Analysis Seminar "X-ray Diffraction/Scattering, Solid NMR Analysis"
X-ray diffraction is a technique that analyzes the scattering from crystals present in materials such as inorganic substances, organic compounds, and polymers to identify the chemical structure of the substance (crystal) and evaluate properties related to the material, such as crystal size, orientation, quantity, and residual stress. X-ray diffraction is a long-established analytical method, and simple devices are commercially available; however, it is important to consider how data is obtained, such as by changing the configuration of the equipment depending on the measurement purpose. This course will explain the underlying measurement principles while presenting application examples.
Solid-state NMR is a technique for analyzing the chemical structure of polymers that are insoluble in solvents, battery materials, inorganic compounds, and higher-order structures (crystalline/amorphous, polymorphs, etc.) that lose structural information when dissolved. In addition to the commonly used 13C NMR in solid-state NMR, examples of analyses using 29Si, 19F, 11B, and 1H will also be introduced. In NMR, besides structural analysis from spectra, dynamics analysis can be performed through measurements of relaxation times and diffusion coefficients. NMR has become quite automated in recent years, but understanding multiple measurement methods and having a certain level of experience is necessary for quantitative analysis and dynamics analysis. The course will also explain examples of dynamics analysis focusing on battery materials.

| Date and time | Tuesday, May 26, 2026 01:00 PM ~ 04:00 PM |
|---|---|
| Entry fee | Charge 44,000 yen (including tax) |
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Details & Registration
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