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  3. マーポス
  4. Notice of Participation in SEMICON JAPAN 2025
SEMINAR_EVENT
  • Nov 14, 2025
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Nov 14, 2025

Notice of Participation in SEMICON JAPAN 2025

マーポス マーポス
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)
Date and time Wednesday, Dec 17, 2025 ~ Friday, Dec 19, 2025
10:00 AM ~ 05:00 PM
Advance registration is required for entry to this exhibition.
Capital Tokyo Big Sight (East Exhibition Hall)
Entry fee Free Admission to this exhibition requires prior registration.
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Related product

VBI_s.jpg

Dicing Machine Sensor "VBI (Blade Inspection System)"

Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.

"VBI" monitors the blade during wafer cutting, ensuring high reliability and reducing waste. By measuring blade wear and shape in real-time, it achieves scrap reduction without stopping production. The interface unit connects two sensors. It is possible to perform the same function with both or to execute two different functions. *For more details, please refer to the PDF document or feel free to contact us.*

  • Sensors
  • Wafer
  • Other measurement, recording and measuring instruments

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image_01.png

Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments

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High-precision non-contact gauge for measuring nano-layer film thickness 'NCG-R'

Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).

Non-contact measurements with high precision are achieved without damaging the measured object. Thickness measurements can be performed with extremely high resolution on all types of surfaces and materials, including highly reflective surfaces. The NCG-R system, equipped with a dedicated optical sensor, is designed with high protection performance (such as an enclosure compliant with IP standards), making it suitable for a wide range of applications from post-manufacturing inspections to in-process inspections. Thickness measurements of thin films, coatings, and nano-layers are the standout features of the NCG-R system, demonstrating exceptional performance. The NCG-R controller (visible light type) is compatible with all types of sensor heads, achieving optimized performance tailored to the measurement range and operating environment (such as working distance and spot size).

  • Coating thickness gauge

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NCG-R_IPROS_280x280.jpg

Interferometer Controller "HORIZON"

Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.

This is a series of controllers designed to measure thickness and distance in conjunction with optical sensor heads. Utilizing interferometric (interferometer) technology and a dedicated data processing software package, it provides a solution for accurate measurements even in situations where contact with the target area is not possible. With high precision and stability at the sub-micron level, it guarantees reliable measurements with excellent repeatability and accuracy. Additionally, it supports inline process control with real-time monitoring, contributing to improved production efficiency.

  • Coating thickness gauge

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STIL_icon01.jpg

Chromatic confocal technology, non-contact measurement for thickness measurement.

It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

Sensors and controllers using chromatic confocal measurement technology. We offer various options tailored to your work and environment. They are utilized in industries such as automotive, semiconductor, and glass worldwide. <Advantages> - Non-contact technology suitable for measuring soft or opaque materials (e.g., aluminum rolls, copper rolls, lithium-ion battery separators) - Capable of measuring layer thickness from 5µm - Wide measurement range suitable for inline use - High sensitivity and high precision (the reproducibility range of total thickness in actual applications is within 1µm) - Provision of measurement forks or a complete set of gauging equipment - Quick-SPC software option enables statistical processing and data transfer If you have the following challenges, please download the PDF and consult with us. - Variations in work or environment - Synchronization using multiple sensors - Mechanical alignment (tilt or misalignment) - Detailed understanding of measurements - Special applications requiring customization *For more details, please refer to the PDF document or feel free to contact us.

  • Sensors

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Related catalog(5)

Sensor for Dicing Machines 'VBI (Visual Blade Inspection System)'

Sensor for Dicing Machines 'VBI (Visual Blade Inspection System)'

PRODUCT
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Optical Interference Measuring Instrument 'NCG'

Optical Interference Measuring Instrument 'NCG'

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Non-contact sensor reflection measurement controller "NCG-R"

Non-contact sensor reflection measurement controller "NCG-R"

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Non-contact sensor interferometric controller "HORIZON"

Non-contact sensor interferometric controller "HORIZON"

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

CATALOG
  • E-book viewing
  • Catalog download

Contact this catalog

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Testing, Analysis and Measurement
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Case studies of aluminum parts manufacturing by pioneers utilizing metal 3D printers <Zoom Online Seminar> - Creating attractive parts with complex shapes that were previously impossible, lattice, honeycomb, and porous structures, achieving short time, low cost, ultra-lightweight manufacturing, significant reduction in the number of parts, and reduction in processes and workforce [Currently, half-price tuition].

  • NEW
  • SEMINAR_EVENT

With the current processing methods and technologies, it is difficult to create complex shapes, integrated structures, lattice/honeycomb structures, porous structures, hollow structures, hybrid structures, and direct manufacturing from 3D data. Furthermore, through topology optimization and collaboration with generative design, we can achieve the creation of innovative aluminum parts that are not available from conventional or other companies, rapid development and prototyping of parts, dramatic reduction in the number of parts, ultra-lightweight and compact designs, cost reduction, and significant decreases in the number of processes and personnel involved. In this seminar, leading users such as J·3D, ODEC, and pioneers in white copper, who have achieved remarkable results in aluminum part manufacturing using metal 3D printers, will discuss key points and precautions for implementation and utilization, various manufacturing methods and technologies, rapid, low-cost, high-quality manufacturing techniques, uniquely developed next-generation AM technologies, groundbreaking case studies that significantly differentiate from other companies' parts, as well as factors for failure and secrets to success. Based on numerous research results and rich manufacturing achievements, we will provide a clear and concrete explanation for those considering implementation, beginners with interest, and those who have just started in the field. [Currently, half-price tuition] When applying, please write "Other [8,500 yen]" in the "Other" section above the application form on our website.

Oct 31, 2026

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Webinar "No Need to Know the Model Number! Find the Perfect Connector! ODU Connector Matching"

  • NEW
  • SEMINAR_EVENT

Connectors exist in very large numbers in the world. It is very difficult for customers to find connectors that match their specific applications from among them. The "Product Finder" on the ODU website serves as a tool to help find the right connector products. You can search for the optimal connector from various approaches, such as matching it to your cable, electrical specifications, waterproofing, etc. The connectors you search for will provide information on electrical specifications, durability, and also CAD data. In the online seminar, we will introduce how easy and quick it is to search for connectors using the "Product Finder" in a live format. ------------ Date and Time: November 19, 2026 (Thursday) 14:00 - 14:35 Venue: Online (A URL for the venue will be sent via email after you register) Speakers: Miho Kato, Sales Department, Kamex ONE Co., Ltd. Masaru Kimura, Sales Manager, ODU Japan Co., Ltd. ------------

Oct 29, 2026

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Notice of Participation in the "Advanced Materials Technology Exhibition 2026" from November 18 (Wednesday) to November 20 (Friday), 2026.

  • NEW
  • SEMINAR_EVENT

KAI Group will be exhibiting at the "Advanced Materials Technology Exhibition 2026" held at Tokyo Big Sight. This exhibition widely introduces advanced materials and technologies in the industrial sector, covering everything from materials to their processing. It provides an essential venue for business discussions that are crucial for the development of new technologies and products in advanced fields. We plan to showcase industrial blades, cutters, and scissors with exceptional sharpness, leveraging the technology we have cultivated through our razor products. We sincerely look forward to your visit.

Oct 29, 2026

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We will be exhibiting at N-Plus 2026!

  • NEW
  • SEMINAR_EVENT

We will be exhibiting products that have undergone surface treatment through thermal spraying. Specifically, we will showcase products that have been ceramic thermally sprayed on metal rolls and aluminum alloy products that have undergone hard surface treatment. We provide a comprehensive service for thermal spraying repairs of parts that have lost thickness due to wear, surface modification of metal components, and other related machining processes. Exhibition Dates: November 11 (Wednesday) to 13 (Friday), 2026 - 3 days Opening Hours: 10:00 AM to 5:00 PM Venue: Tokyo Big Sight, East Hall 2

Oct 29, 2026

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Announcement of Prince Kinokuro's participation in "N-Plus 2026" (November 11, 2026 (Wednesday) to November 13, 2026 (Friday))

  • NEW
  • SEMINAR_EVENT

Kinoshita Corporation will exhibit at "N-Plus 2026," held at Tokyo Big Sight from November 11 (Wednesday) to 13 (Friday), as a member of the Japan Nonwoven Fabric Association's joint pavilion. In this exhibition, we will introduce a wide range of products, including the water-soluble and biodegradable nonwoven fabric "Haibios," themed "Returning to Paper," as well as the pulp nonwoven fabric "Kinari-to," which can be thermoformed. Additionally, we will have a mini sound absorption experience corner where you can actually test the differences in sound using our pulp-based sound-absorbing material "Otocell." We will showcase the various possibilities of our airlaid nonwoven fabrics through actual product displays and demonstrations. Please come and see our products and samples at the venue.

Oct 29, 2026

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