This is a list of devices used for analysis, evaluation, and testing services at AITES.
Aites is a solution-oriented company that sincerely addresses customer challenges in cutting-edge industrial fields. We utilize various owned devices to provide optimal solutions. ■ Product Analysis / Defect Analysis / Failure Analysis Morphological observation, electrical characteristic measurement, defect analysis, failure analysis, sample processing ■ Reliability Evaluation Testing Reliability evaluation testing, ESD/latch-up testing, strength testing, optical characteristics ■ Physical Analysis / Chemical Analysis Physical analysis, surface analysis, chemical analysis
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basic information
■Morphological Observation ・Laser Microscope ・SAM/SAT ・X-ray Fluoroscopy Device ・SEM/FE-SEM ■Electrical Characteristic Measurement ・Curve Tracer ・Power Device Analyzer ■Failure Analysis ・EMS/IR-OBIRCH ・EBIC ■Sample Processing ・FIB ・Rotary Polishing Table ・Ion Polisher ・Oblique Cutting Device ■Reliability Evaluation Testing ・Liquid Chamber/Gas Chamber Thermal Shock Test Device ・Constant Temperature and Humidity Chamber/Bias Test ・Constant Temperature Chamber ・HAST/PCT/PCBT ・In-Situ Continuous Measurement Device ■ESD/Latch-Up Testing ・ESD Tester (HBM/MM/CDM/Latch-Up) ■Optical Properties ・Total Flux/Light Intensity Measurement System ■Physical Analysis ・SEM+EDX/EPMA ・FE-TEM+EDS/EELS ・STEM+EDS ■Surface Analysis ・AES ・XPS ・μFT-IR ・AFM ■Chemical Analysis ・GC-MS (HS/Thermal Decomposition) ・LC-MS ・Microscopic Raman Spectrometer
Price information
We will provide individual estimates based on the details of your inquiry.
Delivery Time
※It varies depending on the case (there is a setting for urgent response).
Applications/Examples of results
Analysis and Evaluation of Electronic Components - Contract Services ■ Physical Analysis / Surface Analysis / Chemical Analysis ■ Product Analysis / Defect Analysis / Failure Analysis ■ Reliability Testing / ESD / Latch-Up Testing / Characteristic Evaluation
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.