Introduction of a next-generation ARPES measurement device for XPS observation and measurement with angle-resolved ARPES!
The ARPES-Lab (ARPES photoelectron spectroscopy analysis system) is a device used for XPS observation and measurement. 【Purpose】 XPS observation and measurement using ARPES --- Below is an introduction in English. The ARPES-Lab brings together the world leading instrumentation for ARPES: ●Outstanding performance ARPES system with unchallenged energy and angular resolution ●Intelligent integration and automation ●Revolutionary DA30 deflection mode operation: - Improved ky accuracy - Matrix element effects are avoided by keeping the sample fixed - Ensures the same sample point for all k// *For more details, please contact us or download the PDF materials.
![media_WEB_ARPES_Lab_DSC_7474[3493]_20171122-192851_omicronmedia_image_paddedthumbnailscheme_ffffff_800x1200.jpg](https://image.mono.ipros.com/public/product/image/b91/2000374553/IPROS6385578288990729638.jpg?w=280&h=280)
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basic information
●Detectors for spin-resolved measurements available ●Options for 4, 5, or 6 axis cryo-cooled manipulators ●Highest flux monochromated lab UV source for fast measurements ●True UHV during operation for long sample lifetime ●Tailored UHV system for high-performance ARPES ●Flexible system design for future upgrades and extensions ※For more details, please contact us.
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XPS observation and measurement using ARPES *For details, please contact us.
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Company information
On May 28, 2015, VG Scienta and Omicron NanoTechnology merged to start anew as Scienta Omicron. Scienta Omicron Co., Ltd. was established as the general agent in Japan with the aim of making a substantial contribution to research and development in the country. VG Scienta has recognized the importance of photoelectron spectroscopy since its early days and has developed and introduced many related devices to the market as a top global brand. Omicron NanoTechnology has continuously provided cutting-edge technology to the market through its outstanding product lineup, including scanning tunneling microscopes (STM), atomic force microscopes (AFM), and X-ray photoelectron spectroscopy (XPS) systems, all utilizing ultra-high vacuum technology. Moving forward, our mission is not only to provide state-of-the-art evaluation technology-related equipment but also to contribute to the development of science and industry in Japan by offering comprehensive services and technical support. We hope you look forward to our evaluation technologies.