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  6. Light Beam Measurement and Analysis Device 'M-Scope type HS'

Light Beam Measurement and Analysis Device 'M-Scope type HS'

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last updated:Jul 01, 2019

シナジーオプトシステムズ
シナジーオプトシステムズ
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*Demo measurements available* It is also possible to measure changes in the emission direction of the beam shape.

The "M-Scope type HS" is an optical system for measuring the emission beam profile of high-power lasers in the 1 to 10W class. The light beam emitted from the sample being measured passes through an objective lens, is attenuated to about 99.99% by a two-stage beam sampler, and is then focused onto a two-dimensional image detector using an imaging lens. This allows for accurate measurement of the emission beam profile and beam shape of high-power lasers under various objective lens magnifications. 【Features】 ■ The combination of a beam sampler (two-stage behind the objective lens) and an attenuation filter allows for the measurement of high-power laser power at an appropriate level. ■ Various objective lens magnifications can be selected (various objective lenses from the M-Plan Apo NIR and M-Plan Apo NUV series). ■ Collimated light measurement is possible (without the objective lens). ■ A standard coaxial reflected illumination port is equipped, enabling microscope image observation and alignment using real images when combined with a coaxial reflected illumination device (optional). *For more details, please refer to the PDF document or feel free to contact us.

    Other electronic measuring instrumentsOther measurement, recording and measuring instrumentsOther analyses
2019-07-01_13h03_56.png

Light Beam Measurement and Analysis Device 'M-Scope type HS'

2019-07-01_13h03_56.png
2019-07-01_13h03_56.png
  • Related Link - http://www.synos.jp/optics/optics_mstypehs.html

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【Specifications (Excerpt)】 ■ Method: Beam sampler (two-stage behind the objective lens) equipped NFP measurement optical system + image processing analysis method ■ Measured incident light amount: 1–10W ■ Attenuation method: Approximately 99.99% attenuation by a two-stage beam sampler (reflected light is blocked by a beam damper), and a combined method using attenuation filters inserted into the filter port (up to 2 filters can be inserted simultaneously) ■ Measurement wavelength range: - M-Scope type HS/BL: 400nm-450nm - M-Scope type HS/NIR: 850nm, 940nm * Please consult us regarding measurement wavelengths other than those listed above. ■ Polarization dependence compensation: Polarization dependence compensation using two-stage orthogonal arrangement of built-in attenuation mirrors in the beam sampler * For more details, please refer to the PDF document or feel free to contact us.

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Applications/Examples of results

【Application Fields】 ■ Measurement and analysis of emission beam profiles and beam shapes for high-power lasers and high-power laser modules ■ Development of automotive optical electronics components and systems for LiDAR and laser headlights ■ Development of laser modules for biometric authentication ■ Measurement and analysis of emission beam profiles and beam shapes for high-power lasers and high-power laser modules used in medical applications, solid-state laser excitation, printing, etc. *For more details, please refer to the PDF materials or feel free to contact us.

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Light Beam Measurement and Analysis Device 'M-Scope type HS'

Light Beam Measurement and Analysis Device 'M-Scope type HS'

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シナジーオプトシステムズ

シナジーオプトシステムズ

Testing, Analysis and Measurement

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Synergy Opt Systems Co., Ltd. aims to create unique and innovative sensors and electro-optical devices that integrate optical technology, sensor technology, electronics, software, and precision mechanism technology. Our engineers, who have extensive experience and achievements in various fields such as optical design, optical sensors, light sources, optical modules, and measurement system design, will analyze your specifications and propose optimal solutions. Additionally, we can custom design and manufacture optical systems based on your specific requirements.

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