Scanning Electron Microscope (SEM) ■Industry: Automotive (Prototype) / Semiconductor / Robotics
The cutting edge surface of single crystal diamond chips was observed using a scanning electron microscope (SEM). The cutting edge surface of PCD (polycrystalline diamond) was also observed and compared. The differences in the fine surface roughness were clearly confirmed. How this difference affects the machining process is yet to be determined. *For more details, please refer to the PDF document or feel free to contact us.*
Inquire About This Product
basic information
For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（2）
Download All Catalogs
Company information
Reliable quality is a given. We are making that given even more of a given. By thoroughly managing quality in all processes from order receipt, design, processing, assembly, inspection, to delivery, we create reliable quality that can be adopted with confidence. In 2002, we obtained the ISO 9001:2000 certification from TÜV SÜD Japan, which is highly regarded internationally. We see this as a milestone and continue to strive to make reliable quality even more of a standard.
![[Market Report] World Market for Scanning Electron Microscopes](https://image.mono.ipros.com/public/product/image/860/2000959173/IPROS98041463009362053145.jpeg?w=280&h=280)
![[Analysis Case] Observation of Surface Shape of Non-Woven Fabric Masks Before and After Disinfection](https://image.mono.ipros.com/public/product/image/920/2000839654/IPROS19598774769765477562.png?w=280&h=280)
