Don't miss the instantaneous fluctuations that can happen at any moment! Unprecedented high-speed and long-duration measurement.
You can continuously monitor high-speed measurements at 100μs without limits. You never know when it will occur... The peak fluctuates for just a moment... However, conventional high-speed spectrometers have limitations due to data loss and the short monitoring time. We have responded to such needs. There is no other multi-channel spectrometer that can capture data at this speed without loss. Moreover, we offer very convenient features for process monitoring: - Signal output function - Playback function after process completion - Real-time background removal of plasma emission
Inquire About This Product
basic information
■Device Specifications - Multi-channel (simultaneous multi-wavelength) spectroscopic measurement - Measurement wavelength range: 200nm to 950nm - Wavelength resolution: 3nm or less - Exposure time: 100μs to 2ms ■System Specifications - Single-shot wavelength graph - Specified wavelength timeline graph - Two-wavelength ratio calculation - Signal output function (endpoint function) - Data playback function - Real-time background removal (partial baseline method)
Price range
Delivery Time
※It varies depending on the time, so please feel free to contact us.
Applications/Examples of results
Etching monitoring Film deposition monitoring for semiconductors, etc. Welding monitoring Research applications in bio-science
catalog（1）
Download All Catalogs
Company information
Based on our extensive experience in device control, production line monitoring, and the development of analysis and measurement systems, we are engaged in software development for solar cell characteristic evaluation measurements, EL image analysis, surface analysis, plasma emission monitoring, and more. We have expertise in evaluation for solar cells, allowing us to propose optimal systems for new entrants in the industry. Additionally, our spectral analysis software can be applied across various fields, including semiconductors, medical, and food industries. We are flexible in accommodating customizations, so please feel free to consult with us. Our clients include major manufacturers both domestically and internationally, public research institutions, and government agencies, and we have received feedback from users stating that our software is "the easiest to use so far." We have also succeeded in systematizing analyses that were deemed "impossible to systematize," excelling in high-difficulty analysis and calculations, with proven results in high-precision and high-speed measurements for the aerospace industry, as well as defense applications. We are also actively responsive to bundled software for devices, tie-up sales, and collaborative development with research institutions.
![[Case Study] Quantification of Surface Morphology of ZnO Thin Film with Double Texture](https://image.mono.ipros.com/public/product/image/5ad/2000148436/IPROS8668286523198815032.png?w=280&h=280)
