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  6. High-resolution type super sharp probe for AFM/SPM

High-resolution type super sharp probe for AFM/SPM

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last updated:Aug 27, 2020

MSHシステムズ
MSHシステムズ
  • Official site

AFM/SPM probe for high-resolution measurements with a tip curvature radius of less than 3 nm.

This is a probe for atomic force microscopy and scanning probe microscopy. We offer two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm. - Super Sharp DLC Probe: A probe equipped with a DLC tip at the tip's end that has a curvature radius of less than about 3 nm. Due to the DLC, it boasts high durability and long lifespan. - Super Sharp SS Probe: A probe with the tip's end sharpened to a curvature radius of about 2 nm.

    probeOther microscopesAnalytical Equipment and Devices
SS_DLC.jpg

High-resolution type super sharp probe for AFM/SPM

SS_DLC.jpg
SS_DLC.jpg
  • Related Link - https://www.msh-systems.com/products/tn-spm-consum…

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basic information

This is a probe for atomic force microscopy and scanning probe microscopy. There are two types of probes: one with an ultra-fine DLC tip extended at the tip's end, and another with a tip sharpened to about 2 nm.

Price range

Please contact us for details

Delivery Time

Please contact us for details

※Delivery times may vary depending on the model and quantity, so please feel free to contact us.

Applications/Examples of results

- High-resolution measurements of Scanning Probe Microscopy (SPM) - High-resolution measurements of Atomic Force Microscopy (AFM) and others

Detailed information

  • SS_DLC.jpg

    - Super Sharp DLC Probe: A probe equipped with a DLC tip that has a curvature radius of approximately < 3 nm at the tip. Due to the DLC, it boasts high durability and long lifespan.

  • SS.jpg

    Super Sharp SS Probe: A probe with a tip sharpened to a curvature radius of approximately 2nm.

Line up(6)

Model number overview
Super Sharp DLC Probe High durability and long-life probe with a DLC tip having a curvature radius of approximately less than 3 nm.
NSG01_DLC 【Resonant Frequency (typical)】 150 kHz, 【Spring Constant (typical)】 5.5 N/m, 【Tip Radius of Curvature (typical)】 < 3 nm
Super Sharp SS Probe A probe with a tip sharpened to a curvature radius of approximately 2 nm.
CSG10_SS 【Resonant frequency (typical)】 22 kHz, 【Force constant (typical)】 0.11 N/m, 【Tip radius of curvature (typical)】 2 nm
FMG01_SS 【Resonant frequency (typical)】 60 kHz, 【Spring constant (typical)】 3 N/m, 【Tip radius of curvature (typical)】 2 nm
NSG30_SS 【Resonant frequency (typical)】 320 kHz, 【Spring constant (typical)】 40 N/m, 【Tip radius of curvature (typical)】 2 nm

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AFM/SPM Related Products Catalog

AFM/SPM Related Products Catalog

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MSHシステムズ

MSHシステムズ

Optical Instruments

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MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.

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