Mass Spectrometer - メーカー・企業17社の製品一覧とランキング

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Mass Spectrometerのメーカー・企業ランキング

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一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
ブルカージャパンダルトニクス事業部　微生物同定・菌株識別 Kanagawa//Testing, Analysis and Measurement
日本ベクトン・ディッキンソン品質管理・研究開発・注射剤の製剤研究・CMO Tokyo//Medical Devices
4 ATONARP INC. Tokyo//Electronic Components and Semiconductors
4 LECOジャパン Tokyo//Testing, Analysis and Measurement

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Mass Spectrometerの製品ランキング

更新日：Nov 12, 2025 集計期間:Oct 15, 2025～Nov 11, 2025
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Mass array method: A gene analysis method using mass spectrometry. 一般財団法人材料科学技術振興財団　MST
Rapid Microbial Identification "MALDI Biotyper" ブルカージャパンダルトニクス事業部　微生物同定・菌株識別
BD Bruker MALDI Biotyper smart 日本ベクトン・ディッキンソン品質管理・研究開発・注射剤の製剤研究・CMO
4 [Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding 一般財団法人材料科学技術振興財団　MST
4 Wafer bevel evaluation technology 東芝ナノアナリシス

Mass Spectrometerの製品一覧

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[Analysis Case] Characterization of Culture Medium

For the identification of main components, we conduct semi-quantitative analysis of multiple components, and for the management of specific components, we perform quantitative analysis, tailoring the analysis to the intended use.

The culture medium contains various compounds, including amino acids, organic acids, vitamins, nucleic acid-related compounds, and metabolites secreted from cells. At Kaneka Techno Research, we can semi-quantitatively and quantitatively analyze many organic and inorganic components contained in the culture medium using various analytical methods. By performing multivariate analysis on the obtained data, we can identify the component factors that influence production rates and provide useful information for problem-solving. ■ Analytical Methods Identification of main components: Semi-quantitative analysis of multiple components Management of target components: Quantitative analysis, etc. 〈Equipment Used〉 LC-MS/MS, CE-TOF/MS, GC/MS, IC, ICP-AES, ICP-MS, etc. This technology can also be applied to research and development in the medical field, such as regenerative cells, and the food industry.

企業：カネカテクノリサーチ本社、東京営業所、名古屋営業所、大阪分析センター、高砂分析センター
価格：Other

Contract measurement

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Introduction to the Application Note for the Mass Spectrometry Device ASTON

We will introduce various applications using the mass spectrometry device ASTON.

We would like to introduce application notes using the mass spectrometry device ASTON. <Application Note List> 1. ASTON Application Note_vol.1_Chamber Cleaning 2. ASTON Application Note_vol.3_Simple Component Analysis of Ethanol 3. ASTON Application Note_vol.2_High Sensitivity Endpoint Detection_Etching Process Monitoring *Application notes will be added as needed.

企業：ATONARP INC.
価格：Other

Other inspection equipment and devices

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Technical Data: KMD Plot of Nonionic Surfactants

We conducted an ingredient investigation regarding abnormal products containing nonionic surfactants!

This document introduces the technology of KMD plotting for nonionic surfactants. Surfactants are often used in blends of multiple types, and even when looking at individual surfactants, they are composed of numerous homologs, with the number of contained components often exceeding 100. In such cases, using LC/Q-TOFMS and KMD plot analysis allows for a visual distinction between normal and abnormal products. [Contents] ■ The difficulty of identifying drug-containing components using LC/MS ■ KMD plot analysis using LC/Q-TOFMS data ■ Principles *For more details, please refer to the PDF document or feel free to contact us.

企業：分析センター第一技術研究所
価格：Other

Other contract services

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Application Data: Example of Negative Ion Measurement by TFA Removal (2)

Using the desalting tube "Sornak Tube" for LC/MS! The effect of TFA removal allows for signal detection.

When analyzing acidic compounds using reversed-phase partition chromatography, an acidic mobile phase (set to a pH that is at least 2 lower than the pKa of the analyte) may be used to suppress dissociation. Common acidic mobile phases suitable for use in LC/MS include acetic acid, formic acid, and trifluoroacetic acid (TFA). While TFA is appropriate for use at low pH, it is believed to cause ionization suppression with nearly 100% probability when detecting the analyte as a negative ion. Using methionine, an amino acid with acidic groups and high polarity, as the sample, TFA was removed from the eluent using a Sorbent tube, and negative ion measurements were conducted. For details on conditions and analysis results, please download the catalog. 【LC Conditions (Partial)】 ■ Equipment: Agilent 1200 ■ Flow rate: 0.3 ml/min ■ Detector: UV (210 nm) ■ Sample: Methionine 20 ppm solution ■ Injection volume: 5 μL *For more details, please refer to the PDF document or feel free to contact us.

企業：プレッパーズ本社
価格：Other

Tubes and hoses

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Wafer bevel evaluation technology

Established a method for high-precision component evaluation using sensitivity and quantification-focused SIMS (D-SIMS)!

The component evaluation of the wafer bevel area is generally conducted using TEM or TOF-SIMS; however, both of these methods have limitations in sensitivity and quantification, making it difficult to evaluate trace components. By using a newly developed dedicated fixture, we have established a method for high-precision component evaluation using sensitivity- and quantification-focused SIMS (D-SIMS). Please feel free to contact us when needed. 【Technical Overview】 ■ Fixed with a dedicated fixture to prevent positional shifts of samples in an unstable tilted state and to reduce detection stability issues. ■ Measurement positions can be selected with high precision and flexibility. *For more details, please download the PDF or feel free to contact us.

企業：東芝ナノアナリシス
価格：Other

Other analysis and evaluation services

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Peptide discovery method "BLOTCHIP-MS method"

Protocera offers high-quality testing through peptide exploration methods!

The "BLOTCHIP-MS method" is an analytical technique that simplifies the process from one-dimensional electrophoresis to mass spectrometry, using a new measurement plate (BLOTCHIP) designed for high-speed processing of large sample volumes in MALDI-TOF-MS. Proteins that interfere with peptide mass analysis and high concentrations of salts that may contaminate the extraction process from biological tissues are completely removed during the one-dimensional electrophoresis step. The peptides in the gel are transferred to the BLOTCHIP in a single step via electroblotting, establishing a high-speed peptide analysis method that omits the complicated steps of conventional methods. The BLOTCHIP-MS method can be applied to various peptide research purposes beyond biomarker development. 【Features】 ■ Simple pretreatment ■ Less target loss compared to conventional methods since no protein removal is performed ■ Quantitative analysis is possible if the target peptides are known *For more details, please download the PDF or feel free to contact us.

企業：プロトセラ
価格：Other

others

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Collection of Analysis Examples for Mass Spectrometry Devices in Life Sciences

Analysis case presentation! Mass spectrometry equipment suitable for complex sample analysis such as food, petroleum, and materials science.

LECO's high-performance mass spectrometry equipment is a newly designed device developed without any compromise in data acquisition speed, mass accuracy, isotope abundance ratio, mass resolution, and dynamic range. It is used worldwide for the analysis of very complex samples. Certified to ISO-9001:2008, its quality is recognized globally. We provide equipment configurations tailored to your needs for sample analysis in various fields, including food, fragrances, petroleum, environmental issues, scientific investigation, materials science, and metabolomics. [Published Examples] - Comparative analysis methods between samples in aroma component analysis - Analysis methods for differences between samples in polymer materials - Metabolome analysis methods - Approaches to the identification of unknown compounds *You can view analysis examples for free from the "Download" section below!

企業：LECOジャパン
価格：Other

Analytical Equipment and Devices
Food Testing/Analysis/Measuring Equipment

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Rapid Microbial Identification "MALDI Biotyper"

Identification of bacteria, rapid, low cost, high precision

■ Low cost per sample, around several dozen yen ■ 7854 types. Original library can be expanded and shared ■ Identification of 1 sample in 11 minutes, 96 samples in 100 minutes using the smear method (※standard case) ■ Samples: bacteria, yeast, molds, etc. ■ Established protocols for filamentous fungi and acid-fast bacteria ■ Equipment used: microflex LT, microflex LT smart MALDI-TOF mass spectrometer

企業：ブルカージャパンダルトニクス事業部　微生物同定・菌株識別
価格：Other

Analytical Equipment and Devices

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[Information] History of MALDI Biotyper (White Paper)

From materials to microorganisms! A powerful technology that can identify down to the species level has been born.

This document explains the birth of MALDI-TOF MS, the development of the MALDI Biotyper, and the expansion of its applications. It reflects on the history of MALDI-TOF MS, the early role of scientists at Bruker in the manufacturing of commercial MALDI-TOF MS systems, and the impact of the widespread adoption of this technology. We encourage you to read it. 【Contents (partial)】 ■ Introduction ■ The birth of MALDI and the history of its early days ■ Bruker's first commercial MALDI-TOF MS system ■ Early applications of MALDI-TOF MS ■ Improvements in the usability of MALDI-TOF MS systems *For more details, please refer to the PDF document or feel free to contact us.

企業：ブルカージャパンダルトニクス事業部　微生物同定・菌株識別
価格：Other

Other physicochemical equipment

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[Analysis Case] Contamination Assessment of Si Wafer Bevel Area

It is possible to evaluate both metal components and organic components simultaneously.

In semiconductor device manufacturing, from the perspective of improving yield, it is necessary to enhance the cleanliness of the backside of the wafer and to remove substances that remain on the bevel area of the wafer. In this study, we conducted TOF-SIMS analysis of the bevel inclined surface to evaluate the distribution of contamination (Figure 2). Additionally, by comparing the mass spectra of the adhered substances with those of the normal area and the contamination source, we found that the adhered substances matched the metal (Cr) and organic components of the contamination source. TOF-SIMS can capture the contamination generation process in the bevel area (edge and inclined surface).

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Heating Degradation Test of Lithium-Ion Secondary Batteries

Samples after thermal degradation can be evaluated using LC/MS/MS, TOF-SIMS, TEM+EDX, etc.

The development of lithium-ion secondary batteries faces challenges such as improving performance, extending lifespan, and enhancing reliability. To address these challenges, it is important to understand the degradation mechanisms of the batteries. In this study, we conducted a heating degradation test to evaluate the degradation mechanisms caused by temperature. After the heating degradation test, we assessed samples that showed significant capacity reduction using LC/MS/MS for the electrolyte, TOF-SIMS for the anode surface, and FIB-TEM+EDX for the cross-section of the anode.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis
Contract measurement

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[Analysis Case] Evaluation of Film-Forming Component Encroachment on the Back Surface of the Wafer

Quantitative evaluation of metal components is possible near the bevel area.

In semiconductor device manufacturing, it is necessary to remove metals remaining on the backside of the wafer from the perspective of improving yield, and it is important to quantitatively understand the amount of metal components remaining. To investigate the concentration distribution of metals remaining on the backside within a range of 500 µm from the bevel area, we conducted evaluations using TOF-SIMS. TOF-SIMS has the spatial resolution to detect metal components only near the bevel area, and by using standard samples with known concentrations, it is possible to quantitatively calculate the concentrations.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Evaluation of Silicon (Si) Oxide Film State

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

In depth-direction analysis of molecular information obtained by TOF-SIMS, (1) the depth resolution is good, (2) it is possible to distinguish the chemical states of inorganic materials such as oxides, nitrides, fluorides, carbides, alloys, and metals, (3) evaluation of trace states is possible, (4) monitoring of OH is possible, (5) relative comparisons between samples (film thickness, composition) are possible, and (6) image analysis allows for a visual capture of the distribution of states at the surface level of a few nanometers. We will summarize the results of natural oxide films and oxide films. Measurement method: TOF-SIMS Product field: LSI, memory Analysis purpose: evaluation of chemical bonding states, evaluation of composition distribution, thickness of corrosion layers For more details, please download the materials or contact us.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

The presence of OH and fluoride on the surface of aluminum electrodes is one of the causes of electrode corrosion, and investigating the state of the aluminum surface is essential for identifying the causes of defects. TOF-SIMS excels in depth resolution at the very surface and can measure depth distribution with high sensitivity while monitoring the state of inorganic substances. By evaluating the depth distribution along with OH, we discovered a phenomenon where OH increased without a change in the thickness of the oxide film. In this way, TOF-SIMS enables the evaluation of depth distribution of molecular information of inorganic substances that cannot be obtained through elemental analysis.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Evaluation of the Cleaning Effect of Organic Ingredients

You can measure the 300mm wafer as it is.

TOF-SIMS has the characteristics of simultaneously evaluating organic and inorganic materials, being capable of analyzing small areas with high sensitivity at the very surface, and allowing evaluation while still in the form of 300mm wafers, making it effective for residue investigations during cleaning processes. We will introduce an analysis case of the removal effect of organic contamination on Si surfaces. TOF-SIMS analysis was conducted on samples where amine-based organic materials were confirmed to be in extremely small quantities by XPS. Even in small areas, it is possible to measure components in such extremely small amounts.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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