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  4. Observation of Conductive Particle Shape in COG Implementation
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  • Apr 11, 2024
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Apr 11, 2024

Observation of Conductive Particle Shape in COG Implementation

アイテス アイテス
We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) for conductivity is deposited on its surface. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and connection status, cross-sectional observations were conducted, revealing that the particle deformation was at a "medium" level, indicating an appropriate degree of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related defects.
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Observation of Conductive Particle Shapes in COG Implementation

Observing the conductive particles from the planar direction and the cross-sectional direction! A case study confirming the degree of deformation.

We will introduce the observation of the shape of conductive particles in COG implementation. ICs and liquid crystal panels are implemented using the COG method with ACF (anisotropic conductive film). A resin ball is used as the core, and a metal layer (such as nickel or gold) is deposited on its surface for conductivity. During connection, the particles deform appropriately to electrically connect the IC and the panel. To confirm the degree of particle deformation and the connection state, cross-sectional observations were conducted, revealing that the particle deformation amount was "medium," indicating an appropriate level of deformation. By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. Please feel free to contact us for any inquiries regarding panel-related defects. [Summary] - In implemented ICs, slight "warping" or "tilting" can cause differences in particle deformation between the edges and the center, potentially leading to display defects. - By examining the deformation of conductive particles from both the planar and cross-sectional directions, we can explore the correlation with display defects. *For more details, please refer to the PDF document or feel free to contact us.

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Total solutions for the reliability of semiconductor products.

Support for the difficulties in the development and evaluation of components, devices, and materials related to semiconductor products.

【Testing, Evaluation, Analysis】  ●Reliability Testing   ■Temperature Cycle Testing   ■Thermal Shock Testing   ■High-Temperature Storage Testing   ■Highly Accelerated Life Testing   ■Preconditioning   ■Hot Oil Testing   ■In-situ Continuous Measurement   ■Ion Migration Testing   ■Electromigration Testing   ■Test Consulting  ●Evaluation Testing   ■Bond Strength Testing: Pull/Shear Testing   ■Mechanical Strength Testing: Vibration/Shock/Fall Testing/Compression Strength/Shear Strength   ■ESD/Latch Up/CDM Testing   ■Electrical Characteristic Measurement   ■Salt Spray Testing  ●Analysis   ■X-ray Transmission Observation   ■Ultrasonic Microscope Observation   ■Luminescence Analysis (EMS/IR-OBIRCH)   ■Scanning Electron Microscope (SEM)   ■Transmission Electron Microscope (TEM)   ■Surface Contamination Analysis (TOF-SIMS)   ■Foreign Substance Analysis (FT-IR)

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Overseas Manufactured Parts and Products Evaluation Service

Some overseas manufactured parts and products may have quality issues. We provide quality evaluation services for reliability testing and assessment for these.

Some overseas manufactured parts and products may initially operate without issues, but can cause malfunctions and lead to failures and breakdowns in a short period of time. Before adopting or using overseas products, please consider AIT's parts and product quality evaluation services. ■ Examples of overseas parts evaluation - Reliability evaluation during the parts procurement and selection stage - Comparative evaluation between parts and product manufacturers - Reliability evaluation when replacing current parts with alternative parts (cost reduction) ■ Examples of applicable parts - Active components (transistors, diodes, thyristors, etc.) - Passive components (capacitors, resistors, etc.) - LCDs - Circuit boards - Power supplies - Etc.

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Analysis of good LCD panels

Check the quality status of LCD components and products! We will analyze the structures of the LCD panels using our analytical methods and expertise!

At AITES, we conduct quality analysis of LCD components/products, confirming the quality status of products based on our expertise in LCDs. The target panels include SEG-LCD, AM-LCD (a-Si TFT / LTPS TFT), OLED for automotive, monitors, mobile devices, and more. We perform quality analysis using our analytical methods on the various structures of liquid crystal panels. 【Analysis Content (Excerpt)】 <Reliability/Lighting Tests> ■ Classification - Reliability Tests - Lighting Inspections ■ Analytical Methods - Oven Drive Tests - Visual Inspection *For more details, please refer to the PDF document or feel free to contact us.

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Defective analysis of liquid crystal panels

We will narrow down the defective areas through lighting confirmation, panel disassembly, and optical microscope observation!

We provide a defect diagnosis menu for LCD panels, from confirming defects to identifying causes and conducting detailed failure analysis. In the initial analysis, we perform a status check (lighting test), panel disassembly, and optical microscope observation, tailored to the defect symptoms. In the detailed analysis, based on the diagnostic results from the initial analysis, we propose suitable methods such as surface analysis, cross-sectional analysis, and component analysis. It is also possible to speculate on the mechanisms of defect occurrence, including narrowing down the production processes that caused the defects. 【Analysis Content】 ■ Initial Analysis - Status check (lighting test), panel disassembly, optical microscope observation, conducted according to defect symptoms - Narrowing down from general areas such as cell panels and peripheral circuits to finer details ■ Detailed Analysis (additional analysis fees apply) - Based on the diagnostic results from the initial analysis, we propose suitable methods such as surface analysis, cross-sectional analysis, and component analysis - It is also possible to speculate on the mechanisms of defect occurrence, including narrowing down the production processes that caused the defects *For more details, please refer to the PDF document or feel free to contact us.

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Evaluation of TFT characteristics of liquid crystal panels

We can perform good product characteristic measurements for performance verification, as well as defective characteristic measurements and reliability evaluations!

Our company can perform good product characteristic measurements, defective characteristic measurements, and reliability evaluations for specific TFTs in liquid crystal panels. In the "Electrical characteristic measurement of TFTs at various temperatures," we can disassemble the monitor in display mode and measure the electrical characteristics of the pixel TFTs within the panel. In the "DC bias stress test," we apply an arbitrary DC bias to the Gate and Drain and measure the Vth shift when stress is applied to the TFT, conducting reliability verification. 【Features】 - Electrical characteristic measurements can be performed on the pixel TFTs within the panel. - Measurements can be conducted before and after annealing, under light exposure, heating, or cooling conditions. - From the measurement results, indicators such as Ion, Ioff, Vth, and mobility can be calculated. - Verification of actual values in good product analysis and clarification of causes of defects can be performed. *For more details, please refer to the PDF document or feel free to contact us.

  • LCD display

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LCD Panel Analysis Data Collection

If you're having trouble with LCD analysis, we at ITES are here to help you find a solution!

Are you struggling with LCD analysis? We, at ITES, are here to help you find a solution! Structural Analysis: We evaluate and report on potential issues related to characteristics and structure in FPD products and advanced technologies that are constantly evolving. Defect Analysis: We approach and investigate the causes of manufacturing defects in increasing overseas products through the shortest route. Reliability Testing: Based on your objectives and needs, we propose the optimal reliability testing methods and conditions using our extensive know-how. [Contents] ■ Did you know? What is a display? ■ Panel analysis case studies ■ Tell me more! ITES's LCD analysis ■ ITES can perform these types of analysis!

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Liquid Crystal Material Analysis

Rich equipment and expertise! We will elucidate the molecular structures of materials in general through chemical instrument analysis!

There are various types of liquid crystal materials, including low molecular weight compounds used in LCD panels and high molecular weight polymers used in printed circuit boards and electronic components. We would like to introduce examples of molecular structure analysis of these low molecular weight liquid crystals and high molecular weight liquid crystals (LCP). Our company, equipped with a wealth of devices and expertise, can handle reliability testing and analytical analysis of not only liquid crystal materials but also various other materials. Please feel free to consult us regarding the understanding of molecular structures of imported overseas products and materials, as well as troubleshooting issues. 【Case Study Details】 ■ Molecular structure analysis using FT-IR ■ Understanding of surface functional groups (molecular groups) through XPS (ESCA) analysis ■ Example of LCD liquid crystal material analysis using GC-MS *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of Liquid Crystal Display Materials

We propose analytical methods tailored to materials and purposes! Here are examples of chemical analysis for each component, such as liquid crystals and sealing materials.

Liquid crystal displays use various organic materials, including liquid crystals, sealing materials, encapsulants, and polarizers. Considering the material properties and degradation mechanisms of each component from a chemical perspective is important for product evaluation and defect analysis. This document presents examples of chemical analysis for the components of liquid crystal displays. [Examples of Chemical Analysis] ■FT-IR: Principal component analysis ■EDX: Elemental analysis ■GCMS: Liquid crystal component analysis ■HS-GCMS: Outgassing analysis (degradation analysis) and more *For more details, please refer to the PDF document or feel free to contact us.

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Surface observation of IC chips implemented on LCD panels.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

We will introduce a case where precision planar grinding was applied to remove glass substrate wiring and conductive particles, allowing for the observation of IC chip circuits with minimal damage. Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. There are many samples, like the one in this case, where detailed observation has become possible through planar grinding, as well as samples that can be processed using FIB or CP techniques. If you have any samples you are struggling with, please consult us. We accept requests for planar grinding only, as well as requests that include observation and analysis. [Overview] <Planar Grinding and Optical Observation> ■ Careful planar grinding was performed from the glass substrate side, removing material down to a few micrometers from the IC chip, enabling the observation of the circuit surface. ■ The IC chip circuit surface was clearly visible, and detailed observation at high magnification became possible. *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of defects in overseas manufactured displays.

Numerous achievements in defect analysis! Detailed analysis is possible, from confirming phenomena to hypothesizing the mechanisms of defect occurrence.

Our company conducts "defect analysis of overseas manufactured displays." We can perform detailed analysis from confirming the phenomenon, hypothesizing the defect occurrence mechanism, to narrowing down the production processes that caused the issue. We carry out lighting observations, panel disassembly, and optical microscope observations tailored to the defect symptoms. If it is necessary to narrow down the defective areas and conduct detailed analysis, we will propose appropriate methods. 【Examples of detailed analysis (partial)】 ■ Cross-sectional observation of wiring ■ Foreign object analysis ■ Liquid crystal component analysis ■ Electrical characteristic measurement *Additional costs will be incurred. *For more details, please refer to the PDF document or feel free to contact us.

  • LCD display

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Analysis of good quality overseas manufactured LCD displays

If any issues arise, detailed analysis will also be provided! A simplified analysis for customers considering the introduction of overseas LCDs.

We will introduce the analysis of good products for liquid crystal displays by Aites Co., Ltd. First, we conduct optical microscope observations focusing on the FPC, FOG, COG, and sealing materials in the state of the cell panel as part of the appearance observation. Next, we dismantle the cell panel to check the sealing materials, PI film, and TFT shape. If any defects are found during the good product analysis, we will propose additional analyses such as cross-sectional observation of wiring and foreign matter analysis to investigate the cause. Please feel free to consult us when needed. [Contents of Appearance Observation] ■ Are there any corrosion or foreign matter on the FPC wiring? ■ Is there any issue with the FOG bonding? ■ Is there any issue with the COG bonding? ■ Are there any breaks or defects in the sealing material? *For more details, please refer to the PDF document or feel free to contact us.

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Tokai Area Electrical and Electronic Web Technology Seminar Invitation

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NDT Mart & Rental Co., Ltd. began sales of its new dual thickness gauge, the 'CT3500', on January 28, 2026. ◆ Dual Thickness Gauge 'CT3500' The 'CT3500' is a portable thickness gauge that supports a wide range of coating measurements from thin films to thick films. It employs a dual measurement method using electromagnetic and eddy current techniques, allowing for automatic differentiation between ferrous and non-ferrous substrates to measure coating thickness. The measurement range accommodates up to 3,500μm, making it suitable for measuring coatings from general painting to heavy anti-corrosion coatings and linings. With a measurement speed of approximately 0.2 seconds, it allows for efficient measurements even in inspection tasks that require multiple points. It is not only compact and easy to carry, but its display features an inclined design that is easy to see from both above and the front. Additionally, the upside-down display and background color (white/black) switching enhance visibility in dark, narrow, and outdoor environments, making it suitable for quality control within factories as well as for equipment inspections and painting checks in outdoor settings. It can be utilized for a wide range of applications, including painting management of bridges and steel structures, anti-corrosion coating measurements for pipes and tanks, and quality control in manufacturing sites. The 'CT3500' is a high-performance portable thickness gauge that provides stable measurements from thin to thick films, designed for field use.

Mar 20, 2026

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