We will identify the surface adsorbate components using TOF-SIMS.
Residue from adhesive tape can cause poor adhesion and peeling during the manufacturing process. When residue is suspected to be the cause of defects, TOF-SIMS, which can analyze the composition and distribution of surface contaminants, is effective. We will present a case where the surface of a silicon wafer was adhered with adhesive tape and measured with TOF-SIMS after peeling it off.
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basic information
For detailed data, please refer to the catalog.
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Applications/Examples of results
Analysis of daily necessities.
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Download All Catalogs![[Analysis Case] Evaluation of Adhesive Tape Residue_C0197](https://image.mono.ipros.com/public/catalog/image/01/81e/210184/IPROS1275910503216509208.jpg?w=120&h=170)
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!