We will conduct cross-sectional sample preparation and analysis using equipment suited to the purpose.
During the internal evaluation of samples, analysis will be conducted after the preparation of cross-sectional samples. Various methods are available for cross-sectional sample preparation, including mechanical polishing, ion milling (CP), and microtomy. After sample preparation, analysis will be performed using devices such as SEM and FE-EPMA. We will propose the most suitable method according to the purpose of the analysis.
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**Features** ● Optimal polishing methods tailored to your request We implement the most suitable cross-section creation methods based on the sample condition and analysis purpose. For standard EDX analysis applications, we use mechanical polishing with a polisher. Additionally, for samples where chipping is a concern, such as hard materials and carbide, we can create a smooth cross-section using a precision polisher. ● Precision processing using ion beams In cases where high magnification observation and analysis are required, we employ precision polishing using ion beams. Ion beams allow for precise polishing without applying physical force to the sample, making them suitable for high magnification observation and analysis applications. ● Various analysis devices For the created cross-section samples, we conduct analysis using devices suited to the purpose. In addition to standard SEM (scanning electron microscope), we selectively use higher magnification FE-SEM and devices with good detection sensitivity, such as FE-EPMA, as needed.
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Applications/Examples of results
● Analysis of Fracture and Abnormal Occurrence Locations By creating cross-sectional samples, it becomes possible to observe and analyze various abnormal areas such as cracks, scratches, and discoloration that occur on the sample surface. Cross-sectional analysis can provide various information, such as "to what extent surface abnormalities penetrate internally" and "whether there are causative substances present internally." ● Confirmation of Internal Structure and Constituent Components In our cross-sectional sample preparation, we can accurately create cross-sections at positions of approximately 1mm using mechanical polishing or several tens of micrometers using ion milling. For products where understanding the internal structure, such as solder joints or junctions of dissimilar materials, is important, we will prepare accurate samples at your desired locations. ● Analysis of Various Plating Coatings and Thin Film Compositions Through cross-sectional sample preparation, we investigate the physical properties and compositions of surface treatments such as plating and oxide films. It is possible to confirm the dispersion state of components through observation of crystal structures and microstructures, as well as mapping analysis. We also accommodate measurements of film thickness.
Company information
Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.
