Measurement device for the development of high-efficiency solar cells
The PV-2000 is a comprehensive measurement device for solar cell development that combines the technologies of Semilab and SDI. It can be equipped with various heads for developing high-efficiency solar cells, such as for passivation layer evaluation.
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basic information
Measurement Functions - QSS-u-pCD (Lifetime measurement for each injection level) - Ultimate-SPV (Diffusion length measurement up to 4 times the wafer thickness) - ALID (High-speed optical degradation measurement) - Non-contact CV measurement - Non-contact Suns-VOC measurement - JO mapping measurement (Emitter Saturation Current) - Sheet resistance measurement - LBIC (Reflectivity, IQE) - Resistivity measurement
Price information
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Applications/Examples of results
Measurement Functions - QSS-u-pCD (Lifetime measurement for each injection level) - Ultimate-SPV (Diffusion length measurement up to 4 times the wafer thickness) - ALID (High-speed optical degradation measurement) - Non-contact CV measurement - Non-contact Suns-VOC measurement - JO mapping measurement (Emitter Saturation Current) - Sheet resistance measurement - LBIC (Reflectivity, IQE) - Resistivity measurement
Company information
Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.
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