Defect detection of semiconductor components "Centrifugal Constant Acceleration Testing Device"
Centrifugal constant acceleration testing device
High acceleration testing (up to 34,000 rpm, 100,000 G). Temperature control within the chamber is possible. Complies with standards such as JIS, MIL, and IEC.
The "Centrifugal Constant Acceleration Testing Device" detects structural and mechanical defects in semiconductor components. 【Features】 - Uses steel double-ring copper and slide doors for rotor chamber protection - Employs non-contact eddy current sensors for detecting unbalance in rotating bodies - Incorporates an over-speed protection mechanism that stops the motor if the rotation speed exceeds 20% of the set value - Utilizes a vibration switch for detecting abnormal vibrations in the main unit - Includes a vacuum monitoring mechanism for checking vacuum levels For more details, please download the catalog or contact us.
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【Specifications】 ○CA-883 Maximum centrifugal acceleration value: 100,000G (varies by rotor) Test directions: 6 directions of X1, X2, Y1, Y2, Z1, Z2 Maximum rotation speed: 34,000 rpm Main motor: DC compound gear motor Safety devices: Detects vibrations, rotor imbalance, overspeed, and vacuum anomalies, reporting the abnormal location with an over-travel display and alarm buzzer, and the device automatically decelerates and stops. ○PCA-883 Maximum centrifugal acceleration value: 30,000G Test direction: One direction of Y1 Maximum rotation speed: 16,000 rpm Main motor: AC high-frequency induction motor Safety devices: Detects vibrations, rotor imbalance, rotor setup errors, vacuum anomalies, motor control anomalies, and emergency stops, reporting the abnormal location with an over-travel display and alarm buzzer, and the device automatically decelerates and stops. ●For more details, please download the catalog or contact us.
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【Purpose】 ○ Reliability and quality control etc. ● For more details, please contact us.
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