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  6. Xenon Continuous Light Source Atomic Absorption Analysis Device contrAA 800 Series

Xenon Continuous Light Source Atomic Absorption Analysis Device contrAA 800 Series

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contrAA 800 series

last updated:Nov 18, 2024

アナリティクイエナジャパン
アナリティクイエナジャパン
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A single lamp can measure all elements! An innovative atomic absorption analysis device that visually confirms the effects of proximity lines.

This is a new atomic absorption analysis device that overturns the conventional concept of atomic absorption analysis equipment, developed for the first time in the world by Analytik Jena using the xenon continuous light source background correction method. It covers all wavelength ranges used in atomic absorption analysis with a single light source, and in frame measurements, it allows for a reduction in measurement time through sequential measurements. The high-resolution optical system enables visual confirmation and separation of nearby lines. The high-precision background correction function, unaffected by nearby line interference, has significantly improved the accuracy of measurement results. 【Features】 ■ Equipped with a high-resolution echelle spectrometer (0.002nm/200nm) ■ Multi-element sequential rapid measurement with xenon continuous light source/CCD detection ■ Expansion of the measurement concentration linear range through multi-wavelength measurement of the same element and dynamic mode ■ Enhanced analytical capabilities by utilizing not only atomic absorption lines but also molecular absorption lines ■ Detailed data analysis through 2D and 3D data display ■ Direct analysis of solid samples is possible (optional: solid sampler) ■ High reliability of data and excellent automation efficiency with an auto-sampler ■ Analytik Jena offers a unique 10-year warranty on the optical system.

    Analytical Equipment and Devices
contrAA_800D_AS_FD_Brandname

Xenon Continuous Light Source Atomic Absorption Analysis Device contrAA 800 Series

contrAA_800D_AS_FD_Brandname フレーム.jpg
contrAA_800D_AS_FD_Brandname フレーム.jpg contrAA800_550_550_2.jpg contrAA800_550_550_3.jpg contrAA800_550_550_4.jpg contrAA800_550_550_5.jpg contrAA800_550_550_6.jpg contrAA800_550_550_7.jpg contrAA800_550_550_8.jpg contrAA800_550_550_9.jpg
  • contrAA 800 Series - High-Resolution Continuous Light Source Atomic Absorption Analysis Device
  • Special site - Product/service details - https://pr.mono.ipros.com/analytik-jena/product/

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basic information

■Lamp: Xenon lamp ■Wavelength range: 185~900 nm ■Background correction: Xenon continuous light source correction ■Detector: Semiconductor detector (CCD)

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Model number overview
contrAA 800 F Dedicated to frame use. It also supports hydride generation methods.
contrAA 800 G Dedicated to furnace use. It is also possible to connect a solid sampler to directly measure solid samples.
contrAA 800 D Dual-purpose for frame and furnace. The frame and furnace automatically switch for a space-saving design. With additional options, hydride generation methods and direct furnace measurement of solid samples are also possible.

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Analysis Machine Comprehensive Catalog

Analysis Machine Comprehensive Catalog

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High-resolution continuous light source atomic absorption analysis device contrAA800 series for precise and efficient plating analysis.

High-resolution continuous light source atomic absorption analysis device contrAA800 series for precise and efficient plating analysis.

TECHNICAL
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Frame Atomic Absorption Analysis_Operational Efficiency

Frame Atomic Absorption Analysis_Operational Efficiency

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Analysis Machine Seminar to be held on June 12 and 19.

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To provide users with a deeper understanding of the analytical devices from Analytik Jena, which are highly regarded for their high precision and sensitivity, we will hold an analytical device seminar. In this seminar, you will have the opportunity to see the analytical devices in operation while we introduce the functions and features of each device. You will be able to confirm points that are difficult to check in catalogs or at exhibitions through the actual equipment. Date and Time / Devices: - June 12, 13:30–15:00: ICP Optical Emission Spectrometer PlasmaQuant 9200 Series - June 12, 15:30–17:00: Xenon Continuous Light Source Atomic Absorption Spectrometer contrAA Series - June 19, 13:30–15:00: Total Organic Carbon Analyzer (TOC Analyzer) multi N/C Series - June 19, 15:30–17:00: Combustion Sample Preparation System (Halogen/Sulfur Analysis) ICprep Series *The venue will open 30 minutes before the start.

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アナリティクイエナジャパン

アナリティクイエナジャパン

Testing, Analysis and Measurement

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Analytik Jena is a leading provider of analytical measuring technology, instruments in the field of molecular biology, and liquid handling and lab automation technologies. The company is present for its customers in many industries, as well as over 100 countries. Analytik Jena’s analysis instruments are used whenever precision and reliability are required. Whether it is water analysis, environmental monitoring, health care, or quality control, the company’s devices guarantee that strict standards have been maintained. Services, as well as device-specific consumables and disposables, such as plastic articles, complete the extensive range of products.

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