We provide testing services to evaluate the resistance to ESD (electrostatic discharge), which is important for the reliability of semiconductor products and electronic components that include them.
■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and problem resolution.
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basic information
■ HBM Test (C=100pF, R=1.5kΩ) ±5 to ±4500V (Step: 5V) ■ MM Test (C=200pF, R=0Ω) ±5 to ±2000V (Step: 5V) ■ Supports various application conditions such as single application, step-up application, and pin combination application. ■ The breakdown judgment method corresponds to four types: evaluation of protection diode characteristics, IiL/IiH characteristic evaluation, VoL/VoH characteristic evaluation, and evaluation of power pin characteristics. ■ Also supports arrangements for sockets, dedicated boards, and the production of test boards.
Price information
We will provide a quotation based on the examination conditions.
Delivery Time
※It will vary depending on the test conditions and quantity.
Applications/Examples of results
ESDA JEDEC JEITA AEC IEC Various standard tests
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.