Added 'Fundamental Mechanism of Electromigration' to the technical trend keywords.

Electromigration refers to the phenomenon where metal atoms move within the metal wiring of electronic devices due to the influence of strong current density. This phenomenon is caused when electrons flowing through the metal collide with atoms, imparting tiny forces. Below, we will explain its basic mechanisms and effects in detail.
1. Main factors
2. Conditions prone to influence
3. Results and impacts
4. Measures to mitigate effects
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