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last updated：Feb 10, 2016

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High-resolution secondary ion mass spectrometer

NanoSIMS 50 is a SIMS developed for ultra-trace analysis and isotope analysis of micro-regions. 【Features】 ○ Ultra-high sensitivity allows for analysis of small areas ○ Simultaneous analysis of 5 elements (5 types of ions) enables perfect isotope ratio and imaging analysis of the same analysis area For more details, please contact us or download the catalog.

Related Link - http://www.elminet.co.jp/

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【Features】 ○ Element imaging analysis and isotope imaging analysis can be performed with a spatial resolution of 50nm. ○ High-sensitivity analysis is possible. ○ Analysis can be performed with high mass resolution. ○ Simultaneous analysis of 5 elements is possible. ● For more details, please contact us or download the catalog.