Capable of evaluating the composition of the main elemental components of compound semiconductors in the depth direction.
Generally, in SIMS, the quantification of major elements with concentrations exceeding a certain percentage is considered to be low. However, by using the M Cs+ (M: target element) detection mode with Cs+ as the primary ion, it is possible to determine the compositional distribution of major elements in the depth direction. An example of depth compositional evaluation for Al and Ga in AlGaAs is presented.
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basic information
For detailed data, please refer to the catalog.
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Applications/Examples of results
Analysis of lighting and optical devices.
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Download All Catalogs![[Analysis Case] Composition Analysis of Compound Semiconductors by SIMS_C0288](https://image.mono.ipros.com/public/catalog/image/01/1cb/334735/IPROS612723902110858376.jpg?w=120&h=170)
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!