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  1. Home
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  3. Measurement and Analysis
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  5. Flaw detection testing
  6. Impact Ultrasonic Flaw Detector A1220 MONOLITH

Impact Ultrasonic Flaw Detector A1220 MONOLITH

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last updated:Apr 01, 2025

日本マテック
日本マテック
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Low-frequency transverse waves propagate freely over 1 meter without a contact medium!

The flaw detector A1220 consists of a main unit (screen, keyboard) and an antenna array (AA) arranged with 24 matrix DPCs (6x4). The AA elements of the device enable dry contact ultrasonic transmission and reception without coupling agents. Each AA element is equipped with springs, allowing it to conform to curved or rough surfaces. An optional two-probe method is also available. 【Features】 ○ Pulse-echo method ○ No coupling agent required ○ A-Scan and B-Scan display of echo signals ○ Detection of weak signals from noise ○ Automatic or manual defect classification or thickness determination For more details, please contact us or download the catalog.

    Flaw detection testing
02_mono.jpg

Impact Ultrasonic Flaw Detector A1220 MONOLITH

02_mono.jpg
02_mono.jpg
  • Related Link - http://www.matech.co.jp/html/acs/a1220.html

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basic information

【Features】 ○ Easy-to-use menu-based setting adjustments ○ Data memory for A-Scan 60 screens, BAND, MAP ○ Screen with backlight ○ Data transfer to external computer via infrared communication ○ 3D display of internal structure on the external computer's screen ● For more details, please contact us or download the catalog.

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【Scope of Use】 ○ Concrete manufacturing plants and pouring sites ○ Nuclear power plants ○ Railways ○ Runway maintenance ○ Bridge and tunnel maintenance ○ Building structures ● For more details, please contact us or download the catalog.

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Impact Ultrasonic Flaw Detector A1220 MONOLITH

Impact Ultrasonic Flaw Detector A1220 MONOLITH

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日本マテック

日本マテック

Testing, Analysis and Measurement

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We prepare a wide range of inspection methods and devices, providing suitable inspection methods. To achieve inspection objectives, the selection of optimal means is the first necessity. Our company offers various inspection methods such as UT, ET, MT, PT, RFT, RT, AT, LUT, etc., allowing us to respond broadly to various demands. Furthermore, to meet diverse requirements, we constantly seek the latest technology and make efforts in information gathering and product development to equip ourselves with the most advanced devices from around the world. We assist with all aspects of inspection implementation. Another significant feature of our company is that we do not limit ourselves to merely selling hardware; we independently develop applications, starting with the selection of suitable main devices/probes for the purpose, providing advice on inspection processes, and offering software that includes the development and guidance of inspection methods. Through package sales, we strive to enhance our user support system and technical capabilities to achieve objectives quickly and efficiently.

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