Automatic Film Measurement Device "DLC Analyzer"

Accurately measure material properties such as film thickness and optical constants of thin films! Automatic thin film measurement device.

The "DLC Analyzer" allows for sample measurements ranging from single-layer films to multi-layer films with thicknesses from 1nm to 15μm, all with the ease of a push button. By covering a wavelength range of 450nm to 1000nm for data acquisition, it accurately measures material properties of thin films, such as film thickness and optical constants (refractive index, extinction coefficient). It is used as a standard testing machine in the classification by the NDF DLC Standardization Committee, which promotes the international standardization of DLC. 【Features】 ■ Accurately measures material properties such as film thickness and optical constants of thin films ■ Provides custom-made DLC standard samples ■ Used as a standard testing machine in the classification by the DLC Standardization Committee ■ Equipped with a standard spot size of at least 25×60μm ■ Determines measurement positions while confirming the spot location on the sample using MyAutoView *For more details, please refer to the PDF document or feel free to contact us.

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