CT scanning system 'YXLON FF35 CT'

In November 2017, at this year's Exelon (YXLON) User Conference, Exelon International was able to meet the expectations of its users. This event, held in September, focused entirely on computed tomography for two full days. For the first time since the conference began, it was held not at Exelon but at the invitation of the Aria Group in Saint-Médard-en-Jalles, France. Eleven speakers from ten international companies and facilities provided very unique perspectives on CT, and over 85 participants exchanged opinions about their own CT experiences.

On November 15, 2017, in Hamburg, Germany: Exelon International, a member of the Swiss-listed company Comet Group, received the "Global Technology Award" for its multi-application high-resolution CT inspection device YXLON FF35CT, which inspects fine parts in the inspection department. This award was presented at Productronica, held in Munich, Germany, on November 14, 2017 (Tuesday). The German-made YXLON FF35 CT specializes in non-destructive testing of ultra-small electronic components. This device enables CT inspection of a wide range of components, allowing everything from wafer-level parts to finished products to be captured in a single image, and operators can easily zoom in to sub-micron levels of three-dimensional reconstruction. The three-dimensional reconstruction is performed instantly, and digital visualization is also carried out quickly. This device is equipped with industry-leading software that enables visualization and measurement of sub-micron parts.