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  6. High-performance film thickness gauge Leptoscope 2041

High-performance film thickness gauge Leptoscope 2041

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High-performance film thickness gauge Leptoscope 2041

last updated:Apr 01, 2025

日本マテック
日本マテック
  • Official site

A high-performance thickness gauge that allows for easy and highly accurate measurement of non-magnetic metal film thickness and non-conductive film thickness on magnetic substrate materials.

◆Built-in data logger (up to 3850 points) ◆RS232 output ◆Calibration selection available for easy operation to high-precision measurement, even on unknown film thickness ◆Upper and lower limit alarm setting function ◆Calculation functions, number of measurement points, maximum, minimum, average, standard deviation ◆Offset function ◆Wide variety of probes Choose from a rich variety, from small microprobes to ZP probes for thick materials. ◆Measurement range: 0 to 12500μm (up to 20mm with NEW probe) ◆Measurement accuracy: Single pole probe, 1%±1μm for 100μm or less, 1.3%±1μm for over 100μm ◆Dimensions: W83×H151×D35mm, 300g Power: Two AA batteries, 26 hours of use ◆For inquiries, please contact us at the following: Tokyo Headquarters: TEL: 03-3221-7531 Osaka Branch: TEL: 06-6885-6201 Email: sales@matech.co.jp

    Coating thickness gauge
127744002.image_data.jpg

High-performance film thickness gauge Leptoscope 2041

127744002.image_data.jpg
127744002.image_data.jpg
  • Related Link - http://www.matech.co.jp/html/2041.html

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basic information

- Measurement of non-magnetic metal film thickness and non-conductive film thickness on magnetic substrate, measurement of non-conductive film thickness on non-magnetic substrate, and measurement of single non-magnetic metal layers or non-conductive foils on metal can be easily and accurately performed. - A high-performance model that can use a wide variety of detachable probes! - Only available from Karl Deutsch, a small-diameter microprobe can be used. With a tip diameter of 1mm, measurements can be taken in narrow spaces. - Equipped with a large LCD module (55x28mm)! - Not only have the displayed numbers increased in size, but submenus are also displayed, significantly improving operability. The screen resolution has also been upgraded to 128x64 pixels. - Calibration, operation, and verification have become easier. - Quickly catches mistakes in the probe contact method and improves accuracy by excluding them from the data. - Equipped with a backlight, making the screen easier to see in dark places.

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Applications/Examples of results

Measurement of plating, coating films, and thermal spray coatings on metals, anodized layer, clad thickness measurement (such as SUS cladding on steel, which is difficult with ultrasound), measurement of electrodeposition film thickness and galvanizing film thickness on automotive parts, thickness measurement of film sheets, resin films, copper foil, gold foil, paper, and resin sheets.

Company information

日本マテック

日本マテック

Testing, Analysis and Measurement

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We prepare a wide range of inspection methods and devices, providing suitable inspection methods. To achieve inspection objectives, the selection of optimal means is the first necessity. Our company offers various inspection methods such as UT, ET, MT, PT, RFT, RT, AT, LUT, etc., allowing us to respond broadly to various demands. Furthermore, to meet diverse requirements, we constantly seek the latest technology and make efforts in information gathering and product development to equip ourselves with the most advanced devices from around the world. We assist with all aspects of inspection implementation. Another significant feature of our company is that we do not limit ourselves to merely selling hardware; we independently develop applications, starting with the selection of suitable main devices/probes for the purpose, providing advice on inspection processes, and offering software that includes the development and guidance of inspection methods. Through package sales, we strive to enhance our user support system and technical capabilities to achieve objectives quickly and efficiently.

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