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microscope - Company Ranking(44 companies in total)

Last Updated: Aggregation Period:Mar 25, 2026〜Apr 21, 2026
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
By using sound waves, it is possible to observe the internal structure beneath the surface of the sample non-destructively, without being in... - Defect investigation of semiconductor package products - Defect investigation of internal electronic components - Investigation of voids a...
By repeatedly performing cross-sectional processing with FIB and observing with SEM, continuous SEM observation results can be obtained. By ... - Three-dimensional shape evaluation of semiconductor devices - Investigation of voids and disconnections in metal wiring after reliability ...
For detailed data, please refer to the catalog. Analysis of LSI and memory.
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  1. Featured Products
    [C-SAM] Ultrasonic Microscopy Method[C-SAM] Ultrasonic Microscopy Method
    overview
    By using sound waves, it is possible to observe the internal structure beneath the surface of the sample non-destructively, without being in...
    Application/Performance example
    - Defect investigation of semiconductor package products - Defect investigation of internal electronic components - Investigation of voids a...
    [Slice&View] Three-Dimensional SEM Observation Method[Slice&View] Three-Dimensional SEM Observation Method
    overview
    By repeatedly performing cross-sectional processing with FIB and observing with SEM, continuous SEM observation results can be obtained. By ...
    Application/Performance example
    - Three-dimensional shape evaluation of semiconductor devices - Investigation of voids and disconnections in metal wiring after reliability ...
    [Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM[Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM
    overview
    For detailed data, please refer to the catalog.
    Application/Performance example
    Analysis of LSI and memory.