Qualitative and Imaging Analysis of Micro Areas Using TOF-SIMS](https://image.mono.ipros.com/public/product/image/dbd/2000287063/IPROS7457515137597281490.jpg?w=280&h=280)
Qualitative and imaging analysis of foreign substances in the sub-micrometer order and micro-regions is possible.
TOF-SIMS allows for simultaneous elemental analysis and molecular information analysis of organic and inorganic substances through mass spectra obtained by locally analyzing specific areas, making it effective for evaluating foreign substances and micro-regions. This document summarizes examples of analysis in sub-micron order micro-regions. Samples that were sputter-processed with FIB on layered structures were measured using TOF-SIMS. Evaluation of sub-micron order micro-regions has been achieved.
![[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Three-Dimensional Cultured Human Skin](https://image.mono.ipros.com/public/product/image/98a/2000309800/IPROS7545183631198236681.jpg?w=280&h=280)
Visualization of the distribution of active ingredients applied to cultured skin using TOF-SIMS.
TOF-SIMS identifies components from the mass of molecular ions, eliminating the need for labels such as fluorescent substances, allowing for imaging without their influence. Additionally, cross-sectional imaging enables the evaluation of distribution in the depth direction. In this study, a gel formulation of indomethacin was applied to three-dimensional cultured human skin, visualizing the distribution of the permeated active ingredient. As a result, it was found that indomethacin is concentrated on the surface side of the stratum corneum. Furthermore, depth profile analysis observed a gradual penetration towards the cell layers.
![[Analysis Case] Transdermal Absorption Evaluation Using Three-Dimensional Cultured Human Skin](https://image.mono.ipros.com/public/product/image/87d/2000343155/IPROS74140048043276338144.jpeg?w=280&h=280)
Distribution evaluation and quantitative analysis of the same sample are possible.
In recent years, the development of alternative methods to animal testing has progressed in the efficacy and safety testing of pharmaceuticals and cosmetics, with particular attention being paid to testing methods using three-dimensional cultured human skin. In this case study, a permeation test of indomethacin was conducted using a Franz cell, and TOF-SIMS and LC/MS/MS measurements were performed on the same skin sample. LC/MS/MS was used to quantify skin concentration and skin permeation, while TOF-SIMS was used to evaluate the component distribution within the skin. Measurement methods: TOF-SIMS, LC/MS, cryo-processing, cutting Product fields: Biotechnology, pharmaceuticals, cosmetics Analysis objectives: Composition distribution evaluation, safety testing For more details, please download the materials or contact us.
Genetic analysis is a method that reads the nucleotide sequences of DNA to investigate gene mutations and functions.
In this method, the differences in the mass of bases are analyzed using MALDI-TOF-MS to determine the DNA base sequence. This allows for the detection of SNPs (single nucleotide polymorphisms), INDELs (insertions/deletions), CNVs (copy number variations), and more. It is characterized by the ability to analyze a large number of samples and detect a wide range of genes at once. - Multiplex PCR and MALDI-TOF-MS enable simultaneous analysis of up to 40 mutation sites. - Mass spectrometry specialized for the detection of bases (A/T/G/C) is possible. - A variety of analytical tools are available that have been pre-designed to detect target genes based on specific purposes. - Custom designs for analytical tools are also possible.
![MST [Chitose Sales Office] OPEN!](https://image.mono.ipros.com/public/product/image/562/2001148236/IPROS33759112305938077223.jpeg?w=280&h=280)
We aim to further improve our services for customers in the Hokkaido area, based at the Chitose Sales Office.
We will open the Chitose Sales Office, the first in the Hokkaido area as MST. Based in the Chitose Sales Office, we aim to further improve our services for customers in the Hokkaido area. We will also achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (lab). Please look forward to it! Opening date: Thursday, April 11, 2024 Address: Room 160, Chitose Arcadia Plaza, 1-3-1 Kashiwadai Minami, Chitose City, Hokkaido *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-4001-1578 (Contact: Yanagimachi)
![[Analysis Case] Investigation of Foreign Object Occurrence: Analysis of the Tube](https://image.mono.ipros.com/public/product/image/387108/IPROS13070285683371051248.jpg?w=280&h=280)
It is possible to estimate the cause of wafer contamination!
TOF-SIMS is a very effective method for investigating the causes of contamination due to foreign substances, deposits, dirt, discoloration, and other factors related to the process. By comparing the mass spectral information obtained from contamination such as foreign substances with the mass spectral information of candidate contamination source components, it is possible to infer the sources of that contamination. In this document, we prepared four types of resin tubes used in the wafer manufacturing process and foreign substances on Si wafers, and by comparing their mass spectral information, we evaluated which components used in the process the contamination from the foreign substances was attributed to.
Rapid microbial identification mass spectrometer (industrial) equipped with technology from higher-end models.
The "BD Bruker MALDI Biotyper smart" is a mass spectrometry device for rapid microbial identification. It employs the same Flash Detector as high-end machines and features a short flight tube realized through patented technology PAN. 【Features】 ■ Measures 96 samples in about 15 minutes with a 200 Hz laser ■ Uses an oil-free pump for quiet, maintenance-free operation ■ Provides a library of approximately 3,000 species, including general bacteria and filamentous fungi, with the option to add custom libraries ■ Certified by AOAC International and ISO 16140-part 6 *For more details, please feel free to contact us.
![[Information] Rapid Identification of Microorganisms Using MALDI-TOF MS](https://image.mono.ipros.com/public/product/image/03c/2000704160/IPROS72307498021904210492.png?w=280&h=280)
Introduction to the principles, methods, specific examples of rapid microbial identification, as well as future challenges and applications in the food sector!
Today's food manufacturing is conducted in hygienically managed factories, where measures against foreign matter contamination and microbial contamination are important management issues. Packaging and containers utilize materials such as polymers, metals, and natural materials (like bamboo skin and leaves) that consider the characteristics of the food. Sterilization treatments, such as gamma irradiation, are performed as necessary to prevent microbial contamination. On the other hand, microorganisms adhering to food materials cannot be inspected visually and may proliferate after the product is filled. For more detailed information, please refer to the related catalog. [Contents (partial)] ■ Introduction ■ Overview and measurement principles of MALDI-TOF MS ■ Methods for identifying microorganisms using MALDI-TOF MS ■ Future challenges ■ Examples of applications in the food industry *For more details, please refer to the PDF document or feel free to contact us.
We will introduce various technical documents using the mass spectrometry device ASTON.
We would like to introduce a technical note using the mass spectrometer ASTON. < List of Technical Notes > 1. ASTON Technical Note_vol.2_Measurement of Krypton in Air 2. ASTON Technical Note_vol.3_Measurement of Tungsten Etching 3. ASTON Technical Note_vol.4_Reproducibility *Technical notes will be added as needed.
Real-time precise mass analysis is possible.
By analyzing the behavior of gases that are released from materials when heated or generated through thermal decomposition, it is possible to understand the state of gas adsorption and chemical adsorption on the materials, as well as the thermal properties of the materials. Materials and products can emit gases when exposed to various conditions. These gases can, in some cases, affect the human body or cause defects in the quality and performance of products, potentially leading to issues even in trace amounts. Using the "infiTOF-UHV," it becomes possible to understand the behavior of desorbed gases in high-resolution mode. 【Features (infiTOF-UHV)】 ■ Multi-turn TOF analyzer ■ Real-time analysis with high resolution, resolution > 30,000 ■ Suitable for gas analysis, measurement range m/z 1 to 1,000 ■ Compact size for installation and measurement anywhere ■ Power supply operates at 100–230 VAC, 500W, ensuring energy efficiency without location constraints *For more details, please refer to the PDF document or feel free to contact us.
![[Application Data] Example of Analysis of Cationic Surfactants](https://image.mono.ipros.com/public/product/image/419/2000813362/IPROS90828576391637526818.png?w=280&h=280)
Application to ion pair reagents! Analysis example using the "Solnac Tube" for desalting in LC/MS.
Surfactants that change their properties at interfaces have both "hydrophilic" and "lipophilic" structural components within a single molecule. The hydrophilic part of surfactants often contains highly polar acids or bases, so in HPLC analysis, it is also possible to use a mobile phase with added ion-pair reagents such as sodium dodecyl sulfate (SDS). As a sample, a mixed solution of cationic surfactants such as tetrabutylammonium chloride and cetylpyridinium chloride was used for LC/MS measurements. For details on conditions and analysis results, please download the catalog. 【LC Conditions (Partial)】 ■ Equipment: Agilent 1200 ■ Flow rate: 0.3 ml/min ■ Detector: UV (215 nm) ■ Sample: Each 2.5 ppm solution ■ Injection volume: 5 μL *For more details, please refer to the PDF document or feel free to contact us.
Using the desalting tube "Solnac Tube" for LC/MS! Removing TFA and conducting negative ion measurement.
When analyzing acidic compounds using reversed-phase partition chromatography, an acidic mobile phase (set to a pH more than 2 units lower than the pKa of the analyte) may be used to suppress dissociation. Common acidic mobile phases suitable for use in LC/MS include acetic acid, formic acid, and trifluoroacetic acid (TFA), with TFA being appropriate for use at low pH. However, TFA is considered to have too high an acidity, which can lead to ionization suppression with almost 100% probability when detecting the analyte as a negative ion. TFA was removed from the eluent using a Solnac tube, and negative ion measurements were conducted. For details on conditions and analysis results, please download the catalog. 【LC Conditions (Partial)】 ■ Equipment: Agilent 1200 ■ Flow rate: 0.3 ml/min ■ Detector: UV (210 nm) ■ Sample: Tryptophan 20 ppm solution ■ Injection volume: 5 μL *For more details, please refer to the PDF document or feel free to contact us.
![[Market Report] Global Market for Analytical Instruments](https://image.mono.ipros.com/public/product/image/391/2000957389/IPROS64018427302850551031.jpeg?w=280&h=280)
The global analytical instruments market is redefining accuracy and insights, predicting significant growth.
The global analytical instruments market reached a substantial size of 46.1 billion USD in 2022 and is poised to redefine accuracy and insights. With promising prospects for significant expansion, industry experts predict that this market will generate an impressive revenue of 83.9 billion USD by 2031. This surge forecast implies a remarkable compound annual growth rate (CAGR) of 6.89% during the forecast period from 2023 to 2031. Analytical instruments serve as the foundation for scientific discoveries, industrial innovations, and quality assurance across diverse fields such as pharmaceuticals, materials science, and environmental monitoring. These tools enable researchers, engineers, and professionals to unlock insights at the molecular level, enhancing the progress and accuracy of decision-making. You can check the application method by clicking the [PDF Download] button or apply directly through the related links.
