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  1. Home
  2. Testing, Analysis and Measurement
  3. バイオネット研究所
  4. June 26-28, 2023: Announcement of the 79th Annual Meeting of the Japanese Society of Microscopy (Matsue City, Shimane Prefecture) for presentations and exhibitions.
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  • Jun 19, 2023
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Jun 19, 2023

June 26-28, 2023: Announcement of the 79th Annual Meeting of the Japanese Society of Microscopy (Matsue City, Shimane Prefecture) for presentations and exhibitions.

バイオネット研究所 バイオネット研究所
■Conference Presentation Announcement■ We will be presenting on the STEM crystal orientation mapping software "DiffChecker." If you are interested, please join us. Date and Time: June 28 (Wednesday) 10:45–11:00, Venue A Title: Development of a Field Screening System Using Crystal Orientation Exploration and Its Application to Crystalline Polymers Speaker: Masataka Ohashi (Bionet Research Institute) Co-author: Koji Jin'nai (Tohoku University) and others Software to be introduced: STEM Crystal Orientation Mapping Software DiffChecker ■Exhibition Announcement Promoting DX in TEM/SEM Image Analysis! We will showcase software that streamlines tasks in electron microscope image processing. During the event, we will have demonstrations by technicians, providing detailed information on operation, features, system configuration, and advantages of the functions. Additionally, we have prepared affordable pricing for academic researchers. Please feel free to ask any questions. We would be delighted if you could stop by our booth during the conference.
Kunibiki Messe (Matsue City, Shimane Prefecture) / Booth: 32
Kunibiki Messe (Matsue City, Shimane Prefecture) / Booth: 32
Kunibiki Messe (Matsue City, Shimane Prefecture) / Booth: 32
Kunibiki Messe (Matsue City, Shimane Prefecture) / Booth: 32
Date and time Monday, Jun 26, 2023 ~ Wednesday, Jun 28, 2023
08:30 AM ~ 05:30 PM
The equipment exhibition on the final day, the 28th (Wednesday), will end at 14:30.
Capital Exhibition: The 79th Annual Meeting of the Japan Society of Microscopy Date: June 26 (Monday) to June 28 (Wednesday), 2023 Venue: Kunibiki Messe (Matsue City, Shimane Prefecture) Booth: 32 (BioNet Research Institute) Exhibits: Electron microscope image processing software - Transmission electron microscope image simulation software / BioNet BesTEM - Segmentation software for TEM/SEM with learning capabilities / SEGMAT - Crystal orientation mapping software for STEM / DiffChecker - Automatic particle picking software for cryo-TEM / GRIPS
Entry fee Free
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Related Documents

SEGMAT_Diffchecker_GRIPS_BioNet lab.pdf[4389818]

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Electron Microscope Simulation Software BioNet BesTEM

Faithfully simulate TEM/STEM images! Capable of handling protein samples and viruses as well.

"BioNet BesTEM" is a transmission electron microscope image simulation software that can simulate six-pole aberration-corrected electron microscopes from both domestic and international manufacturers, including JEOL and FEI. It can calculate beam intensity and Ronchigram while considering the optical system's influence of aberration-corrected electron microscopes. In addition to material system simulations, various functions have been added to enable effective simulations regarding the determination of optical conditions for actual cryo-electron microscopes in protein structure analysis. 【Features】 ■ Achieves overwhelming high-speed computation by setting a GPU-equipped PC with the software ■ Simulation calculations that consider optical conditions such as aberrations ■ Capable of structural analysis at the material and atomic levels ■ Can handle data from protein samples and viruses ■ Can simulate six-pole aberration-corrected electron microscopes from both domestic and international manufacturers ★ Free trial version available ★

  • Electron microscope
  • simulator
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Catalog of the electron microscope simulation software 'BioNet BesTEM'

Catalog of the electron microscope simulation software 'BioNet BesTEM'

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STEM Crystal Orientation Mapping Software 'DiffChecker' Brochure

STEM Crystal Orientation Mapping Software 'DiffChecker' Brochure

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Brochure for Automatic Particle Picking Software 'GRIPS' for Cryo-TEM

Brochure for Automatic Particle Picking Software 'GRIPS' for Cryo-TEM

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SEM/TEM AI Segmentation System "SEGMAT" Brochure

SEM/TEM AI Segmentation System "SEGMAT" Brochure

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BioNet Research Institute Co., Ltd. Company Profile

BioNet Research Institute Co., Ltd. Company Profile

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バイオネット研究所
Testing, Analysis and Measurement
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Airflow photography - Camera specialized for fine particle visualization

Maintenance Resilience 2026 We will exhibit a fine particle visualization system at the 52nd Plant Maintenance Show. (July 15 (Wed) - July 17 (Fri), 2026 / Tokyo Big Sight, East Hall 1, 1-H12)

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The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity, capable of visualizing the suspended or adhered states of micro and nano-sized particles in real time. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, inside and outside manufacturing equipment, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can cause quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that leads to reduced yield

Jul 04, 2026

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July 9, 2026 (Thursday) 13:30 - [Co-hosted Webinar by Restek] A Must-See for GC-MS Users! The Latest GC Columns Effective for Trace Analysis and Recent Case Studies on MS Utilization

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In this seminar, we will focus on the challenges of sensitivity reduction and separation performance in GC/MS analysis, and introduce the latest technologies and practical know-how that can help solve these issues. This time, we will also have a presentation from LECO Japan, who will discuss the benefits and applications of high-resolution and high-separation analysis with real examples. Additionally, Restek will introduce column technologies effective for improving sensitivity in trace analysis. Restek: We will explain the inert performance of the RMX GC column, which is effective for improving sensitivity in trace analysis, and the column technology that suppresses adsorption loss in low concentration areas, along with actual measurement data. LECO: We will present the latest application examples of comprehensive detection of trace components using high-sensitivity GC-TOFMS and RMX columns, including environmental, aroma, and material analysis. This content is recommended for anyone involved in multi-component analysis using GC/MS, whether for target or non-target analysis, as well as those who are just starting out. We will provide clear explanations suitable for beginners in GC/MS, so please join us.

Jul 03, 2026

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[Seminar] KDDI's Mobility Control Center Concept

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[Speaker] Hidetaka Ishibashi, Director of IoT Planning Department, KDDI Corporation [Key Lecture Content] Against the backdrop of declining birth rates, an aging population, and labor shortages, the nature of mobility is reaching a significant turning point. KDDI has established a "Mobility Control Center" to integratively support new mobility solutions such as autonomous vehicles, drones, and robots, based on the knowledge and infrastructure cultivated through the operation of connected cars. In this lecture, we will focus on the communication and monitoring functions that are essential for the social implementation of each mobility solution, discussing the challenges and efforts towards their resolution, as well as the future vision that KDDI aims for. [Lecture Items] 1. Efforts and history of connected cars 2. Development and initiatives for new mobility 3. Importance of remote monitoring in a mobility society 4. Challenges in communication and monitoring and efforts towards solutions 5. Future vision of the mobility society that KDDI aims for 6. Q&A

Jul 03, 2026

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[Seminar] Pioneering the Era of AI Data Centers through Photonic-Electronic Integration

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[Speaker] Ayako Tejima, Chief Researcher, and Yi Zhang, Senior Researcher ICT Research and Consulting Department, Information and Communications Research Institute, Inc. [Key Lecture Content] The rapid increase in power consumption of data centers due to the proliferation of generative AI has become a critical issue that affects the sustainable growth of AI businesses. In this lecture, we will explain the photonic-electronic convergence technology, which is being implemented in society as a trump card to break through this "power wall." While analyzing the research and development trends of global players, primarily major semiconductor companies in the United States, and market trends, we will present the trends of NTT's IOWN, the winning strategies of Japanese companies with strengths in materials, implementation, and equipment, as well as future business opportunities and challenges toward social implementation from a business perspective. [Lecture Items] 1. Why photonic-electronic convergence now? 2. What is photonic-electronic convergence? 3. Global market trends 4. Japan and the initiatives of Japanese companies 5. Future outlook 6. Challenges 7. Q&A / Business card exchange

Jul 03, 2026

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Challenge in the Field of Space and Aviation Seminar

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In the ever-evolving aerospace industry, the keywords are "environmental resistance," "high performance," and "lightweight" for equipment. This seminar has been planned as an opportunity to provide various topics, from explanations of difficult-to-machine materials such as titanium and Inconel to the latest trends in the space business. We hope you will watch and find hints for the next stage.

Jul 03, 2026

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