Ultra-high-speed spectral measurement device Spectrometer DTSP-150

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last updated：Feb 13, 2020

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Compact with low noise! Back-illuminated Peltier cooling FFT-CCD used.

A spectrometer is a device that separates light into a spectrum (light by wavelength) and measures the intensity of light at each wavelength. By shining light on thin films and spectrally analyzing the reflected light, the components of the thin films can be measured. Applications include thickness management of films on various discs, measurement of resist films and SiO on semiconductor wafers, management of coating thickness on optical lenses, thickness measurement of various films, inline measurement of alignment films and ITO films on glass substrates, and color measurement of LEDs. There are also established achievements in constructing multi-channel systems for inline use. For more details, please contact us.

Related Link - http://www.disctech.co.jp/dtsp-150-1.htm

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basic information

【Features】 ○ Responds to reading signals of 10 electronics and minute light ○ Uses electronic cooling FFT-CCD, resulting in low noise and compact size ○ Extremely high sensitivity enables fast measurements such as online measurements ○ Color measurement software and film thickness analysis software available ○ Compatible with a total system of hardware, software, and mechanisms using a spectral unit ○ Interfaces available in USB type, E-ther type, and SCSI type ○ External output terminal for LED emission included ● For more details, please contact us.

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Applications/Examples of results

【Application Examples】 - Thickness management of films on various disks - Resist films on semiconductor wafers, SiO - Coating thickness management of optical lenses - Thickness measurement of various films - Inline measurement of alignment films and ITO films on glass substrates - Color measurement of LEDs - We also have experience in building multi-channel systems for inline use. ● For more details, please contact us.