It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.
In the development aimed at enhancing the performance of CIGS thin-film solar cells, the optimization of the film formation process conditions for the light-absorbing layer is necessary, and controlling the compositional distribution of the CIGS composition has become important. This document presents cases where the composition of the deposited CIGS thin film was quantitatively analyzed with high precision using ICP-MS, evaluated for depth concentration distribution using SIMS, and assessed for in-plane concentration distribution on the substrate using XRF. Measurement methods: SIMS, ICP-MS, XRF, etching Product field: Solar cells Analysis objectives: Composition evaluation, identification, compositional distribution assessment, film thickness evaluation, product investigation For more details, please download the materials or contact us.
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For more details, please download the materials or contact us.
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Analysis of solar cells.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!