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  6. SoC/Analog Test System Model 3650-EX

SoC/Analog Test System Model 3650-EX

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Model 3650-EX

last updated:Mar 04, 2021

クロマジャパン
クロマジャパン
  • Official site

A cost-effective SoC/analog test system.

The 3650-EX is a tester specially designed to provide cost-effective solutions for fabless companies, IDMs, and test houses, featuring high throughput and extensive multi-site testing capabilities. With high functionality, precision, powerful software tools, and high reliability, the 3650-EX is an ideal tester for testing consumer devices, high-performance microcontrollers, and SoC devices.

    Other inspection equipment and devices
3650-EX.jpg

SoC/Analog Test System Model 3650-EX

3650-EX.jpg
3650-EX.jpg
  • Related Link - https://www.chromaate.com/jp/product/soc_analog_te…

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basic information

Highly compatible 10-slot test head Maximum frequency 50/100 MHz, data rate 100/200 Mbps Simultaneous measurement count: up to 512 sites Digital I/O pins: up to 1024 pins Vector memory: 32/64 MW PMU (DC measurement function): up to 32 channels Functionality per pin (timing/PPMU/frequency measurement) Scan memory maximum 4G depth / 32 scan chains ALPG (memory measurement function) optional Timing accuracy: ±300ps High voltage pins: up to 64 channels Multi-channel power supply: DPS 96 channels 32-channel HDADDA (ADC/DAC measurement function) optional 8~32 channel VI45 (±45V) analog option 2~8 channel PVI100 (±100V) analog option MRX option (for 3rd party PXI/PXIe applications) Test program/test pattern converter from other testers available STDF data output support Air cooling within the test head Compact test head with a small footprint

Price information

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Delivery Time

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Applications/Examples of results

Ideal for semiconductor testing in fabless, IDM, and test houses.

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Model number overview
3650-EX SoC/Analog Test System

News about this product(2)

We will be exhibiting at the 2013 Taiwan International Lighting Show.

  • Campaign

Our booth will be exhibiting at the 2013 Taiwan International Writing Fair held in Taiwan. Please feel free to stop by if you are nearby. Location: Taipei, Taiwan Dates: March 26 (Tuesday) - March 28 (Thursday) 9:00 AM - 6:00 PM March 29 (Friday) 9:00 AM - 3:00 PM Venue: Taipei World Trade Center Exhibition Hall 1 (5, Hsin-yi Road, Sec. 5, Taipei 110-11, Taiwan) Taipei World Trade Center Exhibition Hall 1 (5 Hsin-yi Road, Section 5, Taipei City) Booth Number: C0510 2013 Taiwan International Writing Fair Homepage: http://www.tils.com.tw/ja_JP/index.html

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We will be exhibiting at SEMICON China 2013.

  • Campaign

Our booth will be exhibiting at SEMICON China 2013 in Shanghai, China. Please feel free to stop by if you are nearby. Location: Shanghai, China Date: March 19 (Tuesday) - March 21 (Thursday) Venue: Shanghai New International Expo Center Booth Number: W2-2269 SEMICON China Homepage: http://www.semiconchina.org/

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クロマジャパン

クロマジャパン

Testing, Analysis and Measurement

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Founded in 1984 in Taiwan, Chroma ATE Inc. is a global supplier leading the field of test & automation turnkey solutions, including high-precision testing and electronic measuring instruments, automatic inspection systems, and intelligent manufacturing systems, with the "Chroma" brand being deployed worldwide. Chroma offers excellent testing instruments and inspection systems in areas such as ICT, clean technology, smart factories, electric vehicles (EV), LED and laser diodes, solar power generation, batteries, semiconductors and ICs, optical communications, flat panel display drivers, monitor, television, and display signal generators, power electronics, passive components, electrical safety testing, thermoelectric measurement, automatic optical inspection, and intelligent manufacturing systems. Chroma Japan was established as the Japanese subsidiary of Chroma ATE Inc. to localize and enhance after-sales service along with product sales. We strive daily to provide world-class products with meticulous support for our customers in Japan who require it.

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