An article introducing our product "APT-2600FD" has been published in EE Times Japan.

Our flying probe in-circuit tester "APT-2600FD," which we exhibited at the "JPCA Show 2025," has been featured in the electronics specialized media "EE Times Japan."
This product has received the Encouragement Award at the 21st JPCA Awards and garnered significant attention at the exhibition. The article provides detailed coverage of the product's features and technical advantages. Please see the related links below.
Moving forward, Takaya will continue to contribute to the improvement of manufacturing quality through the development of advanced inspection technologies.


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