Yonata Electronics Product Lineup

The "PPT8200" is a high-performance parallel parametric test system designed with a "Per-Pin" architecture to optimize test efficiency. Equipped with SMUs and PGUs for each pin, it achieves over 50% higher throughput compared to traditional serial testers. The advanced software environment simplifies the development of test programs. It accelerates mass production launches, supports array testing, and provides a solution that balances high reliability and cost efficiency. 【Key Specifications (Partial)】 ■ Architecture: Per-Pin Architecture ■ Number of Pins: 48 Pins ■ Configuration: Per-Pin SMU, Per-Pin PGU ■ Voltage Range: ±200V ■ Current Range: ±1A ■ Throughput: >50% improvement compared to serial testers *For more details, please download the PDF or feel free to contact us.

• Tester

The "SWT5100" is a high-performance wafer-level test system designed for automated testing of silicon photonics wafers. It offers a fully automated testing process from wafer loading to optical alignment. Equipped with a chuck capable of temperature control from 25°C to 150°C, it supports optical, DC, and RF testing. It accommodates both GC and EC coupling and can be flexibly configured from single fibers to fiber arrays. 【Main Specifications (Partial)】 ■ Supported Wafer Size: 8 to 12 inches ■ Supported Wafer Thickness: 200 to 2000 um ■ Chuck Temperature Range: 25°C to 150°C ■ Supported Tests: Optical, DC, RF ■ Coupling Method: Grating coupling and edge coupling *For more details, please download the PDF or feel free to contact us.

• Tester

The "B2031 & B3031" is a high-precision benchtop SMU that has the capability to output and measure voltage and current simultaneously. It can output a maximum of ±30V and ±500mA (DC/Pulse), and features an excellent color LCD graphical user interface (GUI). It also supports traditional SMU SCPI commands. Transitioning from existing test code can be done quickly and easily. 【Key Specifications (Partial)】 ■ Model: B2031 (4 channels) / B3031 (8 channels) ■ Maximum Output: Voltage ±30V, Current ±500mA (DC/Pulse) ■ Minimum Measurement Resolution: Voltage 60µV, Current 100pA ■ Maximum Sampling Rate: 500 kS/s *For more details, please download the PDF or feel free to contact us.

• Other electronic measuring instruments

The "B0201 & B1201" is a high-precision benchtop SMU that can simultaneously output and measure voltage and current. It is an ideal choice for various IV measurement tasks that require high resolution and accuracy. It offers a wide voltage source (±200V) and current source (±1A DC, ±3A pulse) functionality, excellent precision, and a 6.5-digit display (minimum display resolution of 1fA/100nV). Additionally, it features an outstanding color LCD graphical user interface. 【Main Specifications (Partial)】 ■ Maximum Output Voltage: ±200V ■ Maximum Output Current: ±1A (DC), ±3A (Pulse) ■ Maximum Output Power (per channel): 20W ■ Minimum Measurement Resolution: 1fA/100nV ■ Maximum Sampling Rate: 1MS/s *For more details, please download the PDF or feel free to contact us.

• Other electronic measuring instruments

The "B6064C" is a high-density, versatile solution that supports bit error rate (BER) testing for high-speed cables compliant with PCIe 6.0 and earlier standards. Equipped with automatic link training and up to 40dB of insertion loss compensation, it is ideal for research and development, verification, and manufacturing testing of high-speed PCIe cables. It enables comprehensive system-level signal integrity verification in data center interconnects, providing essential quality assurance for cable manufacturers and system integrators. 【Key Specifications (Partial)】 ■ Test Unit: 2 x 64 Pair TRx ■ Terminal: AC Coupled ■ Supported Rates: 64GT/s, 32GT/s, 16GT/s, 8GT/s, 5GT/s, 2.5GT/s ■ Protocol Compliance: PCIe 6.0/5.0/4.0/3.0/2.0 *For more details, please download the PDF or feel free to contact us.

• Testing Equipment and Devices

The B3224 is a high-performance Bit Error Rate Tester (BERT) for physical layer characteristic evaluation and consistency testing. With excellent signal quality, a wealth of features, and flexible testing modes (integrated MCB or remote head), it provides powerful performance and flexibility from research and development to manufacturing testing of high-speed serial circuit products. It supports data rates from 24.33 to 120 Gbaud. The test patterns include various PRBS, SSPRQ, JP03A/B, Square Wave, and custom-defined patterns. 【Key Specifications (Partial)】 ■ Output Signal: Differential PAM4/NRZ (AC Coupled) ■ Output Amplitude: 800 mVp-p (Differential) ■ Rise/Fall Time: < 4.5 ps ■ Input Signal: Differential PAM4/NRZ (AC Coupled) ■ Clock Mode: Built-in Clock Recovery *For more details, please download the PDF or feel free to contact us.

• Tester

The DCA6065 is a high-performance 65 GHz sampling oscilloscope. It features a 65 GHz optical port bandwidth and offers selectable 1/2/4 channel configurations. It has a built-in TDECQ feed-forward equalizer (FFE) with a maximum of 64 taps. It supports flexible network configurations and includes a clock data recovery (CDR) system with 120 GBaud, or an independent CDR module can be added as an option. 【Key Specifications (Partial)】 ■ Optical Bandwidth: 65 GHz ■ Wavelength Range: 1250–1600 nm ■ Supported Standard Rates: 106.25/112 GBaud PAM4, 53.125/56 GBaud PAM4 ■ ADC Resolution: 14 Bit *For more details, please download the PDF or feel free to contact us.

• oscilloscope