[Quality Improvement Case] Investigation of NAND Device Failures

Monitor the acquired bad blocks that occur during the process and output their locations and counts to the PC.

This writing system is a defective block verification system for quality confirmation of valid NAND devices in your inspection department. For the target device, it repeatedly performs ERASE-PROGRAM-VERIFY (data can be set arbitrarily) and monitors the occurrence of acquired bad blocks during the process. Changes to the test content (e.g., repeating only ERASE), counting the occurrence position and frequency of bad blocks, and testing by varying the power supply voltage during operation can be developed into algorithms tailored to your requirements. 【Features and Purpose】 ■ Quality Control ■ Custom Support * For more details, please refer to the external link page or feel free to contact us. * You can download the company information materials from the link below.

Memory