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  3. TAKAYA Corporation
  4. We have issued a press release. Takaya Corporation and Estakaya Electronics Co., Ltd. will exhibit at the 1st [Kansai] Nepcon Japan - Electronics Development and Implementation Exhibition.
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  • May 01, 2025
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May 01, 2025

We have issued a press release. Takaya Corporation and Estakaya Electronics Co., Ltd. will exhibit at the 1st [Kansai] Nepcon Japan - Electronics Development and Implementation Exhibition.

TAKAYA Corporation TAKAYA Corporation
We would like to express our sincere gratitude for your continued support. Takaya Corporation will be exhibiting at the 1st Kansai Nepcon Japan - Electronics Development and Implementation Exhibition - to be held from May 14 (Wednesday) to 16 (Friday), 2025, at Intex Osaka. On that day, we will showcase the new model of our flying probe tester, the APT-2600FD-A. The APT-2600FD-A is a groundbreaking inspection device that boasts industry-leading probing accuracy, suitable for inspecting high-density mounted circuit boards. To enhance inspection efficiency, we have newly equipped it with an automatic probe cleaner. Additionally, our group company, Estakaya Electronics Industry Co., Ltd., will display the camera module imaging tester DX3241. Based on years of experience in the development and manufacturing of equipment for camera modules, we have created an optimal structure for imaging tests in clean rooms. This semi-automatic type, specialized for development and small-scale production, performs all inspections and judgments automatically, with only the setting and removal of products into the socket done manually. Various settings can be customized by the customer. We sincerely hope you will visit our booth. Thank you very much.
Date and time Wednesday, May 14, 2025 ~ Friday, May 16, 2025
10:00 AM ~ 05:00 PM
Capital Venue: Intex Osaka Address: 1-5-102 Nanko-kita, Suminoe-ku, Osaka 559-0034 Booth Number: K1-1
Entry fee Free
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Flying Probe Tester APT-2400F / 2600FD

2025 Electronics Packaging Society Technical Award Winner!" "55th Mechanical Industry Design Award IDEA Winner!

Takaya Corporation has announced a new model of its flying probe tester, the "APT-2400F/APT-2600FD series," which reliably detects various defects in printed circuit boards through ultra-high-speed inspection. Equipped with cutting-edge inspection technology that can check the placement and connections of fine components with high precision, it ensures that even minor defects and risks are not overlooked, strongly supporting the improvement of product quality. Additionally, thanks to the company's unique control mechanisms and sensing technology, reliable inspections can be achieved even in fluctuating environments, contributing to quality management by reducing recall risks. Furthermore, it features a user-friendly interface that anyone can intuitively operate, helping to alleviate burdens in workplaces where labor shortages are becoming serious, while still ensuring high inspection accuracy and contributing to increased productivity. *For more details, please download the PDF document or feel free to contact us.*

  • Circuit Board Inspection Equipment

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APT-2400F-768x517.png

Flying Probe Tester APT-2400F

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!

The APT-2400F is a next-generation flying probe tester that boasts industry-leading probing accuracy capable of inspecting high-density mounted circuit boards. With its unique control mechanisms and sensing technology, it achieves highly reliable electrical testing in all environments. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your circuit boards. We can conduct a series of tests including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

  • Other measurement, recording and measuring instruments

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APT-2400F-SL-768x517.png

Flying Probe Tester APT-2400F-SL

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!

The APT-2400F-SL is a large model that maintains the basic performance of the APT-2400F while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long boards up to W985×D610mm. It can accommodate component heights of up to 60mm on the top and 120mm on the bottom, and can handle board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

  • Other measurement, recording and measuring instruments

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Dual Side Flying Probe Tester APT-2600FD

A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototyping to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.*

  • Circuit Board Inspection Equipment

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APT-2600FD-SL-768x530.png

Dual Side Flying Probe Tester APT-2600FD-SL

A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!

The APT-2600FD-SL is a large model that maintains the basic performance of the APT-2600FD while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. On July 31, 2025, at the Keidanren Kaikan in Otemachi, Chiyoda-ku, Tokyo, this product received the "Nikkankogyo Shimbun 110th Anniversary Award" at the "55th Mechanical Industry Design Award IDEA" ceremony. The judging committee praised the design philosophy that balances inspection efficiency and reliability, providing an opportunity for our technological and product design capabilities to be widely recognized. *For more details, please feel free to contact us.*

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Introduction of Group Companies: Estakaya Electronic Industries Co., Ltd.

We will utilize our independently developed technology and know-how to contribute to the future of society.

Estakaya Electronic Industries Co., Ltd. (formerly known as Sharp Takaya Electronic Industries Co., Ltd., which changed its name on October 1, 2021) has contributed to the development of an information-oriented society through the development and manufacturing of LSI (Large Scale Integration) devices and modules. Currently, we also manufacture and sell unique development products utilizing the technology and know-how we have cultivated over many years, as well as sell and provide services for environmental products to the local community. In the future, we will further respond to the diverse needs of our customers in an evolving society, from the development of original LSI device and module products to the establishment of production systems, as well as the creation of custom-made equipment and tools.

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Related catalog(5)

[Press Release] Takaya Corporation and Estakaya Electronics Co., Ltd. Exhibit at the 1st [Kansai] Nepcon Japan

[Press Release] Takaya Corporation and Estakaya Electronics Co., Ltd. Exhibit at the 1st [Kansai] Nepcon Japan

TECHNICAL
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[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

TECHNICAL
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Flying Probe Tester APT-2400F

Flying Probe Tester APT-2400F

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Company Profile Takaya Corporation

Company Profile Takaya Corporation

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Company Profile TAKAYA Corporation

Company Profile TAKAYA Corporation

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Free Webinar "EV Charging Infrastructure in the Asia-Pacific Region: Challenges of Fast Charging and Power Grid Modernization" to be held on December 3rd.

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Global Information, in collaboration with the research company PTR, will host a free co-sponsored webinar titled "EV Charging Infrastructure in the Asia-Pacific Region: Challenges of Fast Charging and Power Grid Enhancement." ■ Content A comprehensive explanation of the rapidly evolving electric vehicle charging infrastructure (EVCI) situation in the Asia-Pacific (APAC) region. ■ Language Japanese and English. *The presentation will be conducted in English (with Japanese subtitles). ■ Speakers Speakers: Mustafa Mirza, Head of E-Mobility Research Najd Nasseredin, Commercial Director for EMEA and APAC ■ Agenda *The schedule/content below is subject to change. 1. Introduction 2. EV market situation in Japan 3. Other EV market situations in APAC: South Korea, India, ASEAN 4. EV market situation in China 5. EV charging infrastructure situation in Japan 6. Other EV charging infrastructure situations in APAC: South Korea, India, ASEAN, etc.

Oct 28, 2026

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[Seminar] "Defense Ministry's Next-Generation Information and Communication/Cyber Policy in Response to 'New Ways of Fighting'"

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[Speaker] Ministry of Defense, Maintenance Planning Bureau, Cyber Maintenance Division, Director Shinpei Ara [Key Lecture Content] From peacetime to emergencies, information and communication infrastructure is the foundation for both the lives of citizens and the activities of the Self-Defense Forces. The Ministry of Defense and the Self-Defense Forces are advancing the construction of a "New Defense Information and Communication Infrastructure (tentative name)" utilizing next-generation information and communication technologies, based on the "Ministry of Defense Next-Generation Information and Communication Strategy," to respond to "new ways of fighting" backed by advanced technologies. Additionally, ensuring cybersecurity for this information and communication infrastructure is essential for the activities of the Self-Defense Forces. The Ministry of Defense and the Self-Defense Forces are working to improve their own cybersecurity while also contributing to the overall strengthening of the country's cybersecurity. In this lecture, I will explain the outline of these initiatives and the direction for the future. [Lecture Items] 1. Security Environment (New Ways of Fighting) 2. Information and Communication 3. Cyber 4. Q&A / Business Card Exchange *The program may change according to the latest situation.

Oct 28, 2026

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[Seminar] Structural Transformation of Mobile Business and Outlook for 2027

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[Lecture Topics] 1. A Review of the Mobile Market in 2026 and Outlook for 2027 Mr. Toshiichi Kita, Senior Partner, Nomura Research Institute, Ltd. 1. What happened in the mobile market in 2026? 2. Changes in the sales agency business 3. Evolution of devices and terminals 4. Expansion of the used and refurbished device market 5. The future of communication infrastructure business/telecommunication business 6. The direction of consumer protection rule revisions 7. The direction of competition rule revisions 8. Outlook for 2027 9. Q&A / Business card exchange 2. The Outlook for 5G Infrastructure Development and Network Sharing in the AI Era - The Significance of Neutral Hosts in Future 5G Infrastructure Development Mr. Daisuke Maeda, Executive Officer, Sharing Design, Inc. 1. The history of mobile communications 2. Traffic growth in the AI era and the digital infrastructure development plan for 2030 and the progress of sharing 3. From passive to active sharing 4. Summary 5. Q&A / Business card exchange

Oct 28, 2026

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39th Okinawa Prefectural Pharmacists Association Academic Conference

[11/29 | Okinawa] 39th Okinawa Pharmaceutical Association Academic Conference Equipment Exhibition

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Our company will be exhibiting at the "39th Okinawa Prefectural Pharmacists Association Academic Conference." We sincerely look forward to your visit.

Oct 28, 2026

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Profiler

Data Analysis Learning through 'Trial & Error' for Engineers: Practical Exploration of Factors and Building Predictive Models

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This session is aimed at engineers in the manufacturing industry, focusing on data utilization, and will explain practical approaches to factor exploration and predictive model building using JMP products. Analysis does not yield optimal results in one go; it is important to enhance accuracy through repeated trial and error in data preparation and model building. In particular, the quality of data preparation, such as preprocessing and feature creation, significantly influences the results, and JMP allows for efficient progress while visualizing the process. Using publicly available data for model building, we will introduce a series of processes from preparation, including visualization, preprocessing, and feature creation, to factor exploration through correlation and regression analysis, predictive model building (such as neural networks and random forests), and extraction of important factors, all through trial and error. Program: 1) What to do before the model: Key points of data preparation and trial & error using JMP 2) How to proceed with factor exploration and predictive model building without making it a black box ▼Details & Registration https://www.jmp.com/ja/events/live-webinars/non-series/2026/12-15-factor-exploration

Oct 28, 2026

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