Introducing a variety of evaluation equipment, jigs, and charts that support the development of the high-tech industry.
This catalog is a comprehensive catalog from Pearl Optical Industrial Co., Ltd., providing solutions for optical instrument measurement, test charts, and thin film patterning. It features a wide range of optical instruments, including the centering microscope CM series, image processing systems, autocollimators, test charts, and thin film patterning. [Featured Products] ■ Centering Microscopes ■ Transmission-type Eccentricity Measuring Instruments ■ Image Processing Systems ■ Reflection-type Eccentricity Measuring Instruments ■ Options for Reflection-type Eccentricity Measuring Instrument RCM-2 *For more details, please download the PDF or contact us.
Inquire About This Product
basic information
【Other Listed Products】 ■ Autocollimator ■ Collimator ■ Autocollimator/Collimator Chart ■ Bagging Fixture ■ Resolution Projection Tester ■ Test Chart for Photography (Reflective Type) ■ Test Chart for Microscope (Reflective Type) ■ Test Chart for Camera (Transmissive Type) ■ Chart for Digital Single-Lens Reflex Camera (Transmissive Type) ■ Test Chart for Video (Transmissive Type) ■ Thin Film Patterning ■ Chart for Fisheye Lens, etc. *For more details, please download the PDF or contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please download the PDF or contact us.
catalog（1）
Download All Catalogs
Company information
Since our establishment in 1971, we have developed, manufactured, and sold optical measuring instruments such as centering microscopes, resolution projection inspection devices, various charts, autocollimators, collimators, spherometers, focal length measurement devices, and custom optical equipment over many years. In the future, we will continue to keep in mind the importance of responding quickly to our customers' requests and demands, and we will strive to provide useful products and ensure comprehensive support for the products we deliver.
![[Analysis Case] Cross-sectional Observation of TEM/SEM Organic EL and Gate Oxide Film](https://image.mono.ipros.com/public/product/image/7c3/2000026123/IPROS15728510700350494850.png?w=280&h=280)
![[Analysis Case] (S)TEM Observation by Negative Staining](https://image.mono.ipros.com/public/product/image/387108/IPROS6339564166443466668.png?w=280&h=280)
