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microscope - Company Ranking(44 companies in total)

Last Updated: Aggregation Period:Feb 04, 2026〜Mar 03, 2026
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
【Specifications】 ◆JEM-1400Flash Electron Microscope Resolution: 0.2 nm (HC) 0.14 nm (HR) Acceleration Voltage: 10-120 kV Magnificat... For details on features and specifications, please visit the product page on the special website or download the PDF for more information. W...
【Specifications】 Resolution: 0.2 nm (HC) 0.14 nm (HR) Operating Voltage: 10-120 kV *For more details, please refer to the PDF or feel... [Applications] Low magnification observation of samples marked with fluorescent microscopy, including those in the fields of biology, polyme...
【Specifications】 Resolution※1  STEM HAADF Image: 70pm (200kV), 100pm (80kV), 160pm (30kV)  TEM Information Limit: 100pm (200kV), 110pm (80kV... 【Purpose】 Atomic resolution observation
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  1. Featured Products
    In various fields such as the semiconductor industry, polymer material development and research, and quality control!In various fields such as the semiconductor industry, polymer material development and research, and quality control!
    overview
    【Specifications】 ◆JEM-1400Flash Electron Microscope Resolution: 0.2 nm (HC) 0.14 nm (HR) Acceleration Voltage: 10-120 kV Magnificat...
    Application/Performance example
    For details on features and specifications, please visit the product page on the special website or download the PDF for more information. W...
    JEM-1400Flash Electron MicroscopeJEM-1400Flash Electron Microscope
    overview
    【Specifications】 Resolution: 0.2 nm (HC) 0.14 nm (HR) Operating Voltage: 10-120 kV *For more details, please refer to the PDF or feel...
    Application/Performance example
    [Applications] Low magnification observation of samples marked with fluorescent microscopy, including those in the fields of biology, polyme...
    JEM-ARM200F NEOARM Atomic Resolution Analytical Electron MicroscopeJEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
    overview
    【Specifications】 Resolution※1  STEM HAADF Image: 70pm (200kV), 100pm (80kV), 160pm (30kV)  TEM Information Limit: 100pm (200kV), 110pm (80kV...
    Application/Performance example
    【Purpose】 Atomic resolution observation