Test sockets optimal for high-frequency, high-performance devices.
It has high-frequency characteristics from DC to 6GHz and is widely compatible with various packages such as SMD, QFP, SOP, SOJ, TSOP, SSOP, PLCC, and LCC.
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basic information
This is a component (IC socket) used to attach the device to the handler during the final inspection after the LSI package implementation. In line with the growth of communication and network LSI, including mobile phones and mobile devices, our contactors are particularly suitable for measuring high-frequency and high-performance packages.
Price information
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Delivery Time
P4
Applications/Examples of results
Final inspection after LSI package implementation
Company information
We are a company that develops, manufactures, and sells inspection equipment and tools for electronic components such as semiconductor inspection tools like probe cards, as well as inspection equipment for semiconductors and liquid crystal displays, utilizing electrical measurement technology, microfabrication technology, image processing technology, and more. With approximately 60% of our sales coming from overseas, we have seven overseas bases for production, sales, and services, and we operate in the global field of the expanding electronics industry.
