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  6. Overseas Manufactured Parts and Products Evaluation Service

Overseas Manufactured Parts and Products Evaluation Service

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last updated:Jun 26, 2025

アイテス
アイテス
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Some overseas manufactured parts and products may have quality issues. We provide quality evaluation services for reliability testing and assessment for these.

Some overseas manufactured parts and products may initially operate without issues, but can cause malfunctions and lead to failures and breakdowns in a short period of time. Before adopting or using overseas products, please consider AIT's parts and product quality evaluation services. ■ Examples of overseas parts evaluation - Reliability evaluation during the parts procurement and selection stage - Comparative evaluation between parts and product manufacturers - Reliability evaluation when replacing current parts with alternative parts (cost reduction) ■ Examples of applicable parts - Active components (transistors, diodes, thyristors, etc.) - Passive components (capacitors, resistors, etc.) - LCDs - Circuit boards - Power supplies - Etc.

    Testing Equipment and DevicesOther inspection equipment and devicesContract Inspection
海外製部品・製品評価サービス.JPG

Overseas Manufactured Parts and Products Evaluation Service

海外製部品・製品評価サービス.JPG
海外製部品・製品評価サービス.JPG
  • Overseas Manufactured Parts and Products Quality Evaluation Service
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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■Reliability Testing ・Temperature Cycle Test ・Cold Heat Shock Test ・High Temperature High Humidity Bias Test ・High Temperature Storage Test ・Highly Accelerated Life Test ・Preconditioning ・Hot Oil Test ・In-situ Continuous Measurement ・Ion Migration Test ・Electromigration Test ■Evaluation Testing ・Bond Strength Test  Pull/Shear Test ・Mechanical Strength Test  Vibration/Shock Test, Drop Test, Compressive Strength/Shear Strength ・ESD/Latch Up/CDM Test ・Solder Wetting Test ・Electrical Characteristic Measurement ・Salt Spray Test ・X-ray Transmission Observation ・SAT (Ultrasonic Microscope) Observation

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Applications/Examples of results

- Active components (transistors, diodes, thyristors, etc.) - Passive components (capacitors, resistors, etc.) - LCD - Circuit board - Power supply

catalog(15)

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In-Situ Continuous Measurement Reliability Evaluation Testing Service

In-Situ Continuous Measurement Reliability Evaluation Testing Service

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Total solution service for FPD

Total solution service for FPD

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Overseas parts and products evaluation service

Overseas parts and products evaluation service

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Analysis of electronic components and materials using TEM.

Analysis of electronic components and materials using TEM.

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Introduction to Reliability Assurance Services

Introduction to Reliability Assurance Services

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Aites Device List

Aites Device List

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Total support service for LED.

Total support service for LED.

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Total solution service for power devices

Total solution service for power devices

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Total solutions for the reliability of semiconductor products.

Total solutions for the reliability of semiconductor products.

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Total Quality Technology Solutions

Total Quality Technology Solutions

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Authenticity investigation (comparative observation)

Authenticity investigation (comparative observation)

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Analysis of defects in overseas manufactured displays

Analysis of defects in overseas manufactured displays

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Analysis of good quality overseas manufactured LCD displays

Analysis of good quality overseas manufactured LCD displays

TECHNICAL
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Observation of conductive particle shapes in COG implementation

Observation of conductive particle shapes in COG implementation

TECHNICAL
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Cryogenic ion milling cross-section processing example (rubber products)

Cryogenic ion milling cross-section processing example (rubber products)

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Cryogenic ion milling cross-section processing example (rubber products)

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We will introduce a case where cross-sections were created and observed by method regarding the adhesive parts of the tires of pull-back cars. When conducting SEM observations of the created cross-sections, fillers present inside the rubber were confirmed. It was found that the dispersion state of the fillers and the condition of the adhesive interface were not clear with fracture by liquid nitrogen or mechanical polishing. In contrast, the cross-sections created by cryo ion milling allow for clear observation of the dispersion state of the fillers contained within the rubber and the condition of the adhesive interface with the plastic substrate.

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Observation of Conductive Particle Shape in COG Implementation

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We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) for conductivity is deposited on its surface. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and connection status, cross-sectional observations were conducted, revealing that the particle deformation was at a "medium" level, indicating an appropriate degree of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related defects.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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