C-SAM is a non-destructive method for observing defects such as delamination within a sample.
C-SAM is also known as SAT: Scanning Acoustic Tomography. - It is effective for confirming the "bonding state of electrodes" and "adhesion of bonded wafers," which are difficult to verify with X-ray CT observations. - In addition to reflected waves, transmission waves can also be acquired.
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basic information
By using sound waves, it is possible to observe the internal structure beneath the surface of the sample non-destructively, without being influenced by the optical properties of the sample. Due to the significant reflection at the interface with air, it is possible to observe voids and cracks present inside electronic component packages with high sensitivity. The determination of void locations is made based on the ultrasonic reflection waveforms at each measurement point.
Price information
The price varies depending on the measurement target, so please feel free to contact us.
Delivery Time
Applications/Examples of results
- Defect investigation of semiconductor package products - Defect investigation of internal electronic components - Investigation of voids at the silicon wafer bonding interface - Investigation of adhesion at the metal plate bonding interface - Defect investigation of surface-mounted LEDs - Investigation of adhesion of adhesives and adhesive tapes - Investigation of voids in ceramic materials *All samples require water resistance.
Detailed information
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Please consult with us first. ★ We will start with a proposal for the analysis plan ★ Meetings at your company are, of course, possible. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars tailored to the needs of our customers, featuring visits from our engineers. ★ Depending on your requests, we will introduce analysis techniques and explain analysis data. ◆ Example seminar content - A broad explanation of MST analysis methods - A detailed explanation of specific analysis methods from the principles - An explanation of the analysis data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
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