PIND test device for detecting particle impact noise
PIND test device - microparticle impact noise detection device
Detects foreign particles in devices. Capable of testing over 2000 parts per hour.
You can visually identify spikes appearing on the oscilloscope's bright line. Auditory discrimination due to changes in sound quality from the speaker is also possible, as well as identification through the illumination of the FAIL lamp triggered by the adjusted detection level. It complies with the standard tests MIL-STD-883, MIL-STD-750, and MIL-STD-220. For more details, please download the catalog or contact us.
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basic information
【Specifications】 ○Vibration Frequency: Sine wave 27–265Hz Acceleration: 0–20G peak Exciter: 22.7kgf, 19mm p-p, 190cm/sec Amplifier: 240W Maximum load weight: 200 grams at 20G peak ○Shock Duration: Sine wave less than 100μsec Acceleration: 1000±200G, adjustable from 0 to 2000G Application: Auto or Manual Axis: Same as vibration ○Detector Ultrasonic transducer: Sensitivity -77.5±3dB Amplifier: 60±2dB @ 155±5KHz, below 10mV peak noise Threshold detection: 2 preset detection levels, 0 to infinity ○Controller Type: Digital multiplex transmission Continuous shock: 1 to 4 times in succession, 16 programs Test time: 16 programs Auto start: 9 programs System clock: Adjustable from 0.25 to 4Hz ● For more details, please download the catalog or contact us.
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