Dynamic SIMS

Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!

"DYNAMIC SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company's facility). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material. 【Features】 ■ Automatic loading/unloading of samples, high throughput (24 samples/load) ■ Unmatched depth profiling capability and high depth resolution, wide dynamic range ■ Optimized for the analysis of glass, metals, ceramics, silicon, compound semiconductors, shallow implants, etc. ■ Highest detection limit: from ppm to ppb (10^-6 to 10^-9) *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

TOF-SIMS can analyze light elements and inorganic substances as well as large organic molecules.

■TOF-SIMS Three Analysis Modes - High-resolution mass spectrum - Depth profile analysis - Surface mapping analysis

• Analytical Equipment and Devices
• Contract Analysis
• Other contract services

As an example of organic matter analysis, I would like to introduce a case where polyethylene glycol was analyzed.

TOF-SIMS can detect elements and organic molecules, as well as fragment ions, making it effective for organic analysis. As an example of organic analysis, we will introduce a case study of polyethylene glycol. Secondary ion mass spectra can provide valuable insights for the qualitative analysis of organic substances. In this case study, we can confirm the characteristic repeating structure of polyethylene glycol (C2H4O) as a peak group with a mass difference of 44. Calculating from the mass number, it is inferred that the terminal groups are H- and HO-, suggesting they are detected as protonated species. *For more details, please refer to the PDF document or feel free to contact us.*

• Contract Analysis
• Contract measurement
• Contract Inspection

The analysis sensitivity of TOF-SIMS is high at the ppm level, making it effective for analyzing trace contamination!

This is an introduction to a case where water droplet-shaped contaminants were created on a Si wafer through reproducibility experiments. Measurements were conducted at the same position using SEM-EDX and TOF-SIMS, and a comparison of the image maps was made. In the TOF-SIMS image map, organic substances (CH, CN), Na, and K were detected around the watermark. While no contaminants were observed around the watermark in the optical image, SEM image, and EDX analysis, the TOF-SIMS image map revealed that trace amounts of contaminants were present. *For more details, please refer to the PDF document or feel free to contact us.*

• Contract Analysis
• Contract measurement
• Contract Inspection

It is possible to detect with high sensitivity! We will introduce a case comparing the analysis of Li using TOF-SIMS and SEM-EDX.

We will introduce a case comparing the analysis of lithium (Li) using TOF-SIMS and SEM-EDX. While SEM-EDX is used for the analysis of contamination and foreign substances, it is difficult to detect Li with general EDX, excluding windowless EDX. On the other hand, TOF-SIMS can detect Li with high sensitivity. Please feel free to contact us if you need assistance. 【Overview】 ■ Analysis of stains on copper plates ■ SEM-EDX analysis → Difficult to detect Li ■ TOF-SIMS analysis → Li detectable *For more details, please refer to the PDF document or feel free to contact us.

• Contract measurement

The purity of the electrolyte greatly affects the performance of the battery! It suppresses the volatility of sulfur components and converts them into a form that can be detected by IC.

We would like to introduce an example of analyzing the purity of phosphorus pentasulfide using ion chromatography for the composition analysis of raw materials for all-solid-state batteries. Phosphorus pentasulfide is one of the raw materials used in the production of electrolytes for sulfide-based all-solid-state batteries. As a pretreatment for IC measurement, the powder of phosphorus pentasulfide was dissolved in alkaline water and converted into phosphate and sulfide salts. Subsequently, sulfide ions were oxidized to sulfate ions to prepare the IC measurement solution. For more details, please refer to the published catalog. 【Solid Electrolytes (Partial)】 ■Li3PS4 ■Li7P3S11 ■Li6PS5Cl ■Li6PS5Br *For more information, please refer to the PDF materials or feel free to contact us.

• Analytical Equipment and Devices

Features: ● Equipped with Intel Core Ultra 7 255H/7 155H/5 225H/5 125H ● LPDDR5x 16GB/32GB/64GB onboard ● M.2 NVMe 256GB onboard ● USB 2.0 x 8, USB 3.2 (10Gbps) x 4 ● PCIe Gen 4 [x8] x 1, PCIe Gen 3 [x1] x 4, PCIe Gen 3 [x4] x 1 (2 lanes co-lay with SATA; BOM option) ● 2.5GbE x 2 ● COM-HPC Mini standard, size 95mm x 70mm ● Optional items ECB-980A: Development carrier board HPC-ARHm-FAN01: CPU fan HPC-ARHm-HSP01: Heat spreader (Note: heat dissipation is required in the enclosure)

Features: ● Equipped with Jetson AGX Orin 32GB/64GB ● Gigabit LAN ×1, 10Gigabit LAN ×1 ● USB 3.2 Gen 2 (Type-A) ×4 ● DB-9 connector ×1 (for DIO 8 channels) ● DB-9 connector ×2 (supports RS-232/422/485: Rx/Tx/RTS/CTS) ● Jetpack 6.0.0 pre-installed

Features: ● Equipped with Intel Atom x7835RE/x7433RE ● LPDDR5x 8GB/16GB onboard ● eMMC 32GB/64GB onboard ● LVDS x 1, DDI x 1 ● USB 2.0 x 8, USB 3.2 Gen 2 x 2 ● PCIe x1 x 4 ● COMe Type 10 standard, 84mm x 55mm size ● Operating temperature -40 to 85℃ ● Optional items ECB-920A-0001: Development carrier board NANOCOM-ADN-FAN01: CPU fan NANOCOM-ADN-HSP01: Heat spreader (※ Heat dissipation is required in the enclosure)

■ FaceMe Security "Visitor Access Management" Main Features and Characteristics < Set Access Period for Each Visitor > - Individual settings for the dates and times visitors can enter - Access periods can be optimized according to the visitor's situation, whether for short visits or long stays. < Two Types of Authentication Methods to Accommodate Various Scenarios > ▶ Authentication via IP Camera - Enables authentication from a distance, achieving facial recognition without the need to disembark. ▶ Authentication via Facial Recognition Device (tablets, etc.) - Ideal for entry scenes such as reception or security posts. Can be flexibly utilized depending on the installation location and operation. - Allows for on-the-spot registration of facial information using the device, enabling smooth responses to sudden visits or unexpected guests. < Real-Time Notifications Supporting Security and Reception Operations > - Real-time notifications of visitor and employee classifications, authorization expiration, and authentication status. - Prevents delays and oversights in verification, balancing the reduction of security staff workload with enhanced security. These features resolve issues arising from visual checks, logbooks, and IC card operations, simultaneously achieving enhanced security and improved efficiency in reception and security operations.

The "Mechanical Stitching Method" by Nichinichisui Road Machinery Co., Ltd. is a new technique that allows for the repair of metal cracks without the application of heat. By using special bolts and reinforcement plates, cracks are physically removed, and repairs are made without causing any thermal impact on the base material. Repairs can be carried out even in environments where open flames cannot be used. Since no heat is applied, the disassembly of equipment is kept to a minimum. ◎ For more details, please contact us. ◎ If a detailed technical explanation is needed, please contact us.