Free Angle Appearance Inspection Device

Hubbrain Inc. will be exhibiting at "ElectroTest Japan," held concurrently with "InterNepcon Japan" at Tokyo Big Sight from January 16 to 18, 2019. 【Exhibition Overview】 ElectroTest Japan features major manufacturers of various inspection and testing equipment, including appearance and X-ray inspection devices, testers, environmental and reliability testing equipment, and various analytical devices. It has established itself as a venue for business negotiations with domestic and international manufacturers of electronic devices, semiconductors, electronic components, and automotive and electrical products. We look forward to your visit. *You can download a PDF with detailed information from the related materials.

Hubbrain Inc. will be exhibiting at SEMICON Japan 2018, which will be held at Tokyo Big Sight from December 12 (Wednesday) to 14 (Friday). This exhibition is an international trade show for the electronics manufacturing supply chain, covering all processes from the front-end to the back-end of semiconductor manufacturing, as well as SMART applications such as automotive and IoT devices. We will be showcasing compact inspection machines that enable diverse inspections with simple settings, as well as inspection equipment that utilizes a 2-megapixel color camera. <Exhibited Products> ■ Free-Angle Appearance Inspection Machine ■ Upper-Type Simple Inspection Machine ■ Wafer and Chip Appearance Inspection Equipment, etc. <Booth Number> ■ East 2 #2332 We sincerely look forward to your visit.