Measurement of contact resistance while passing a large current. Measurement of heat generation of the probe and work during large current flow. Etc. can be performed.
What happens at the contact point during electrical contact measurement? What is the temperature when a large current is flowing? How much contact resistance is there in a high-temperature environment? We have made the concerns in measurement visible. Additionally, by combining several types of devices, it is also possible to approach measurements that are closer to actual conditions. Visits are also possible. For more details, please contact us through our website. http://www.sankei-engineering.com/
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【Various Measurement Contents】 ○ Measurement of resistance values during large current conduction ○ Measurement of heat generation during large current conduction ○ Measurement of resistance values in high-temperature environments (large current conduction possible) ○ Measurement of heat generation due to large current conduction in high-temperature environments ○ Measurement of contact resistance of electronic components ○ Durability testing of contact probes ○ Surface observation and more By combining devices and measuring instruments, other experiments can also be conducted. Additionally, various electrical contact measurement experiments using contact probes are possible. If you have any requests or inquiries, please feel free to let us know. We can also obtain basic data at our company, so please consult with us. ● For more details, please contact us through our website. Sankei Engineering Co., Ltd. website here↓ http://www.sankei-engineering.com/
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Contact probes are indispensable for the manufacturing of all precision instruments. Since entering this field 50 years ago, Sankei Engineering has actively worked on "technologies and products that cannot be imitated by other companies," accumulating unique know-how. Particularly in specialized areas that require high precision, such as measurements under high current, high voltage, and extreme temperatures, it is difficult to meet the demands without our outer spring type (integrated) contact probes, establishing a significant competitive advantage in this market.
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