AYAHA ENGINEERING CO.,LTD. Product Lineup

The "MICRO ACE Series" is an offline inspection device handled by Ayaha Engineering. The "OMI-UL," which can achieve a resolution of 0.7μ to ultra-high resolution inspection, can be linked with 3D measuring instruments and allows for the measurement of defect depth with the push of a button from the inspection map. Additionally, we offer a compact type "OMI-SP" and a simplified inspection model "OMI-FE" that can perform inspections at 10 to 100μ. 【Features】 <OMI-UL> ■ Capable of ultra-high resolution inspection from 0.7μ ■ Wide depth of field allows for full shape imaging of defects without variation due to focus ■ A rich combination of optical systems and defect type discrimination through image processing ■ Defect analysis possible with 3D measurement using a laser microscope (optional) ■ Active in research and development scenes for advanced materials such as displays, electronic materials, and batteries *For more details, please contact us.

The "AIRIS ACE Series" is an inline surface defect inspection device designed to match the characteristics of each industry. Considering the needs that will arise in 5 to 10 years, we emphasize expandability in both hardware and software. We support our customers with ease of use. We offer the base model of the series, "AIRIS-UC," and the "AIRIS-SP," which includes additional criteria for defect classification to meet a wider range of needs. 【Features】 ■ High expandability / Additional cameras and series ■ Multilingual support on the same platform ■ CoaXPress interface adopted ■ Processing capability improved by four times ■ Power consumption reduced by 43% *For more details, please refer to the PDF materials or feel free to contact us.

The "CONTACT ACE Series" is an inline inspection device compatible with both reflective and transmissive optical systems. The product in the same series, "CONTACT FILM," is a close-up surface defect inspection device that can automatically set mask positions (up to 48 locations) at the slit using dedicated software. This significantly reduces the effort required for inspection. By adopting a CIS (Contact Image Sensor), it does not use optical lenses, eliminating the influence of lens aberration at the edges and center of the field of view. 【Features (CONTACT FILM)】 ■ Designed for the film and coating industry ■ Space-saving compared to conventional cameras due to close-up imaging ■ Ideal for inspection just before winding and in narrow spaces after separation ■ Stable inspection across the entire field of view without being affected by lens aberration ■ Capable of inspecting a width of approximately 2000mm with a single camera *For more details, please refer to the PDF document or feel free to contact us.

The "Microwave Metal Detection Device" is a device that detects conductive materials (metals, metal oxides, carbon, water) using microwaves to prevent the contamination of foreign substances. We offer the "MFD2" for glass cloth, which detects metallic foreign substances remaining after the overheating process during glass production, and the "YMD" for glass yarn, which detects conductive materials mixed into the yarn before product formation. The "YMD" is available in a basic type and a detection management function type. 【Features】 <For Glass Cloth "MFD2"> ■ Targets sheet glass cloth used in semiconductors and electronic substrates ■ Detects metallic foreign substances remaining after the overheating process during glass production ■ Standard equipped with data collection functionality ■ Detection capability for conductive materials approximately φ3um×5mm *For more details, please refer to the PDF document or feel free to contact us.

■It features a low price and compact design that breaks common sense. ■Easy to install, lightweight type. ■Sensor adjustment can be easily performed.

■This is a super compact label marker for inspection devices. ■It is very low-cost and features a compact design. Compact design: Main unit 125mmW × 170mmD × 150mmH Control BOX 120mmW × 300mmD × 200mmH ■It can now be installed in spaces where conventional installation was difficult. ■Lightweight: Main unit weight approximately 1.8Kg ■Small seal labels can be used. Additionally, it is compatible with our standard label marker (AMK-S1). Sales will begin in September (Delivery time: approximately 2 weeks). *For details, please request materials or download the catalog.

Roller adhesive label marker Compact traveler in controller shape Available in high speed (11-300m/min), medium speed (5-150m/min), and low speed (2-70m/min) types. Low price starting from 350,000 yen.

- Management values are established for the uncoated width, coated width, and substrate width, allowing for monitoring of width anomalies. - Since front and back misalignment can also be managed, it is possible to reduce the loss of coating materials.

At Ayaha Engineering, we are developing new products using our technical expertise and your specialized knowledge as part of our "Collaborative Planning Product Series" to meet a wide variety of requests regarding defect detection. From film, sheet, and web inspection to non-woven fabric, electrode sheets, copper plates, steel plates, and metal foil inspection, we propose various defect inspection devices, surface inspection devices, and marking devices tailored to your product size, processing line, and detected defects. We are fully committed to tackling special workpieces and unprecedented inspection methods to realize your desire for "a machine like this!" 【We can meet the following requests!】 ■ I want a fiber inspection machine or a fabric inspection machine ■ I want to perform color inspection ■ I want to systematize unique inspection know-how ■ Complex devices are difficult to use ■ I want to conduct research using diverse algorithms *For more details, please contact us.