Wafer Quality Measurement Device VWECER2500 *Catalog available

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last updated：Nov 05, 2018

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Measurement can be completed in a short time of about 10 seconds per wafer, shortening the inspection process! Defective cells can be detected at an earlier stage than before, improving product yield.

Good news for manufacturers of solar cell ingots, wafers, and cells. We have a wafer quality measurement device that can measure in about 10 seconds per wafer, significantly shortening the inspection process. ■Solution for Crystal Technology Our silicon wafer quality measurement device for solar cells, equipped with the measurement technology (HS-CMR method) we developed, can accurately measure the quality of silicon wafers for solar cells without turning them into cells. By analyzing the obtained data, it contributes to reducing solar cell manufacturing costs and improving quality. 【Features】 ◆ High correlation with conversion efficiency ◆ Measurement time of about 10 seconds per wafer ◆ Simple device configuration *For more details, please download the catalog or feel free to contact us.

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■Solution for the Crystal Technology Our solar cell silicon wafer quality measurement device, equipped with the measurement technology we developed (HS-CMR method), can accurately measure the quality of silicon wafers for solar cells without converting them into cells. By analyzing the obtained data, it contributes to reducing solar cell manufacturing costs and improving quality. ■Product Advantages Our technology, the "HS-CMR method," allows us to obtain measurements that correlate with the energy conversion efficiency after solar cell fabrication at the silicon wafer stage. Traditional measurement methods only assess the quality of the surface of Si crystal substrates, which is insufficient for measuring the quality of silicon wafers for solar cells. However, our measurement device equipped with this technology can also measure the quality within the crystal, enabling us to obtain the energy conversion efficiency of solar cells with high precision. Additionally, compared to traditional measurement methods, it allows for quality measurement in significantly shorter time frames. (Traditional measurement time: 30 minutes per piece. Our measurement time: 10 seconds per piece.) This leads to substantial reductions in manufacturing costs.