Microscopic images of SiC samples captured with a camera, real-time LCD output.
The SCM-100 is a SiC microscopic observation device that has the function of applying a pre-programmed current to the built-in diode of a SiC sample's transistor. During current application, areas where no current flows (defects) do not emit light, allowing for the detection of defects by capturing images with a camera attached to the microscope. 【Features】 ■ Capture intervals from 3 seconds to 24 hours, with a maximum of 999 images that can be saved to an SD card ■ Output voltage, output current, and status information can be sampled at a maximum speed of 0.1 seconds ■ Control of 5 power supplies and data storage possible with a single PC ■ When output to a 17-inch LCD, the observation magnification is approximately 60x to 200x ■ Allows for real-time observation of defect growth in SiC samples *For more details, please download the PDF or feel free to contact us.
Inquire About This Product
basic information
【Specifications (Excerpt)】 ■ Movable stage: 40X40mm ■ XY movement range: ±6.5mm ■ Observation magnification: Variable from approximately 60 to approximately 200 times on a 16-inch LCD ■ Camera: Equivalent to PENTAX Q-S1 (interval shooting possible, C-mount, AC cable included) ■ Lens: Canon zoom lens EF-S55-250mm F4-5.6 IS II *For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Usage】 ■SiC Devices ■Wafers *For more details, please download the PDF or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Our company is an optical equipment manufacturer that divides "light" into wavelengths ranging from ultraviolet to infrared, discovering and applying the interactions between each wavelength and molecules or atoms. We develop and prototype one-of-a-kind experimental devices to support advanced research by researchers at universities and other institutions. We respond to special needs with advanced optical technology.
