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  3. マーポス
  4. Notice of Participation in SEMICON JAPAN 2025
SEMINAR_EVENT
  • Nov 14, 2025
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Nov 14, 2025

Notice of Participation in SEMICON JAPAN 2025

マーポス マーポス
Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)
Date and time Wednesday, Dec 17, 2025 ~ Friday, Dec 19, 2025
10:00 AM ~ 05:00 PM
Advance registration is required for entry to this exhibition.
Capital Tokyo Big Sight (East Exhibition Hall)
Entry fee Free Admission to this exhibition requires prior registration.
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Related product

VBI_s.jpg

Dicing Machine Sensor "VBI (Blade Inspection System)"

Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.

"VBI" monitors the blade during wafer cutting, ensuring high reliability and reducing waste. By measuring blade wear and shape in real-time, it achieves scrap reduction without stopping production. The interface unit connects two sensors. It is possible to perform the same function with both or to execute two different functions. *For more details, please refer to the PDF document or feel free to contact us.*

  • Sensors
  • Wafer
  • Other measurement, recording and measuring instruments

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Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments

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High-precision non-contact gauge for measuring nano-layer film thickness 'NCG-R'

Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).

Non-contact measurements with high precision are achieved without damaging the measured object. Thickness measurements can be performed with extremely high resolution on all types of surfaces and materials, including highly reflective surfaces. The NCG-R system, equipped with a dedicated optical sensor, is designed with high protection performance (such as an enclosure compliant with IP standards), making it suitable for a wide range of applications from post-manufacturing inspections to in-process inspections. Thickness measurements of thin films, coatings, and nano-layers are the standout features of the NCG-R system, demonstrating exceptional performance. The NCG-R controller (visible light type) is compatible with all types of sensor heads, achieving optimized performance tailored to the measurement range and operating environment (such as working distance and spot size).

  • Coating thickness gauge

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Interferometer Controller "HORIZON"

Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.

This is a series of controllers designed to measure thickness and distance in conjunction with optical sensor heads. Utilizing interferometric (interferometer) technology and a dedicated data processing software package, it provides a solution for accurate measurements even in situations where contact with the target area is not possible. With high precision and stability at the sub-micron level, it guarantees reliable measurements with excellent repeatability and accuracy. Additionally, it supports inline process control with real-time monitoring, contributing to improved production efficiency.

  • Coating thickness gauge

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STIL_icon01.jpg

Chromatic confocal technology, non-contact measurement for thickness measurement.

It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

Sensors and controllers using chromatic confocal measurement technology. We offer various options tailored to your work and environment. They are utilized in industries such as automotive, semiconductor, and glass worldwide. <Advantages> - Non-contact technology suitable for measuring soft or opaque materials (e.g., aluminum rolls, copper rolls, lithium-ion battery separators) - Capable of measuring layer thickness from 5µm - Wide measurement range suitable for inline use - High sensitivity and high precision (the reproducibility range of total thickness in actual applications is within 1µm) - Provision of measurement forks or a complete set of gauging equipment - Quick-SPC software option enables statistical processing and data transfer If you have the following challenges, please download the PDF and consult with us. - Variations in work or environment - Synchronization using multiple sensors - Mechanical alignment (tilt or misalignment) - Detailed understanding of measurements - Special applications requiring customization *For more details, please refer to the PDF document or feel free to contact us.

  • Sensors

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Related catalog(5)

Sensor for Dicing Machines 'VBI (Visual Blade Inspection System)'

Sensor for Dicing Machines 'VBI (Visual Blade Inspection System)'

PRODUCT
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Optical Interference Measuring Instrument 'NCG'

Optical Interference Measuring Instrument 'NCG'

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Non-contact sensor reflection measurement controller "NCG-R"

Non-contact sensor reflection measurement controller "NCG-R"

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Non-contact sensor interferometric controller "HORIZON"

Non-contact sensor interferometric controller "HORIZON"

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

CATALOG
  • E-book viewing
  • Catalog download

Contact this catalog

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Mechanical Elements Technology Exhibition

Notice of Participation in the 31st Mechanical Components Technology Exhibition from July 1 (Wednesday) to July 3 (Friday), 2026.

  • NEW
  • SEMINAR_EVENT

Riken NPR Corporation will be exhibiting at the 31st Mechanical Components Technology Exhibition held at Tokyo Big Sight. We plan to showcase three items: "motors," "actuators," and "wave gear reducers," along with "surface treatment technology." ■ Riken NPR Corporation ■ East Exhibition Hall E6-55 We sincerely look forward to your visit to our booth.

Jun 04, 2026

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June 18, 2026 (Thursday) 13:30 ~ 【Restek Webinar】 Pitfalls and Countermeasures in PFAS Analysis ~ To Obtain Reliable Data ~

  • NEW
  • SEMINAR_EVENT

Explaining Practical Know-How to Improve the Accuracy of PFAS Analysis In this webinar, we will clearly introduce practical points that make a difference in the field of PFAS analysis, incorporating specific challenges and countermeasures. Additionally, we will answer as many questions as possible that were submitted during pre-registration, sharing insights that contribute to improving analytical accuracy. <Recommended for the following individuals> ✅ Those who are about to start PFAS analysis ✅ Those who are troubled by not knowing the causes of analytical issues ✅ Those aiming for more accurate and efficient analysis ✅ Those who want to gain the latest information and practical knowledge about PFAS analysis https://register.gotowebinar.com/#register/1088563146654203739?source=iPROS

Jun 04, 2026

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We will exhibit at the Kansai Robot World.

  • NEW
  • SEMINAR_EVENT

We plan to showcase a demo system incorporating our products. We look forward to welcoming many of you.

Jun 04, 2026

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Notice of Participation in the 38th Monozukuri World Tokyo (July 1, 2026 - July 3, 2026)

  • NEW
  • SEMINAR_EVENT

Nihon Computer Development Co., Ltd. will exhibit at the "38th Monozukuri World Tokyo." We sincerely look forward to your visit.

Jun 04, 2026

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Notice of Participation in "SPORTEC 2026" from July 8 (Wednesday) to July 10 (Friday), 2026.

  • NEW
  • SEMINAR_EVENT

Central Automotive Industry Co., Ltd. will be exhibiting at "SPORTEC 2026" held at Tokyo Big Sight. We plan to showcase "C.A.W Antibacterial Deodorizing Titania," which decomposes bacteria and viruses attached to surfaces, and alkaline ionized water "CPC ALE." At our booth, we will demonstrate the deodorizing and antibacterial effects of C.A.W Antibacterial Deodorizing Titania and display the effects of CPC ALE.

Jun 04, 2026

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