ジーフロイデ Product Lineup

Currently, the image quality is shifting from 4K to 8K, and the performance of optical systems is becoming increasingly stringent. In this technological context, in addition to the shape and eccentricity precision, strict specifications for center thickness are established. However, measuring the center thickness of a lens is a quite challenging task. The reason is that the measurement point is only a "single point" on the lens, making it difficult to clearly identify that position. To address these challenges, our company developed a non-contact lens center thickness measuring device five years ago. *For more details, please request materials or view the PDF data from the download section.*

• Other measurement, recording and measuring instruments

In optical theory, the axial misalignment of the optical axis is proportional to the coma aberration. This device is an interferometer designed for optical axis alignment focusing on this aspect. By substituting the allowable coma aberration value from the optical design into the device, it displays a "pass standard circle," and the adjustment work is completed by moving the image into that circle through alignment. This is a new concept interferometer born from ideas in the manufacturing field of optical manufacturers. Data acquisition uses the carrier fringe method, so a vibration isolation table is not necessary. Please feel free to make use of it!

• Other inspection equipment and devices

The "MFT (MicroFinish Topographer)" is a surface roughness measurement device for samples ranging from small to large diameters, offering simplicity and excellent cost performance. The high-precision phase measurement interferometer is controlled and driven by Apre's REVEAL software, providing various analytical environments with intuitive and easy operation. 【Features】 ■ Simple measurement of large optical parts ■ Quick measurement of small diameter parts ■ Rapid feedback on finishing information ■ Fast non-contact roughness measurement ■ Easy direct measurement of large diameter targets *For more details, please download the PDF or feel free to contact us.

• Other measurement, recording and measuring instruments