You can evaluate the causes and total amount of organic contamination in the manufacturing process.
It is known that the adsorption of organic substances on the wafer surface can lead to various issues, such as the degradation of gate oxide film breakdown voltage. Therefore, as the miniaturization and high integration of semiconductor devices progress, it has become increasingly important to monitor not only inorganic substances but also trace amounts of organic substances. Here, we present a case where silicon wafers were stored in two types of wafer cases, and the organic contamination components adhered to the entire wafer surface were concentrated using a wafer analyzer and evaluated using GC/MS.
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Analysis of LSI, memory, and power devices.
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Download All Catalogs![[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases_C0461](https://image.mono.ipros.com/public/catalog/image/01/84f/369266/IPROS2891444313489068212.jpg?w=120&h=170)
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
![[Analysis Case] Breakdown Observation of 600V Rated SiC Diode](https://image.mono.ipros.com/public/product/image/65a/2000026081/IPROS3596296975584068307.jpg?w=280&h=280)
