At an unprecedented price of 500,000 yen, it can detect and measure spectra in the wavelength range of 900 to 1700 nm! A new era of near-infrared spectrometer sensors.
The compact NIR spectrometer sensor NIR Meter is a small NIR spectroscopic sensor that measures spectral spectra in the near-infrared range of 900 to 1700 nm using DLP(R) technology from the American company T.I. In addition to a window for direct sample light entry, it also allows for fiber optic connection by attaching the standard SMA attachment. The standard software enables various measurements such as relative intensity [count], reflectance [%], transmittance [%], and absorbance [Abs], and offers comprehensive data processing including second derivatives, smoothing, and wavelength interpolation. Additionally, lamps for reflection measurement are built into both sides of the light receiving window, allowing reflection measurements to be conducted with the spectrometer alone without the need for an external light source. 【Features】 ■ Achieves unprecedented low prices using DLP(R) technology ■ Near-infrared range of 900 to 1700 nm ■ Utilizes InGaAs from Hamamatsu Photonics *Demo units are currently available for loan! For more details, please download the catalog or contact us.
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**Features** - Achieves unprecedented low prices using DLP(R) technology - Near-infrared range of 900–1700nm - Utilizes InGaAs from Hamamatsu Photonics - Low noise with a S/N ratio of 6000:1 - Powered by USB bus power - Built-in lamp for reflection measurement - Switchable input port with Sapphire window/SMA connector - Built-in 885nm long-pass filter for stray light removal **Applications** - Diffuse reflection measurement - Various near-infrared spectral measurements via optical fiber Additionally, there is a separate model available for spectral sensors targeting 1350–2490nm.
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For more details, please download the catalog or contact us.
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Mainly utilizing optical measurement, devices for various non-destructive, non-contact measurements and semiconductor manufacturing process inspections (such as film thickness measurement and plasma monitoring) are developed for both online and offline use.
