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Scanning Electron Microscope(sem) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
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Scanning Electron Microscope Product List

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[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

Black foreign substances scattered from the unit cooler! Introduction of a case where the trouble was successfully resolved.

We received a request to investigate the "black foreign substances" being dispersed from the unit cooler in the factory. 【Case】 ■Issue - We would like you to investigate the "black foreign substances" being dispersed from the unit cooler. ■Solution - Elemental analysis using "Scanning Electron Microscopy - Energy Dispersive X-ray (SEM-EDX)" - Analysis of organic materials using "Fourier Transform Infrared Spectroscopy" and comparison of the surface and cross-section of the foreign substances.

  • Contract measurement
  • Contract Inspection
  • Contract Analysis

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Tabletop Scanning Electron Microscope 'Phenom ProX'

Tabletop Scanning Electron Microscope 'Phenom ProX'

Overwhelming beauty on a large screen! The sample holder can be easily set into the device with a sliding mechanism.

We would like to introduce the tabletop scanning electron microscope 'Phenom ProX' that we handle. Equipped with a high-brightness, long-life CeB6 electron gun. It displays SEM images just 30 seconds after sample introduction, allowing for barrier-free analysis right away. Additionally, it is resistant to vibrations and offers a resolution of 6nm anywhere. Please feel free to contact us if you have any inquiries. 【Features】 ■ Equipped with a high-brightness, long-life CeB6 electron gun ■ Stunning beauty displayed on a large screen ■ Vibration-resistant with a resolution of 6nm anywhere ■ Innovative user interface ■ SEM image displayed in 30 seconds, analysis completed in 3 minutes *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes

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Tabletop Scanning Electron Microscope 'Phenom Pharos'

Tabletop Scanning Electron Microscope 'Phenom Pharos'

Even more beautiful with the FE electron gun! Achieving high resolution close to floor models with a tabletop SEM.

We would like to introduce the tabletop scanning electron microscope 'Phenom Pharos' that we handle. It enables analysis at the nano to sub-micron level. Anyone can easily and quickly perform high-resolution observations. Additionally, it is also possible to measure 3D structures, particles, and pores. Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with FE electron gun ■ Easy and speedy high-resolution observation for anyone ■ Observation + α (3D, particles, pores, fibers) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we answer our customers' questions using various tools such as electron microscopes and component analysis devices. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

  • others

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Contract observation using an electron microscope.

Contract observation using an electron microscope.

We offer surface observation using a scanning electron microscope (FE-SEM): Resolution (sensitivity, etc.): up to 200,000 times.

■Once you send us the sample, we will create a sample stage, take images, and convert them into image files (jpeg) before sending them back to you. ■We have set a low price, so please take advantage of it.

  • Contract measurement

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[Market Report] World Market for Scanning Electron Microscopes

[Market Report] World Market for Scanning Electron Microscopes

The global market for scanning electron microscopes is expected to drive scientific discoveries and experience significant growth.

The global market for scanning electron microscopes (SEM) is at the forefront of scientific exploration, achieving approximately $3.83 billion in revenue in 2022. Industry experts predict that this market will reach $7.84 billion in sales by 2031. This forecast implies a compound annual growth rate (CAGR) of 8.3% during the forecast period from 2023 to 2031. Scanning electron microscopes serve as a window into the microscopic world, revealing complex details of structures and materials that are not visible to the naked eye. From fundamental research to advanced industrial applications, SEMs are essential tools for scientists, engineers, and researchers to unravel minute mysteries. For application methods, please check the [PDF download] button or apply directly through the related links.

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Accelerating development through "visualization" inside the battery.

Accelerating development through "visualization" inside the battery.

Clarifying uncertain phenomena and unknown phenomena in battery development! KRI's one-stop service for secondary batteries.

At our company, battery and system engineers, materials engineers, and analytical engineers collaborate from their respective perspectives to elucidate phenomena and mechanisms. In the fusion technology of operando CT and image analysis (cell thickness and displacement analysis), we acquire three-dimensional images while intermittently and continuously charging and discharging, analyze the images, and evaluate changes. We provide a one-stop solution to clarify uncertain and unknown phenomena in battery development. 【Ultra-high resolution SEM and NMR (partial)】 ■ Potential contrast observation to distinguish materials that are difficult to differentiate through compositional analysis based on differences in conductivity. ■ Observation of sharp fiber shapes without "bulking" due to deposited films. ■ Understanding the bonding state of silane coupling agents chemically bonded to the substrate surface. ■ Observation of intermolecular interactions between phosphine oxide and the substrate. *For more details, please download the PDF or feel free to contact us.

  • Company：KRI
  • Price：Other
  • Technology Development
  • Other analysis and evaluation services

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